RSI Nameplate
  • Volume/Page
  • Keyword
  • DOI
  • Citation
  • Advanced
   
 
 
 

Flickr Twitter iResearch App Facebook

BROWSE VOLUMES

Year Range: 
Search Issue | RSS Feeds RSS
Previous Issue Next Issue

Mar 2013

Volume 84, Issue 3, Articles (03xxxx)

Issue Cover Spotlight Figure

Rev. Sci. Instrum. 84, 033701 (2013); http://dx.doi.org/10.1063/1.4774387 (7 pages)

E. Nazaretski, Jungdae Kim, H. Yan, K. Lauer, D. Eom, D. Shu, J. Maser, Z. Pešić, U. Wagner, C. Rau, and Y. S. Chu

Computer aided design (CAD) model of the multilayer Laue lenses (MLL) based scanning fluorescence microscope. The inset shows schematic of the MLL setup used to perform scanning fluorescence experiments. The background represents thermal image of the horizontal MLL assembly.

Enlarge Image | Read More
Return to All Sections
back to top
RSS Feeds
back to top Thermometry; Thermal Diffusivity; Acoustics; Photothermal and Photoacoustic

Steady heat conduction-based thermal conductivity measurement of single walled carbon nanotubes thin film using a micropipette thermal sensor

R. Shrestha, K. M. Lee, W. S. Chang, D. S. Kim, G. H. Rhee, and T. Y. Choi

Rev. Sci. Instrum. 84, 034901 (2013); http://dx.doi.org/10.1063/1.4792841 (6 pages)

Online Publication Date: 1 March 2013

Full Text: Read Online (HTML) | Download PDF

Show Abstract
In this paper, we describe the thermal conductivity measurement of single-walled carbon nanotubes thin film using a laser point source-based steady state heat conduction method. A high precision micropipette thermal sensor fabricated with a sensing tip size varying from 2 μm to 5 μm and capable of measuring thermal fluctuation with resolution of ±0.01 K was used to measure the temperature gradient across the suspended carbon nanotubes (CNT) film with a thickness of 100 nm. We used a steady heat conduction model to correlate the temperature gradient to the thermal conductivity of the film. We measured the average thermal conductivity of CNT film as 74.3 ± 7.9 W m−1 K−1 at room temperature.
Show PACS
07.20.Dt Thermometers
07.20.-n Thermal instruments and apparatus
42.62.Eh Metrological applications; optical frequency synthesizers for precision spectroscopy
07.07.Df Sensors (chemical, optical, electrical, movement, gas, etc.); remote sensing
85.85.+j Micro- and nano-electromechanical systems (MEMS/NEMS) and devices

Simultaneous measurement of thermal conductivity and heat capacity of bulk and thin film materials using frequency-dependent transient thermoreflectance method

Jun Liu, Jie Zhu, Miao Tian, Xiaokun Gu, Aaron Schmidt, and Ronggui Yang

Rev. Sci. Instrum. 84, 034902 (2013); http://dx.doi.org/10.1063/1.4797479 (12 pages)

Online Publication Date: 26 March 2013

Full Text: Read Online (HTML) | Download PDF

Show Abstract
The increasing interest in the extraordinary thermal properties of nanostructures has led to the development of various measurement techniques. Transient thermoreflectance method has emerged as a reliable measurement technique for thermal conductivity of thin films. In this method, the determination of thermal conductivity usually relies much on the accuracy of heat capacity input. For new nanoscale materials with unknown or less-understood thermal properties, it is either questionable to assume bulk heat capacity for nanostructures or difficult to obtain the bulk form of those materials for a conventional heat capacity measurement. In this paper, we describe a technique for simultaneous measurement of thermal conductivity κ and volumetric heat capacity C of both bulk and thin film materials using frequency-dependent time-domain thermoreflectance (TDTR) signals. The heat transfer model is analyzed first to find how different combinations of κ and C determine the frequency-dependent TDTR signals. Simultaneous measurement of thermal conductivity and volumetric heat capacity is then demonstrated with bulk Si and thin film SiO2 samples using frequency-dependent TDTR measurement. This method is further testified by measuring both thermal conductivity and volumetric heat capacity of novel hybrid organic-inorganic thin films fabricated using the atomic/molecular layer deposition. Simultaneous measurement of thermal conductivity and heat capacity can significantly shorten the development/discovery cycle of novel materials.
Show PACS
66.70.Df Metals, alloys, and semiconductors
65.40.Ba Heat capacity
78.20.N- Thermo-optic effects

Temperature measurements of heated microcantilevers using scanning thermoreflectance microscopy

Joohyun Kim, Sunwoo Han, Timothy Walsh, Keunhan Park, Bong Jae Lee, William P. King, and Jungchul Lee

Rev. Sci. Instrum. 84, 034903 (2013); http://dx.doi.org/10.1063/1.4797621 (8 pages)

Online Publication Date: 26 March 2013

Full Text: Read Online (HTML) | Download PDF

Show Abstract
We report the development of scanning thermoreflectance thermometry and its application for steady and dynamic temperature measurement of a heated microcantilever. The local thermoreflectance signal of the heated microcantilever was calibrated to temperature while the cantilever was under steady and periodic heating operation. The temperature resolution of our approach is 0.6 K, and the spatial resolution is 2 μm, which are comparable to micro-Raman thermometry. However, the temporal resolution of our approach is about 10 μsec, which is significantly faster than micro-Raman thermometry. When the heated microcantilever is periodically heated with frequency up to 100 kHz, we can measure both the in-phase and out-of-phase components of the temperature oscillation. For increasing heating frequency, the measured cantilever AC temperature distribution tends to be confined in the vicinity of the heater region and becomes increasingly out of phase with the driving signal. These results compare well with finite element simulations.
Show PACS
07.20.Dt Thermometers
85.85.+j Micro- and nano-electromechanical systems (MEMS/NEMS) and devices
06.20.fb Standards and calibration
02.70.Dh Finite-element and Galerkin methods
07.07.Df Sensors (chemical, optical, electrical, movement, gas, etc.); remote sensing
Return to All Sections
Close

Google Calendar

ADVERTISEMENT

Go to AIP Home   © AIP Publishing LLC
close