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Mar 2013

Volume 84, Issue 3, Articles (03xxxx)

Issue Cover Spotlight Figure

Rev. Sci. Instrum. 84, 033701 (2013); http://dx.doi.org/10.1063/1.4774387 (7 pages)

E. Nazaretski, Jungdae Kim, H. Yan, K. Lauer, D. Eom, D. Shu, J. Maser, Z. Pešić, U. Wagner, C. Rau, and Y. S. Chu

Computer aided design (CAD) model of the multilayer Laue lenses (MLL) based scanning fluorescence microscope. The inset shows schematic of the MLL setup used to perform scanning fluorescence experiments. The background represents thermal image of the horizontal MLL assembly.

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back to top Microscopy and Imaging

Performance and characterization of the prototype nm-scale spatial resolution scanning multilayer Laue lenses microscope

E. Nazaretski, Jungdae Kim, H. Yan, K. Lauer, D. Eom, D. Shu, J. Maser, Z. Pešić, U. Wagner, C. Rau, and Y. S. Chu

Rev. Sci. Instrum. 84, 033701 (2013); http://dx.doi.org/10.1063/1.4774387 (7 pages)

Online Publication Date: 1 March 2013

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Synchrotron based x-ray microscopy established itself as a prominent tool for noninvasive investigations in many areas of science and technology. Many facilities around the world routinely achieve sub-micrometer resolution with a few instruments capable of imaging with the spatial resolution better than 100 nm. With an ongoing effort to push the 2D/3D resolution down to 10 nm in the hard x-ray regime both fabrication of the nano-focusing optics and stability of a microscope become extremely challenging. In this work we present our approach to overcome technical challenges on the path towards high spatial resolution hard x-ray microscopy and demonstrate the performance of a scanning fluorescence microscope equipped with the multilayer Laue lenses focusing optics.
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07.85.Tt X-ray microscopes
42.79.Bh Lenses, prisms and mirrors
42.82.Cr Fabrication techniques; lithography, pattern transfer

An active one-particle microrheometer: Incorporating magnetic tweezers to total internal reflection microscopy

Xiangjun Gong, Li Hua, Chi Wu, and To Ngai

Rev. Sci. Instrum. 84, 033702 (2013); http://dx.doi.org/10.1063/1.4794441 (9 pages)

Online Publication Date: 11 March 2013

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We present a novel microrheometer by incorporating magnetic tweezers in the total internal reflection microscopy (TIRM) that enables measuring of viscoelastic properties of materials near solid surface. An evanescent wave generated by a solid/liquid interface in the TIRM is used as the incident light source in the microrheometer. When a probe particle (of a few micrometers diameter) moves near the interface, it can interact with the evanescent field and reflect its position with respect to the interface by the scattered light intensity. The exponential distance dependence of the evanescent field, on the one hand, makes this technique extremely sensitive to small changes from z-fluctuations of the probe (with a resolution of several nanometers), and on the other, it does not require imaging of the probe with high lateral resolution. Another distinct advantage is the high sensitivity in determining the z position of the probe in the absence of any labeling. The incorporated magnetic tweezers enable us to effectively manipulate the distance of the embedded particle from the interface either by a constant or an oscillatory force. The force ramp is easy to implement through a coil current ramp. In this way, the local viscous and elastic properties of a given system under different confinements can therefore be measured by resolving the near-surface particle motion. To test the feasibility of applying this microrheology to soft materials, we measured the viscoelastic properties of sucrose and poly(ethylene glycol) solutions and compared the results to bulk rheometry. In addition, we applied this technique in monitoring the structure and properties of deformable microgel particles near the flat surface.
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07.10.-h Mechanical instruments and equipment
07.10.Cm Micromechanical devices and systems
FREE

Design of a scanning gate microscope for mesoscopic electron systems in a cryogen-free dilution refrigerator

M. Pelliccione, A. Sciambi, J. Bartel, A. J. Keller, and D. Goldhaber-Gordon

Rev. Sci. Instrum. 84, 033703 (2013); http://dx.doi.org/10.1063/1.4794767 (11 pages)

Online Publication Date: 12 March 2013

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We report on our design of a scanning gate microscope housed in a cryogen-free dilution refrigerator with a base temperature of 15 mK. The recent increase in efficiency of pulse tube cryocoolers has made cryogen-free systems popular in recent years. However, this new style of cryostat presents challenges for performing scanning probe measurements, mainly as a result of the vibrations introduced by the cryocooler. We demonstrate scanning with root-mean-square vibrations of 0.8 nm at 3 K and 2.1 nm at 15 mK in a 1 kHz bandwidth with our design. Using Coulomb blockade thermometry on a GaAs/AlGaAs gate-defined quantum dot, we demonstrate an electron temperature of 45 mK.
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07.20.Mc Cryogenics; refrigerators, low-temperature detectors, and other low-temperature equipment
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