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Mar 2013

Volume 84, Issue 3, Articles (03xxxx)

Issue Cover Spotlight Figure

Rev. Sci. Instrum. 84, 033701 (2013); http://dx.doi.org/10.1063/1.4774387 (7 pages)

E. Nazaretski, Jungdae Kim, H. Yan, K. Lauer, D. Eom, D. Shu, J. Maser, Z. Pešić, U. Wagner, C. Rau, and Y. S. Chu

Computer aided design (CAD) model of the multilayer Laue lenses (MLL) based scanning fluorescence microscope. The inset shows schematic of the MLL setup used to perform scanning fluorescence experiments. The background represents thermal image of the horizontal MLL assembly.

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back to top Electronics; Electromagnetic Technology; Microwaves

Design and experiment of a directional coupler for X-band long pulse high power microwaves

Zhen Bai, Guolin Li, Jun Zhang, and Zhenxing Jin

Rev. Sci. Instrum. 84, 034701 (2013); http://dx.doi.org/10.1063/1.4789782 (5 pages)

Online Publication Date: 4 March 2013

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Higher power and longer pulse are the trend of the development of high power microwave (HPM), and then some problems emerge in measuring the power of HPM because rf breakdown is easier to occur under the circumstance of high power (the level of gigawatt) and long pulse (about 100 ns). In order to measure the power of the dominant TM01 mode of an X-band long pulse overmoded HPM source, a directional coupler with stable coupling coefficient, high directivity, and high power handling capacity in wide band is investigated numerically and experimentally. At the central frequency 9.4 GHz, the simulation results show that the coupling coefficient is −59.6 dB with the directivity of 35 dB and the power handling capacity of 2 GW. The coupling coefficient is calibrated to be accordant with the simulation results. The high power tests are performed on an X-band long pulse HPM source, whose output mode is mainly TM01 mode, and the results show that the measured power and waveform of the directional coupler have a good consistency with the far-field measuring results.
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07.85.-m X- and γ-ray instruments
84.37.+q Measurements in electric variables (including voltage, current, resistance, capacitance, inductance, impedance, and admittance, etc.)

A compact 45 kV curve tracer with picoampere current measurement capability

W. W. Sullivan, III, D. Mauch, A. Bullick, C. Hettler, A. Neuber, and J. Dickens

Rev. Sci. Instrum. 84, 034702 (2013); http://dx.doi.org/10.1063/1.4794734 (5 pages)

Online Publication Date: 11 March 2013

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This paper discusses a compact high voltage curve tracer for high voltage semiconductor device characterization. The system sources up to 3 mA at up to 45 kV in dc conditions. It measures from 328 V to 60 kV with 15 V resolution and from 9.4 pA to 4 mA with 100 fA minimum resolution. Control software for the system is written in Microsoft Visual C# and features real-time measurement control and IV plotting, arc-protection and detection, an electrically isolated universal serial bus interface, and easy data exporting capabilities. The system has survived numerous catastrophic high voltage device-under-test arcing failures with no loss of measurement capability or system damage. Overall sweep times are typically under 2 min, and the curve tracer system was used to characterize the blocking performance of high voltage ceramic capacitors, high voltage silicon carbide photoconductive semiconductor switches, and high voltage coaxial cable.
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84.37.+q Measurements in electric variables (including voltage, current, resistance, capacitance, inductance, impedance, and admittance, etc.)
84.32.Tt Capacitors

Discrete transistor measuring and matching using a solid core oven

M. Inkinen, K. Mäkelä, T. Vuorela, and K. Palovuori

Rev. Sci. Instrum. 84, 034703 (2013); http://dx.doi.org/10.1063/1.4793772 (8 pages)

Online Publication Date: 12 March 2013

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This paper presents transistor measurements done at a constant temperature. The aim in this research was to develop a reliable and repeatable method for measuring and searching transistor pairs with similar parameters, as in certain applications it is advantageous to use transistors from the same production batch due to the significant variability in batches from different manufacturers. Transistor manufacturing methods are well established, but due to the large variability in tolerance, not even transistors from the same manufacturing batch have identical properties. Transistors’ electrical properties are also strongly temperature-dependent. Therefore, when measuring transistor properties, the temperature must be kept constant. For the measurement process, a solid-core oven providing stable temperature was implemented. In the oven, the base-to-emitter voltage (VBE) and DC-current gain (β) of 32 transistors could be measured simultaneously. The oven's temperature was controlled with a programmable thermostat, which allowed accurate constant temperature operation. The oven is formed by a large metal block with an individual chamber for each transistor to be measured. Isolation of individual transistors and the highly thermally conductive metal core structure prevent thermal coupling between transistors. The oven enables repeatable measurements, and thus measurements between different batches are comparable. In this research study, the properties of over 5000 transistors were measured and the variance of the aforementioned properties was analyzed.
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84.37.+q Measurements in electric variables (including voltage, current, resistance, capacitance, inductance, impedance, and admittance, etc.)

Two-port microwave calibration at millikelvin temperatures

Leonardo Ranzani, Lafe Spietz, Zoya Popovic, and José Aumentado

Rev. Sci. Instrum. 84, 034704 (2013); http://dx.doi.org/10.1063/1.4794910 (9 pages)

Online Publication Date: 15 March 2013

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In this work we introduce a system for 2-port microwave calibration at millikelvin temperatures operating at the coldest stage of a dilution refrigerator by use of an adapted thru-reflect-line algorithm. We show that this can be an effective tool for characterizing common 50 Ω microwave components with better than 0.1 dB accuracy at temperatures that are relevant to many current experiments in superconducting quantum information.
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06.20.fb Standards and calibration
07.57.-c Infrared, submillimeter wave, microwave and radiowave instruments and equipment

An alternate approach to the production of radioisotopes for nuclear medicine applications

John M. D’Auria, Roderich Keller, Keith Ladouceur, Suzanne E. Lapi, Thomas J. Ruth, and Paul Schmor

Rev. Sci. Instrum. 84, 034705 (2013); http://dx.doi.org/10.1063/1.4797459 (4 pages)

Online Publication Date: 25 March 2013

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There is a growing need for the production of radioisotopes for both diagnostic and therapeutic medical applications. Radioisotopes that are produced using the (n,γ) or (γ,n) reactions, however, typically result in samples with low specific activity (radioactivity/gram) due to the high abundance of target material of the same element. One method to effectively remove the isotopic impurity is electro-magnetic mass separation. An Ion Source Test Facility has been constructed at TRIUMF to develop high-intensity, high-efficiency, reliable ion sources for purification of radioactive isotopes, particularly those used in nuclear medicine. In progress studies are presented.
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87.57.U- Nuclear medicine imaging

In situ broadband cryogenic calibration for two-port superconducting microwave resonators

Jen-Hao Yeh and Steven M. Anlage

Rev. Sci. Instrum. 84, 034706 (2013); http://dx.doi.org/10.1063/1.4797461 (8 pages)

Online Publication Date: 26 March 2013

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We introduce an improved microwave calibration method for use in a cryogenic environment, based on a traditional three-standard calibration, the Thru-Reflect-Line (TRL) calibration. The modified calibration method takes advantage of additional information from multiple measurements of an ensemble of realizations of a superconducting resonator, as a new pseudo-Open standard, to correct errors in the TRL calibration. We also demonstrate an experimental realization of this in situ broadband cryogenic calibration system utilizing cryogenic switches. All calibration measurements are done in the same thermal cycle as the measurement of the resonator (requiring only an additional 20 min), thus avoiding 4 additional thermal cycles for traditional TRL calibration (which would require an additional 12 days). The experimental measurements on a wave-chaotic microwave billiard verify that the new method significantly improves the measured scattering matrix of a high-quality-factor superconducting resonator.
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85.25.-j Superconducting devices
84.40.Az Waveguides, transmission lines, striplines
06.20.fb Standards and calibration
02.10.Yn Matrix theory
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