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Review of Scientific Instruments / Volume 83 / Issue 2 / ARTICLES / Electronics; Electromagnetic Technology; Microwaves

Rev. Sci. Instrum. 83, 024706 (2012); http://dx.doi.org/10.1063/1.3678343 (4 pages)

Application of length vernier in phase coincidence detection and precision frequency measurement

Miao Miao, Zhou Wei, and Wang Bin

Department of Measurement and Instrument, Xidian University, Xi'an 710071, People's Republic of China

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(Received 29 June 2011; accepted 31 December 2011; published online 6 February 2012)

For comparison of arbitrary frequency signals, the paper proposed two levels of length vernier based on the time-space relationship are used in three levels of phase coincidence detecting circuits to extract the phase coincidence information by proper logic calculation. The length/phase of each vernier is respectively corresponding to the accuracy and the resolution of detecting circuit. The time-space relationship is based on high-stability, high-accuracy, and high-speed of signal transmission. The method is effective to reduce the fuzzy region in the phase coincidence information and reach a higher measuring precision.

© 2012 American Institute of Physics

Article Outline

  1. INTRODUCTION
  2. TIME-SPACE RELATIONSHIP OF SIGNAL TRANSMISSION
  3. APPLICATION OF LENGTH VERNIER TECHNIQUES IN PRECISION FREQUENCY MEASUREMENT
  4. CONCLUSION

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KEYWORDS, PACS, and IPC

Keywords

frequency measurement, length measurement, phase detectors, signal detection

PACS

  • 06.30.Ft

    Time and frequency

  • 84.30.Qi

    Modulators and demodulators; discriminators, comparators, mixers, limiters, and compressors

  • 06.30.Bp

    Spatial dimensions (e.g., position, lengths, volume, angles, and displacements)

International Patent Classification (IPC)

  • G01R23/00

    Arrangements for measuring frequencies; Arrangements for analysing frequency spectra

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.3678343

PUBLICATION DATA

ISSN

0034-6748 (print)  
1089-7623 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

For access to fully linked references, you need to log in.
    Th. Udem, J. Reichert, R. Holzwarth, and T. W. Hänsch, Phys. Rev. Lett. 82, 3568 (1999).


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