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Review of Scientific Instruments / Volume 83 / Issue 2 / ARTICLES / Electronics; Electromagnetic Technology; Microwaves

Rev. Sci. Instrum. 83, 024704 (2012); http://dx.doi.org/10.1063/1.3680576 (5 pages)

Broadband microwave spectroscopy in Corbino geometry at 3He temperatures

Katrin Steinberg, Marc Scheffler, and Martin Dressel

1. Physikalisches Institut, Universität Stuttgart, 70550 Stuttgart, Germany

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(Received 15 September 2011; accepted 9 January 2012; published online 3 February 2012)

A broadband microwave spectrometer has been constructed to determine the complex conductivity of thin metal films at frequencies from 45 MHz to 20 GHz working in the temperature range from 0.45 K to 2 K (in a 3He cryostat). The setup follows the Corbino approach: a vector network analyzer measures the complex reflection coefficient of a microwave signal hitting the sample as termination of a coaxial transmission line. As the calibration of the setup limits the achievable resolution, we discuss the sources of error hampering different types of calibration. Test measurements of the complex conductivity of a heavy-fermion material demonstrate the applicability of the calibration procedures.

© 2012 American Institute of Physics

Article Outline

  1. INTRODUCTION
  2. BROADBAND MICROWAVE SPECTROSCOPY IN CORBINO GEOMETRY
  3. 3 HE CORBINO SPECTROMETER
  4. MICROWAVE PERFORMANCE
  5. EXAMPLE
  6. CONCLUSION AND OUTLOOK

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KEYWORDS, PACS, and IPC

Keywords

calibration, coaxial cables, Corbino effect, electrical conductivity measurement, heavy fermion systems, metallic thin films, microwave measurement, microwave spectrometers, microwave spectroscopy, network analysers

PACS

  • 73.61.At

    Metal and metallic alloys

  • 78.70.Gq

    Microwave and radio-frequency interactions

  • 06.20.fb

    Standards and calibration

  • 06.30.Ka

    Basic electromagnetic quantities

  • 07.57.Pt

    Submillimeter wave, microwave and radiowave spectrometers; magnetic resonance spectrometers, auxiliary equipment, and techniques

International Patent Classification (IPC)

  • G01D18/00

    Testing or calibrating of apparatus or arrangements provided for in groups G01D1/00 to G01D15/00

  • G01R23/16

    Spectrum analysis; Fourier analysis

  • G01R27/00

    Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom

  • G12B13/00

    Calibrating of instruments or apparatus

  • H01B11/18

    Coaxial cables; Analogous cables having more than one inner conductor within a common outer conductor

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.3680576

PUBLICATION DATA

ISSN

0034-6748 (print)  
1089-7623 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

For access to fully linked references, you need to log in.
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