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Review of Scientific Instruments / Volume 83 / Issue 2 / ARTICLES / Condensed Matter; Materials

Rev. Sci. Instrum. 83, 023901 (2012); http://dx.doi.org/10.1063/1.3680598 (9 pages)

A plastic miniature x-ray emission spectrometer based on the cylindrical von Hamos geometry

B. A. Mattern1, G. T. Seidler1, M. Haave1, J. I. Pacold1, R. A. Gordon2, J. Planillo3, J. Quintana4, and B. Rusthoven4

1Department of Physics, University of Washington, Seattle, Washington 98195, USA
2Department of Physics, Simon Fraser University, Burnaby, British Columbia V5A 1S6, Canada
3Department of Physics, Rensselaer Polytechnic Institute, Troy, New York 12180, USA
4Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USA

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(Received 19 September 2011; accepted 10 January 2012; published online 8 February 2012)

We present a short working distance miniature x-ray emission spectrometer (miniXES) based on the cylindrical von Hamos geometry. We describe the general design principles for the spectrometer and detail a specific implementation that covers Kβ and valence level emission from Fe. Large spatial and angular access to the sample region provides compatibility with environmental chambers, microprobe, and pump/probe measurements. The primary spectrometer structure and optic is plastic, printed using a 3-dimensional rapid-prototype machine. The spectrometer is inexpensive to construct and is portable; it can be quickly set up at any focused beamline with a tunable narrow bandwidth monochromator. The sample clearance is over 27 mm, providing compatibility with a variety of environment chambers. An overview is also given of the calibration and data processing procedures, which are implemented by a multiplatform user-friendly software package. Finally, representative measurements are presented. Background levels are below the level of the Kβ2, 5 valence emission, the weakest diagram line in the system, and photometric analysis of count rates finds that the instrument is performing at the theoretical limit.

© 2012 American Institute of Physics

Article Outline

  1. INTRODUCTION
  2. EXPERIMENTAL
    1. Spectrometer design
    2. Construction
    3. Sample preparation and beamline details
    4. Installation
  3. SPECTROMETER OPERATION AND RESULTS
    1. Calibration
    2. Emission spectra
    3. Photometrics
  4. CONCLUSIONS

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KEYWORDS, PACS, and IPC

Keywords

photometry, X-ray spectrometers

PACS

  • 07.85.Nc

    X-ray and γ-ray spectrometers

  • 29.30.Kv

    X- and γ-ray spectroscopy

  • 07.60.Dq

    Photometers, radiometers, and colorimeters

International Patent Classification (IPC)

  • G01J1/00

    Photometry, e.g. photographic exposure meter

  • H01L31/115

    Devices sensitive to very short wavelength, e.g. x-rays, gamma-rays or corpuscular radiation

  • H04N5/32

    Transforming x-rays

  • H05G

    X-ray technique

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.3680598

PUBLICATION DATA

ISSN

0034-6748 (print)  
1089-7623 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

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