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Review of Scientific Instruments / Volume 83 / Issue 2 / ARTICLES / Microscopy and Imaging

Rev. Sci. Instrum. 83, 023704 (2012); http://dx.doi.org/10.1063/1.3681784 (7 pages)

3D mechanical measurements with an atomic force microscope on 1D structures

Christian Kallesøe, Martin B. Larsen, Peter Bøggild, and Kristian Mølhave

Department of Micro- and Nanotechnology, Technical University of Denmark, Kgs. Lyngby, DK-2800, Denmark

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(Received 15 October 2010; accepted 13 January 2012; published online 9 February 2012)

We have developed a simple method to characterize the mechanical properties of three dimensional nanostructures, such as nanorods standing up from a substrate. With an atomic force microscope the cantilever probe is used to deflect a horizontally aligned nanorod at different positions along the nanorod, using the apex of the cantilever itself rather than the tip normally used for probing surfaces. This enables accurate determination of nanostructures’ spring constant. From these measurements, Young's modulus is found on many individual nanorods with different geometrical and material structures in a short time. Based on this method Young's modulus of carbon nanofibers and epitaxial grown III-V nanowires has been determined.

© 2012 American Institute of Physics

Article Outline

  1. INTRODUCTION
  2. ATOMIC FORCE MICROSCOPE SETUP
  3. PURE BENDING OF A POINT LOADED NANOWIRE
  4. QUALITATIVE MODEL OF THE SIGNAL
  5. MECHANICAL MEASUREMENT RESULTS
    1. Mechanical properties of GaAs nanowires
    2. Mechanical properties of carbon nanofibers
  6. DISCUSSION
  7. CONCLUSION

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KEYWORDS, PACS, and IPC

Keywords

atomic force microscopy, cantilevers, epitaxial growth, mechanical variables measurement, nanofibres, nanorods, nanowires, Young's modulus

PACS

  • 07.10.-h

    Mechanical instruments and equipment

  • 07.79.Lh

    Atomic force microscopes

International Patent Classification (IPC)

  • B82B1/00

    Nano-structures

  • G01L

    Measuring force, stress, torque, work, mechanical power, mechanical efficiency, or fluid pressure

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.3681784

PUBLICATION DATA

ISSN

0034-6748 (print)  
1089-7623 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

For access to fully linked references, you need to log in.
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    C. Li and T. W. Chou, Phys. Rev. B 68, 73405 (2003).

    C. Li and T. W. Chou, Appl. Phys. Lett. 84, 5246 (2004)APPLAB000084000025005246000001.

    C. Li and T. W. Chou, Appl. Phys. Lett. 84, 121 (2004)APPLAB000084000001000121000001.

    A. San Paulo, J. Bokor, R. T. Howe, R. He, P. Yang, D. Gao, C. Carraro, and R. Maboudian, Appl. Phys. Lett. 87, 053111 (2005)APPLAB000087000005053111000001.


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