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Review of Scientific Instruments / Volume 83 / Issue 2 / ARTICLES / Nuclear Physics, Fusion and Plasmas
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Rev. Sci. Instrum. 83, 023502 (2012); http://dx.doi.org/10.1063/1.3681778 (5 pages)

Measurement of ion and electron temperatures in plasma blobs by using an improved ion sensitive probe system and statistical analysis methods

K. Okazaki1, H. Tanaka1, N. Ohno1, N. Ezumi2, Y. Tsuji1, and S. Kajita3

1Graduate School of Engineering, Nagoya University, Nagoya, Aichi 464-8603, Japan
2Nagano National College of Technology, Nagano 381-8550, Japan
3EcoTopia Science Institute, Nagoya University, Nagoya, Aichi 464-8603, Japan

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(Received 18 November 2011; accepted 13 January 2012; published online 7 February 2012)

We have measured ion temperature as well as electron temperature in plasma blobs observed in a linear plasma device by using an improved ion sensitive probe. Current–voltage characteristics of the ion sensitive probe inside and outside plasma blobs were re-constructed with a conditional sampling method. It is clearly found that both ion and electron temperatures in plasma blobs decrease more slowly in a cross-field direction than those in a bulk plasma without plasma blobs.

© 2012 American Institute of Physics

Article Outline

  1. INTRODUCTION
  2. EXPERIMENTAL SETUP
    1. Linear divertor plasma simulator NAGDIS-II
    2. Ion sensitive probe with an additional single probe
    3. Electric circuit for the measurement
  3. ANALYSIS PROCEDURE
  4. EXPERIMENTAL RESULT
    1. Fluctuation analysis
    2. Calculation of T i and T e
  5. SUMMARY

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KEYWORDS and PACS

Keywords

plasma devices, plasma probes, plasma temperature, plasma transport processes, sampling methods, statistical analysis, temperature measurement

PACS

  • 52.70.Ds

    Electric and magnetic measurements

  • 52.75.-d

    Plasma devices

  • 52.25.Fi

    Transport properties

  • 02.50.-r

    Probability theory, stochastic processes, and statistics

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.3681778

PUBLICATION DATA

ISSN

0034-6748 (print)  
1089-7623 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

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Figures (click on thumbnails to view enlargements)

FIG.1
Diagrammatic illustration of the linear plasma divertor simulator NAGDIS-II.

FIG.1 Download High Resolution Image (.zip file) | Export Figure to PowerPoint

FIG.2
(a) Structure of the new probe head composed of ISP and single LP and (b) behaviors of ions and electrons at the head of ISP.

FIG.2 Download High Resolution Image (.zip file) | Export Figure to PowerPoint

FIG.3
Improved electric circuit for the measurement.

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FIG.4
Outline of analysis procedure.

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FIG.5
Radial distributions of (a) electron density, ne, and floating potential, Vf, (dashed line) obtained by G-electrode, and (b) skewness and fluctuation level (dashed line) obtained from Isat.

FIG.5 Download High Resolution Image (.zip file) | Export Figure to PowerPoint

FIG.6
Power spectra of the Isat signal at r = 24 mm.

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FIG.7
Normalized probability density function of I sat f at r = 24 mm. Vertical dashed lines represent the upper and the lower threshold.

FIG.7 Download High Resolution Image (.zip file) | Export Figure to PowerPoint

FIG.8
Reconstructed I–V characteristics (a) from Ip and (b) Ig.

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FIG.9
(a) Radial distributions of Ti and (b) Te obtained from the reconstructed I–V characteristics.

FIG.9 Download High Resolution Image (.zip file) | Export Figure to PowerPoint



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