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Review of Scientific Instruments / Volume 83 / Issue 2 / ARTICLES / Optics; Atoms and Molecules; Spectroscopy; Photon Detectors

Rev. Sci. Instrum. 83, 023102 (2012); http://dx.doi.org/10.1063/1.3681440 (8 pages)

The electron spectro-microscopy beamline at National Synchrotron Light Source II: A wide photon energy range, micro-focusing beamline for photoelectron spectro-microscopies

R. Reininger1, S. L. Hulbert1, P. D. Johnson2, J. T. Sadowski3, D. E. Starr3, O. Chubar1, T. Valla2, and E. Vescovo1

1Photon Sciences Directorate, Brookhaven National Laboratory, Upton, New York 11973, USA
2Condensed Matter Physics and Materials Science, Brookhaven National Laboratory, Upton, New York 11973, USA
3Center for Functional Nanomaterials, Brookhaven National Laboratory, Upton, New York 11973, USA

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(Received 27 December 2011; accepted 12 January 2012; published online 13 February 2012)

A comprehensive optical design for a high-resolution, high-flux, wide-energy range, micro-focused beamline working in the vacuum ultraviolet and soft x-ray photon energy range is proposed. The beamline is to provide monochromatic radiation to three photoelectron microscopes: a full-field x-ray photoelectron emission microscope and two scanning instruments, one dedicated to angle resolved photoemission spectroscopy (μ-ARPES) and one for ambient pressure x-ray photoelectron spectroscopy and scanning photoelectron microscopy (AP-XPS/SPEM). Microfocusing is achieved with state of the art elliptical cylinders, obtaining a spot size of 1 μm for ARPES and 0.5 μm for AP-XPS/SPEM. A detailed ray tracing analysis quantitatively evaluates the overall beamline performances.

© 2012 American Institute of Physics

Article Outline

  1. INTRODUCTION
  2. OPTICAL DESIGN
    1. Design goals
    2. Source
    3. Beamline technical description and layout
  3. BEAMLINE PERFORMANCES
    1. Power loading
    2. Photon energy resolution and flux
    3. Spot size on sample
  4. CONCLUSIONS

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KEYWORDS, PACS, and IPC

Keywords

photoelectron microscopy, ray tracing, scanning electron microscopy, X-ray apparatus, X-ray emission spectra, X-ray microscopy, X-ray photoelectron spectra, X-ray spectroscopy

PACS

International Patent Classification (IPC)

  • G21K7/00

    Gamma- or x-ray microscopes

  • H01L31/115

    Devices sensitive to very short wavelength, e.g. x-rays, gamma-rays or corpuscular radiation

  • H04N5/32

    Transforming x-rays

  • H05G

    X-ray technique

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.3681440

PUBLICATION DATA

ISSN

0034-6748 (print)  
1089-7623 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

For access to fully linked references, you need to log in.
    T. Valla, A. V. Fedorov, P. D. Johnson, and S. L. Hulbert, Phys. Rev. Lett. 83, 2085 (1999).

    D. F. Ogletree, H. Bluhm, G. Lebedev, C. S. Fadley, Z. Hussain, and M. Salmeron, Rev. Sci. Instrum 73, 3872 (2002)RSINAK000073000011003872000001.

    H. Yumoto, H. Mimura, S. Matsuyama, H. Hara, K. Yamamura, Y. Sano, K. Ueno, K. Endo, Y. Mori, M. Yabashi, Y. Nishino, K. Tamasaku, T. Ishikawa, and K. Yamauchi, Rev. Sci. Instrum. 76, 63708 (2005)RSINAK000076000006063708000001.

    F. Siewert, T. Noll, T. Schlegel, and H. Lammert, AIP Conf. Proc. 708, 847 (2004)APCPCS000705000001000847000001.

    U. Flechsig, L. Patthey, and T. Schmidt, AIP Conf. Proc. 705, 316 (2004)APCPCS000705000001000316000001.

    C. Welnak, P. Anderson, M. Khan, S. Singh, and F. Cerrina, Rev. Sci. Instrum. 63, 865 (1992)RSINAK000063000001000865000001.


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