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Review of Scientific Instruments / Volume 83 / Issue 1 / NOTES

Rev. Sci. Instrum. 83, 016101 (2012); http://dx.doi.org/10.1063/1.3675888 (3 pages)

Note: An adhesion measurement setup for bioinspired fibrillar surfaces using flat probes

E. Kroner1, J. Blau1, and E. Arzt1,2

1INM – Leibniz Institute for New Materials, Functional Surfaces Group, Saarbrucken 66123, Germany
2Saarland University, Saarbrucken 66123, Germany

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(Received 2 September 2011; accepted 12 December 2011; published online 9 January 2012)

Current adhesion measurement setups designed for experiments on bioinspired fibrillar surfaces, either commercial or constructed in-house, do not allow adhesion measurements with in situ visualization, high resolution, high force range, and controlled alignment at the same time. In this paper a new adhesion tester is presented, which enables contact experiments with controlled tilt angle (accuracy of ±0.02°). This allows the use of flat probes and thus greatly simplifies the determination of experimental parameters such as pull-off strength or Young's modulus. The deflection of a double-clamped glass beam is measured by laser interferometry with an accuracy of ±60 nm, which yields a precise force measurement over three orders of magnitude force range without changing the glass beam. Contact formation and detachment events can be visualized in situ. The current adhesion tester is designed for force measurements in the range of 1 μN to 1 N and fills the gap between macroscopic tests and atomic force microscopy measurements.

© 2012 American Institute of Physics

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KEYWORDS and PACS

Keywords

adhesion, atomic force microscopy, force measurement, light interferometry, measurement by laser beam, Young's modulus

PACS

  • 07.10.Pz

    Instruments for strain, force, and torque

  • 07.60.Ly

    Interferometers

  • 42.62.Eh

    Metrological applications; optical frequency synthesizers for precision spectroscopy

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.3675888

PUBLICATION DATA

ISSN

0034-6748 (print)  
1089-7623 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

For access to fully linked references, you need to log in.
    S. Kim and M. Sitti, Appl. Phys. Lett. 89, 261911 (2006)APPLAB000089000026261911000001.

    M. Varenberg, A. Peressadko, S. Gorb, E. Arzt, and S. Mrotzek, Rev. Sci. Instrum. 77, 066105 (2006)RSINAK000077000006066105000001.


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