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Review of Scientific Instruments / Volume 83 / Issue 1 / ARTICLES / Microscopy and Imaging

Rev. Sci. Instrum. 83, 013701 (2012); http://dx.doi.org/10.1063/1.3673476 (5 pages)

Probing local surface conductance using current sensing atomic force microscopy

Yucong Liu1, Jiayu He2, Osung Kwon1, and Da-Ming Zhu1

1Department of Physics, University of Missouri - Kansas City, Kansas City, Missouri 64110, USA
2Shanghai Institute of Technical Physics, Academy Science of China, Shanghai, China

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(Received 7 September 2011; accepted 6 December 2011; published online 3 January 2012)

We have analyzed correlations between surface morphology and current sensing images obtained using a current sensing atomic force microscope (CSAFM) and the implication of surface conductivity derived from the current sensing images. We found that in cases where the diameter of a CSAFM probe tip is much smaller than the correlation length of the surface morphological features, the current detected using the probe should have little correlation with the surface features imaged by the same probe. If the sample thickness is much larger than the tip size, the surface conductivity distribution of a sample can be derived from a current sensing image using the Holm resistance relation, and the current probed using a CSAFM reflects the conductance variations in a layer on the surface with the thickness comparable to the probe diameter. However, if the thickness of a sample is comparable to or smaller than the tip diameter, CSAFM measures the conductance across the entire portion of the sample sandwiched between the tip and the electrode.

© 2012 American Institute of Physics

Article Outline

  1. INTRODUCTION
  2. CSAFM MEASURED SURFACE RESISTIVITY
  3. EFFECTS OF SURFACE MORPHOLOGY TO CURRENT SENSING IMAGES
  4. SENSITIVITY OF CURRENT SENSING TO THE SURFACE CONDUCTIVITY HETEROGENEITY

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KEYWORDS and PACS

Keywords

atomic force microscopy, surface conductivity, surface morphology

PACS

  • 07.79.Lh

    Atomic force microscopes

  • 73.25.+i

    Surface conductivity and carrier phenomena

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.3673476

PUBLICATION DATA

ISSN

0034-6748 (print)  
1089-7623 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

For access to fully linked references, you need to log in.
    R. O'Hayre, M. Lee, and F. B. Prinz, J. Appl. Phys. 95, 8382 (2004)JAPIAU000095000012008381000001.

    H. Zeng, H. Hong, W. Luo, W. Huang, Z. Wang, and Y. Li, J. Appl. Phys. 105, 094319 (2009)JAPIAU000105000009094319000001.

    P. Zhang and Y. Y. Lau, J. Appl. Phys. 108, 044914 (2010)JAPIAU000108000004044914000001.


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