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Review of Scientific Instruments / Volume 83 / Issue 1 / ARTICLES / Optics; Atoms and Molecules; Spectroscopy; Photon Detectors

Rev. Sci. Instrum. 83, 013102 (2012); http://dx.doi.org/10.1063/1.3662412 (8 pages)

High-precision laser-assisted absolute determination of x-ray diffraction angles

K. Kubiček, J. Braun, H. Bruhns, J. R. Crespo López-Urrutia, P. H. Mokler, and J. Ullrich

Max-Planck-Institute for Nuclear Physics, D-69117 Heidelberg, Germany

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(Received 4 July 2011; accepted 29 October 2011; published online 4 January 2012)

A novel technique for absolute wavelength determination in high-precision crystal x-ray spectroscopy recently introduced has been upgraded reaching unprecedented accuracies. The method combines visible laser beams with the Bond method, where Bragg angles (θ and −θ) are determined without any x-ray reference lines. Using flat crystals this technique makes absolute x-ray wavelength measurements feasible even at low x-ray fluxes. The upgraded spectrometer has been used in combination with first experiments on the 1s2p 1P1 → 1s2 1S0 w- line in He-like argon. By resolving a minute curvature of the x-ray lines the accuracy reaches there the best ever reported value of 1.5 ppm. The result is sensitive to predicted second-order QED contributions at the level of two-electron screening and two-photon radiative diagrams and will allow for the first time to benchmark predicted binding energies for He-like ions at this level of precision.

© 2012 American Institute of Physics

Article Outline

  1. INTRODUCTION
  2. SPECTROMETER ARRANGEMENT
  3. MEASUREMENT PRINCIPLE
    1. Geometry of the light fiducial setup
    2. Alignment of the origin of the light fiducials
      1. Adjustment in y direction
      2. Corrections for the extended source
      3. Adjustment in z direction
      4. X-ray line profiles
  4. DATA ANALYSIS AND RESULTS
    1. Determination of the Bragg angle and the wavelength of the w -transition
    2. Error budget
    3. Results and discussion

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KEYWORDS and PACS

Keywords

laser beams, X-ray diffraction, X-ray spectroscopy

PACS

  • 42.60.Jf

    Beam characteristics: profile, intensity, and power; spatial pattern formation

  • 29.30.Kv

    X- and γ-ray spectroscopy

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.3662412

PUBLICATION DATA

ISSN

0034-6748 (print)  
1089-7623 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

For access to fully linked references, you need to log in.
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