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Review of Scientific Instruments / Volume 82 / Issue 8 / NOTES

Rev. Sci. Instrum. 82, 086103 (2011); http://dx.doi.org/10.1063/1.3624690 (3 pages)

Note: Design and construction of a simple and reliable printed circuit board-substrate Bradbury-Nielsen gate for ion mobility spectrometry

Yongzhai Du1,2, Huaiwen Cang1, Weiguo Wang1, Fenglei Han1,2, Chuang Chen1,2, Lin Li1, Keyong Hou1, and Haiyang Li1

1Dalian Institute of Chemical Physics, Chinese Academy of Sciences, 457 Zhongshan Road, Dalian 116023, People's Republic of China
2Graduate School, Chinese Academy of Sciences, Beijing 100049, People's Republic of China

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(Received 8 June 2011; accepted 21 July 2011; published online 10 August 2011)

A less laborious, structure-simple, and performance-reliable printed circuit board (PCB) based Bradbury-Nielsen gate for high-resolution ion mobility spectrometry was introduced and investigated. The gate substrate was manufactured using a PCB etching process with small holes (Φ 0.1 mm) drilled along the gold-plated copper lines. Two interdigitated sets of rigid stainless steel spring wire (Φ 0.1 mm) that stands high temperature and guarantees performance stability were threaded through the holes. Our homebuilt ion mobility spectrometer mounted with the gate gave results of about 40 for resolution while keeping a signal intensity of over 0.5 nano-amperes.

© 2011 American Institute of Physics

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KEYWORDS and PACS

Keywords

etching, ion mobility, printed circuits, spectrometers, substrates

PACS

  • 07.81.+a

    Electron and ion spectrometers

  • 85.40.-e

    Microelectronics: LSI, VLSI, ULSI; integrated circuit fabrication technology

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.3624690

PUBLICATION DATA

ISSN

0034-6748 (print)  
1089-7623 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

For access to fully linked references, you need to log in.
    N. E. Bradbury and R. A. Nielsen, Phys. Rev. 49, 388 (1936).

    A. W. Szumlas, D. A. Rogers, and G. M. Hieftje, Rev. Sci. Instrum. 76, 3 (2005)RSINAK000076000008086108000001.

    G. A. Eiceman, E. G. Nazarov, J. E. Rodriguez, and J. A. Stone, Rev. Sci. Instrum. 72, 3610 (2001)RSINAK000072000009003610000001.


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