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Review of Scientific Instruments / Volume 82 / Issue 7 / ARTICLES / Microscopy and Imaging

Rev. Sci. Instrum. 82, 073707 (2011); http://dx.doi.org/10.1063/1.3608447 (5 pages)

Wideband phase-locked loop circuit with real-time phase correction for frequency modulation atomic force microscopy

Takeshi Fukuma1,2,3, Shunsuke Yoshioka2, and Hitoshi Asakawa3

1Frontier Science Organization, Kanazawa University, Kakuma-machi, Kanazawa 920-1192, Japan
2Division of Electrical and Computer Engineering, Kanazawa University, Kakuma-machi, Kanazawa 920-1192, Japan
3Bio-AFM Frontier Research Center, Kanazawa University, Kakuma-machi, Kanazawa 920-1192, Japan

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(Received 20 April 2011; accepted 16 June 2011; published online 20 July 2011)

We have developed a wideband phase-locked loop (PLL) circuit with real-time phase correction for high-speed and accurate force measurements by frequency modulation atomic force microscopy (FM-AFM) in liquid. A high-speed operation of FM-AFM requires the use of a high frequency cantilever which, however, increases frequency-dependent phase delay caused by the signal delay within the cantilever excitation loop. Such phase delay leads to an error in the force measurements by FM-AFM especially with a low Q factor. Here, we present a method to compensate this phase delay in real time. Combined with a wideband PLL using a subtraction-based phase comparator, the method allows to perform an accurate and high-speed force measurement by FM-AFM. We demonstrate the improved performance by applying the developed PLL to three-dimensional force measurements at a mica/water interface.

© 2011 American Institute of Physics

Article Outline

  1. INTRODUCTION
  2. FREQUENCY-DEPENDENT PHASE DELAY
  3. REAL-TIME PHASE CORRECTION
  4. EXPERIMENTAL DETAILS
  5. PHASE VERSUS FREQUENCY CURVES
  6. 3D HYDRATION FORCE MEASUREMENTS

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KEYWORDS and PACS

Keywords

atomic force microscopy, cantilevers, force measurement, frequency modulation, phase comparators, real-time systems

PACS

  • 07.79.Lh

    Atomic force microscopes

  • 68.37.Ps

    Atomic force microscopy (AFM)

  • 07.10.Pz

    Instruments for strain, force, and torque

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.3608447

PUBLICATION DATA

ISSN

0034-6748 (print)  
1089-7623 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

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    References

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    T. Fukuma, Y. Ueda, S. Yoshioka, and H. Asakawa, Phys. Rev. Lett. 104, 016101 (2010).


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