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May 2011

Volume 82, Issue 5, Articles (05xxxx)

Issue Cover Spotlight Figure

Rev. Sci. Instrum. 82, 053710 (2011); http://dx.doi.org/10.1063/1.3592992 (7 pages)

Rajiv Giridharagopal, Jun Zhang, and Kevin F. Kelly

A tunable microwave-frequency alternating current scanning tunneling microscope can simultaneously image topography and differential capacitance. Here, the differential capacitance image on an organic semiconductor thin film, poly(3-hexylthiophene), on a gold substrate shows spatial variation in carrier concentration.

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Andreas Mandelis

Rev. Sci. Instrum. 82, 059501 (2011); http://dx.doi.org/10.1063/1.3586435 (4 pages)

Online Publication Date: 12 May 2011

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Abstract Unavailable
Show PACS
01.10.Cr Announcements, news, and awards
07.60.-j Optical instruments and equipment
06.60.-c Laboratory procedures
87.80.-y Biophysical techniques (research methods)
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