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Review of Scientific Instruments / Volume 82 / Issue 12 / ARTICLES / Electronics; Electromagnetic Technology; Microwaves

Rev. Sci. Instrum. 82, 124704 (2011); http://dx.doi.org/10.1063/1.3665209 (5 pages)

Ultrafast electrical measurements of polarization dynamics in ferroelectric thin-film capacitors

Alexei Grigoriev, Mandana Meisami Azad, and John McCampbell

Department of Physics and Engineering Physics, The University of Tulsa, Tulsa, Oklahoma 74104, USA

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(Received 30 July 2011; accepted 7 November 2011; published online 14 December 2011)

We have developed a new approach to measure fast electrical signals during polarization switching in ferroelectric thin-film capacitors. This article describes a simple method for probing transient currents and voltages in a broad range of time scales from microseconds to hundreds of picoseconds. In order to test our approach, we probed polarization dynamics in commercial PbZr0.2Ti0.8O3 ferroelectric capacitors in which the measured switching time was as fast as 1.7 ns.

© 2011 American Institute of Physics

Article Outline

  1. INTRODUCTION
  2. SETUP
  3. MEASUREMENTS AND RESULTS
  4. SUMMARY

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KEYWORDS and PACS

Keywords

electric current measurement, ferroelectric capacitors, ferroelectric switching, ferroelectric thin films, lead compounds, thin film capacitors, voltage measurement

PACS

  • 84.32.Tt

    Capacitors

  • 85.50.-n

    Dielectric, ferroelectric, and piezoelectric devices

  • 84.37.+q

    Measurements in electric variables (including voltage, current, resistance, capacitance, inductance, impedance, and admittance, etc.)

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.3665209

PUBLICATION DATA

ISSN

0034-6748 (print)  
1089-7623 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

For access to fully linked references, you need to log in.
    A. Grigoriev, R. J. Sichel, J. Y. Jo, S. Choudhury, L. Q. Chen, H. N. Lee, E. C. Landahl, B. W. Adams, E. M. Dufresne, and P. G. Evans, Phys. Rev. B 80(1), 014110 (2009).

    J. Y. Jo, H. S. Han, J. G. Yoon, T. K. Song, S. H. Kim, and T. W. Noh, Phys. Rev. Lett. 99(26), 267602 (2007).

    W. J. Merz, J. Appl. Phys. 27(8), 938 (1956)JAPIAU000027000008000938000001.

    S. Fahy and R. Merlin, Phys. Rev. Lett. 73(8), 1122 (1994).

    J. Li, B. Nagaraj, H. Liang, W. Cao, C. H. Lee, and R. Ramesh, Appl. Phys. Lett. 84(7), 1174 (2004)APPLAB000084000007001174000001.


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