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Review of Scientific Instruments / Volume 82 / Issue 11 / ARTICLES / Microscopy and Imaging

Rev. Sci. Instrum. 82, 113703 (2011); http://dx.doi.org/10.1063/1.3658049 (6 pages)

Circular mode: A new scanning probe microscopy method for investigating surface properties at constant and continuous scanning velocities

Hussein Nasrallah1, Pierre-Emmanuel Mazeran2, and Olivier Noël1

1Molecular Landscapes and Biophotonic Skyline Group, Laboratoire de Physique de l’Etat Condensé, CNRS-UMR 6087, Université du Maine, Avenue Olivier Messiaen, 72085 Le Mans Cedex 9, France
2Laboratoire Roberval, CNRS-UMR 6253, Université de Technologie de Compiègne, BP 20529, 60205 Compiègne Cedex, France

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(Received 7 June 2011; accepted 11 October 2011; published online 8 November 2011)

In this paper, we introduce a novel scanning probe microscopy mode, called the circular mode, which offers expanded capabilities for surface investigations especially for measuring physical properties that require high scanning velocities and/or continuous displacement with no rest periods. To achieve these specific conditions, we have implemented a circular horizontal displacement of the probe relative to the sample plane. Thus the relative probe displacement follows a circular path rather than the conventional back and forth linear one. The circular mode offers advantages such as high and constant scanning velocities, the possibility to be combined with other classical operating modes, and a simpler calibration method of the actuators generating the relative displacement. As application examples of this mode, we report its ability to (1) investigate the influence of scanning velocity on adhesion forces, (2) measure easily and instantly the friction coefficient, and (3) generate wear tracks very rapidly for tribological investigations.

© 2011 American Institute of Physics

Article Outline

  1. INTRODUCTION
  2. CIRCULAR MODE: EXPERIMENTAL SETUP
  3. ADVANTAGES OF THE CIRCULAR MODE
  4. APPLICATION EXAMPLES OF THE CIRCULAR MODE IN NANOTRIBOLOGY
    1. Coupling the circular mode with other mode: Measurements of adhesion forces at different sliding velocities
    2. Measurements of friction forces at different loads in a stationary state: Instantaneous determination of a friction coefficient
    3. Using the circular mode at high sliding velocity: Fast achievement of wear tracks
  5. CONCLUSION

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KEYWORDS and PACS

Keywords

adhesion, calibration, friction, scanning probe microscopy, wear

PACS

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.3658049

PUBLICATION DATA

ISSN

0034-6748 (print)  
1089-7623 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

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