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Rev. Sci. Instrum. 81, 074902 (2010); http://dx.doi.org/10.1063/1.3465329 (7 pages)

Time-resolved ellipsometry for studies of heat transfer at liquid/solid and gas/solid interfaces

Chang-Ki Min, David G. Cahill, and Steve Granick

Department of Materials Science and Engineering, and Frederick Seitz Materials Research Laboratory, University of Illinois, Urbana, Illinois 61801, USA

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(Received 23 November 2009; accepted 28 June 2010; published online 28 July 2010)

We describe a sensitive method for measuring time-dependent changes in refractive index within ∼ 5 μm of an interface using off-null time-resolved ellipsometry and a dual-cavity femtosecond laser. The sensitivity to changes in refractive index is two orders of magnitude higher than conventional picosecond interferometry. A thin metal film on a sapphire substrate is heated by ∼ 10 K using an ultrafast optical pump pulse; the subsequent changes of the phase difference δΔ between math and math polarized reflectivity are tracked using off-null ellipsometry using a time-delayed probe pulse. We demonstrate a sensitivity of δΔ ≈ 3×10−7 deg/√Hz using interfaces between Au and water, and Au and various gases including R134a, a common refrigerant. Our data for the damping rate of ≈200 MHz frequency acoustic waves in O2, N2, and Ar at atmospheric pressure agree well with prior results obtained at much lower pressures and frequencies.

© 2010 American Institute of Physics

Article Outline

  1. INTRODUCTION
  2. TIME-RESOLVED ELLIPSOMETRY USING OFF-NULL GEOMETRY
    1. Optical analysis
    2. Dual-cavity laser to generate the optical pump and probe
    3. Sensitivity
    4. Transfer of heat from solid to gas
  3. CONCLUSION

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0034-6748 (print)  
1089-7623 (online)

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