RSI Nameplate
  • Volume/Page
  • Keyword
  • DOI
  • Citation
  • Advanced
   
 
 
 

Flickr Twitter UniPHY Group iResearch App Facebook

Review of Scientific Instruments / Volume 81 / Issue 6 / ARTICLES / Optics; Atoms and Molecules; Spectroscopy; Photon Detectors

Rev. Sci. Instrum. 81, 063107 (2010); doi:10.1063/1.3441983 (5 pages)

Double conical crystal x-ray spectrometer for high resolution ultrafast x-ray absorption near-edge spectroscopy of Al K edge

A. Levy, F. Dorchies, C. Fourment, M. Harmand, S. Hulin, J. J. Santos, D. Descamps, S. Petit, and R. Bouillaud

Centre Lasers Intenses et Applications (CELIA), Université de Bordeaux-CNRS-CEA, Talence F-33405, France

View MapView Map

(Received 22 January 2010; accepted 10 May 2010; published online 17 June 2010)

An x-ray spectrometer devoted to dynamical studies of transient systems using the x-ray absorption fine spectroscopy technique is presented in this article. Using an ultrafast laser-induced x-ray source, this optical device based on a set of two potassium acid phthalate conical crystals allows the extraction of x-ray absorption near-edge spectroscopy structures following the Al absorption K edge. The proposed experimental protocol leads to a measurement of the absorption spectra free from any crystal reflectivity defaults and shot-to-shot x-ray spectral fluctuation. According to the detailed analysis of the experimental results, a spectral resolution of 0.7 eV rms and relative fluctuation lower than 1% rms are achieved, demonstrated to be limited by the statistics of photon counting on the x-ray detector.

© 2010 American Institute of Physics

Article Outline

  1. INTRODUCTION
  2. X-RAY SPECTROMETER DESIGN
  3. ABSORPTION SPECTRA EXTRACTION
  4. MEASUREMENT ACCURACY
  5. CONCLUSION

RELATED DATABASES

To view database links for this article, you need to log in.

KEYWORDS and PACS

Keywords

XANES, X-ray detection, X-ray spectrometers

PACS

  • 07.85.Fv

    X- and γ-ray sources, mirrors, gratings, and detectors

  • 29.40.-n

    Radiation detectors

ARTICLE DATA

Permalink
http://link.aip.org/link/doi/10.1063/1.3441983

PUBLICATION DATA

ISSN:

0034-6748 (print)  
1089-7623 (online)

Publisher:

$abstract.society.value is a Member of CrossRef American Institute of Physics

For access to fully linked references, you need to log in.
    E. Seres, J. Seres, and C. Spielmann, Appl. Phys. Lett. 89, 181919 (2006)APPLAB000089000018181919000001.

    A. Rousse, K. Ta Phuoc, R. Shah, A. Pukhov, E. Lefebvre, V. Malka, S. Kiselev, F. Burgy, J. -P. Rousseau, D. Umstadter, and D. Hulin, Phys. Rev. Lett. 93, 135005 (2004).

    K. Sokolowski-Tinten, C. Blome, C. Dietrich, A. Tarasevitch, M. Horn von Hoegen, D. von der Linde, A. Cavalleri, J. Squier, and M. Kammler, Phys. Rev. Lett. 87, 225701 (2001).

    A. Cavalleri, Cs. Toth, C. W. Siders, J. A. Squier, F. Raksi, P. Forget, and J. C. Kieffer, Phys. Rev. Lett. 87, 237401 (2001).

    U. Vogt, T. Wilhein, H. Stiel, and H. Legall, Rev. Sci. Instrum. 75, 4606 (2004)RSINAK000075000011004606000001.

    S. Fourmaux, L. Lecherbourg, M. Harmand, M. Servol, and J. -C. Kieffer, Rev. Sci. Instrum. 78, 113104 (2007)RSINAK000078000011113104000001.

    S. L. Johnson, P. A. Heimann, M. Lindenberg, H. O. Jeschke, M. E. Garcia, Z. Chang, R. W. Lee, J. J. Rehr, and R. W. Falcone, Phys. Rev. Lett. 91, 157403 (2003).

    Y. Okano, K. Oguri, T. Nishikawa, and H. Nakano, Rev. Sci. Instrum. 77, 046105 (2006)RSINAK000077000004046105000001.

    B. Yaakobi, T. R. Boehly, T. C. Sangster, D. D. Meyerhofer, B. A. Remington, P. G. Allen, S. M. Pollaine, H. E. Lorenzana, K. T. Lorenz, and J. A. Hawreliak, Phys. Plasmas 15, 062703 (2008)PHPAEN000015000006062703000001.

    F. Ráksi, K. R. Wilson, Z. Jiang, A. Ikhlef, C. Y. Côté, and J. -C. Kieffer, J. Chem. Phys. 104, 6066 (1996)JCPSA6000104000015006066000001.

    P. Audebert, P. Renaudin, S. Bastiani-Ceccotti, J. -P. Geindre, C. Chenais-Popovics, S. Tzortzakis, V. Nagels-Silvert, R. Shepherd, I. Matsushima, S. Gary, F. Girard, O. Peyrusse, and J. -C. Gauthier, Phys. Rev. Lett. 94, 025004 (2005).

    S. L. Johnson, P. A. Heimann, A. G. MacPhee, A. M. Lindenberg, O. R. Monteiro, Z. Chang, R. W. Lee, and R. W. Falcone, Phys. Rev. Lett. 94, 057407 (2005).

    K. Oguri, Y. Okano, T. Nishikawa, and H. Nakano, Phys. Rev. Lett. 99, 165003 (2007).

    M. Harmand, F. Dorchies, O. Peyrusse, D. Descamps, C. Fourment, S. Hulin, S. Petit, and J. J. Santos, Phys. Plasmas 16, 063301 (2009)PHPAEN000016000006063301000001.

    F. Dorchies, M. Harmand, D. Descamps, C. Fourment, S. Hulin, S. Petit, O. Peyrusse, and J. J. Santos, Appl. Phys. Lett. 93, 121113 (2008)APPLAB000093000012121113000001.

    E. Martinolli, M. Koenig, J. M. Boudenne, E. Perelli, D. Batani, and T. A. Hall, Rev. Sci. Instrum. 75, 2024 (2004)RSINAK000075000006002024000001.

    C. Bonté, M. Harmand, F. Dorchies, S. Magnan, V. Pitre, J. -C. Kieffer, P. Audebert, and J. P. Geindre, Rev. Sci. Instrum. 78, 043503 (2007)RSINAK000078000004043503000001.

    E. A. Stern and K. Kim, Phys. Rev. B 23, 3781 (1981).

    M. E. Rose and M. M. Shapiro, Phys. Rev. 74, 1853 (1948).


For access to citing articles, you need to log in.


Figures (7)

Access to article objects (figures, tables, multimedia) requires a subscription; log in to view available files.
(Access to supplementary files, where available, is free for this journal.)



Close

Google Calendar

ADVERTISEMENT

Your Recent History Recent History Help

Recently Viewed

  1. Double conical crystal x-ray spectrometer for high resolution ultrafast x-ray absorption near-edge spectroscopy of Al K edge
  2. Inductive conductivity tensor measurement for flowline or material samples
  3. Invited Article: High-pressure techniques for condensed matter physics at low temperature
Go to AIP Home
Copyright © American Institute of Physics
close