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Mar 2010

Volume 81, Issue 3, Articles (03xxxx)

Issue Cover Spotlight Figure

Rev. Sci. Instrum. 81, 031101 (2010); http://dx.doi.org/10.1063/1.3327886 (14 pages)

Majid Nabavi

For full-field unsteady pressure measurement, pressure sensitive paint (PSP) is an attractive technique due to its relatively fast response and high spatial resolution. The output of the system is a color image representing the pressure variations.

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Note: Measurement of saturable absorption by intense vacuum ultraviolet free electron laser using fluorescent material

Y. Inubushi, H. Yoneda, A. Higashiya, T. Ishikawa, H. Kimura, T. Kumagai, S. Morimoto, M. Nagasono, H. Ohashi, F. Sato, T. Tanaka, T. Togashi, K. Tono, M. Yabashi, Y. Yamaguchi, et al.

Rev. Sci. Instrum. 81, 036101 (2010); http://dx.doi.org/10.1063/1.3302542 (3 pages)

Online Publication Date: 2 March 2010

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Advances in free electron lasers (FELs) which generate high energy photons are expected to open novel nonlinear optics in the x-ray and vacuum ultraviolet (VUV) regions. In this paper, we report a new method for performing VUV-FEL focusing experiments. A VUV-FEL was focused with Kirkpatrick−Baez optics on a multilayer target, which contains fused silica as a fluorescent material. By measuring the fluorescence, a 5.6×4.9 μm2 focal spot was observed in situ. Fluorescence was used to measure the saturable absorption of VUV pulses in the tin layer. The transmission increases nonlinearly higher with increasing laser intensity.
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41.60.Cr Free-electron lasers
42.50.Gy Effects of atomic coherence on propagation, absorption, and amplification of light; electromagnetically induced transparency and absorption
42.55.Vc X- and γ-ray lasers

Note: Effects of several thermal glues used on temperature dependent Hall measurements

Victor-Tapio Rangel-Kuoppa and Gang Chen

Rev. Sci. Instrum. 81, 036102 (2010); http://dx.doi.org/10.1063/1.3321563 (3 pages) | Cited 4 times

Online Publication Date: 2 March 2010

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The effects of four thermal glues (cry-con©, fixogum©, RS 503-357©, and silicon-high vacuum-grease from Leybold vacuum©) on temperature dependent Hall measurements on n-type silicon are tested. All thermal glues yielded the same results (resistivity, mobility, and charge carrier density) between 300 and 190 K. The use of RS 503-357© drastically distorts the expected results below 190 K, probably due to a phase transition and its latent heat, which affects the sample temperature during the phase transition. All the other thermal glues give reproducible results down to 100 K. Below 100 K, the use of cry-con©, fixogum©, and the silicon-high vacuum-grease from Leybold vacuum© yield decreasing mobility and charge carrier density and increasing resistivity, as temperature decreases, but with different magnitudes. This is explained as the thermal properties of each glue start to diverge. Fixogum© seems to give the best thermal conductivity, while the silicon-high vacuum grease from Leybold vacuum performs the worst below 100K. Crycon© has an intermediate behavior between these two former ones. Cooling speed plays an important role at these low temperatures.
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72.20.My Galvanomagnetic and other magnetotransport effects
64.70.K- Solid-solid transitions
65.40.G- Other thermodynamical quantities
66.70.-f Nonelectronic thermal conduction and heat-pulse propagation in solids; thermal waves
07.30.Kf Vacuum chambers, auxiliary apparatus, and materials
06.60.Ei Sample preparation (including design of sample holders)

Note: Influence of rinsing and drying routines on growth of multilayer thin films using automated deposition system

Daniel Gamboa, Morgan A. Priolo, Aaron Ham, and Jaime C. Grunlan

Rev. Sci. Instrum. 81, 036103 (2010); http://dx.doi.org/10.1063/1.3310088 (3 pages) | Cited 8 times

Online Publication Date: 4 March 2010

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A versatile, high speed robot for layer-by-layer deposition of multifunctional thin films, which integrates concepts from previous dipping systems, has been designed with dramatic improvements in software, positioning, rinsing, drying, and waste removal. This system exploits the electrostatic interaction of oppositely charged species to deposit nanolayers (1–10 nm thick) from water onto the surface of a substrate. Dip times and number of deposited layers are adjustable through a graphical user interface. In between dips the system spray rinses and dries the substrate by positioning it in the two-tiered rinse-dry station. This feature significantly reduces processing time and provides the flexibility to choose from four different procedures for rinsing and drying. Assemblies of natural montmorillonite clay and polyethylenimine are deposited onto 175 μm poly(ethylene terephthalate) film to demonstrate the utility of this automated deposition system. By altering the type of rinse-dry procedure, these clay-based assemblies are shown to exhibit variations in film thickness and oxygen transmission rate. This type of system reproducibly deposits films containing 20 or more layers and may also be useful for other types of coatings that make use of dipping.
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68.55.am Polymers and organics
68.65.Ac Multilayers
81.05.Lg Polymers and plastics; rubber; synthetic and natural fibers; organometallic and organic materials

Note: Studies on target placement in TE111 cylindrical cavity of electron cyclotron resonance x-ray source for the enhancement of x-ray dose

T. S. Selvakumaran, R. Baskaran, A. K. Singh, and V. L. S. Rao Sista

Rev. Sci. Instrum. 81, 036104 (2010); http://dx.doi.org/10.1063/1.3321496 (3 pages) | Cited 1 time

Online Publication Date: 5 March 2010

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X-ray source based on electron cyclotron resonance principle has been constructed using TE111 cylindrical cavity. At present the device is used to provide low energy x-ray field for thermoluminescent dosimeter badge calibration. Theoretical and experimental studies on the effect of target placement inside the TE111 cylindrical cavity for enhancing the x-ray output are carried out and the results are presented in this note. Optimum target location is identified by theoretical analysis on the electric field distribution inside the cavity using MICROWAVE STUDIO program. By modifying the magnetic field configuration, the resonance region is shifted to the optimum target location. The microwave transmission line is upgraded with a three stub tuner which improves the microwave coupling from the source to the target loaded cavity. Molybdenum target is located at a radial distance of 2.5 cm from the cavity center and the x-ray dose rate is measured at 20 cm from the exit port for different microwave power. With the introduction of the target, the x-ray output has improved nearly from 70% to 160% in the microwave power of 150–500 W.
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07.85.Fv X- and γ-ray sources, mirrors, gratings, and detectors
76.40.+b Diamagnetic and cyclotron resonances

Note: Simultaneous measurement of surface plasmon resonance and surface-enhanced Raman scattering

Yu Liu, Shuping Xu, Bin Tang, Ye Wang, Ji Zhou, Xianliang Zheng, Bing Zhao, and Weiqing Xu

Rev. Sci. Instrum. 81, 036105 (2010); http://dx.doi.org/10.1063/1.3321313 (3 pages) | Cited 5 times

Online Publication Date: 10 March 2010

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A surface plasmon resonance (SPR)-surface enhanced Raman scattering (SERS) microspectrometer was designed to obtain the incident angle dependence of SERS signals excited by the evanescent field. By simultaneous measurement of the SERS and SPR spectra of analytes, the highest SERS signal intensities were found to appear at the vicinity of the resonance angle. The enhancement factor was about 2.0×106. The simulated angle of the maximal SERS intensity based on Fresnel equation was found to be in good agreement with the experimental results. The SERS and SPR spectra captured simultaneously not only directly confirm the correlation between the SERS and SPR but also present a potential technique for obtaining the structure information about the analytes in molecule level with recording their SPR curves.
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07.60.Rd Visible and ultraviolet spectrometers
73.20.Mf Collective excitations (including excitons, polarons, plasmons and other charge-density excitations)

Note: Design and test of a compact flexure z-stage for atomic force microscopy

Gianangelo Bracco, Antonio Gussoni, and Luisa Carlotta Pagnini

Rev. Sci. Instrum. 81, 036106 (2010); http://dx.doi.org/10.1063/1.3340902 (3 pages)

Online Publication Date: 12 March 2010

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We describe the design and test of a flexure z-stage with 12.5 mm height and 4 μm travel to be coupled with a commercial xy stage. The geometrical model was simulated by means of finite element calculations which have provided an accurate description of the stage dynamics also taking into account the effect of a load to get a resonance frequency of 8 kHz with a 10 g load. The tests of the complete xyz stage were performed in intermittent-contact mode on a sample having periodic features (1.6 μm period, 100 nm height) and with additional loads to increase the mass up to 20 g. The results show that for a 10 g load the surface profiles are well reproduced up to 60 μm/s while with a 20 g sample the speed is reduced to 40 μm/s.
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07.79.Lh Atomic force microscopes

Note: Low density and long plasma channels generated by laser transversely ignited ablative capillary discharges

Mingwei Liu, Aihua Deng, Jiansheng Liu, Ruxin Li, Jiancai Xu, Changquan Xia, Cheng Wang, Baifei Shen, Zhizhan Xu, and K. Nakajima

Rev. Sci. Instrum. 81, 036107 (2010); http://dx.doi.org/10.1063/1.3360925 (3 pages) | Cited 1 time

Online Publication Date: 17 March 2010

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A technique is developed to reduce the jitter associated with ablative capillary discharges. A laser pulse propagating perpendicularly to the axis of the capillary and focused onto a copper wire creates a plasma that initiates the discharge. This transverse laser ignition method has several advantages over previous techniques employing a laser pulse collinear with the capillary, including increased capillary lifetime and simpler arrangement of the igniting and the driving pulses for laser-wakefield acceleration. Using this technique long, low density plasma channels are produced with low jitter.
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52.50.Jm Plasma production and heating by laser beams (laser-foil, laser-cluster, etc.)
52.80.Vp Discharge in vacuum
52.38.Kd Laser-plasma acceleration of electrons and ions

Note: The effect of sample insulation on experiment precision of resistivity measurement in a diamond anvil cell

Gang Peng (彭刚), Yonghao Han (韩永昊), Chunxiao Gao (高春晓), Yanzhang Ma (马艳章), Baojia Wu (吴宝嘉), Cailong Liu (刘才龙), Bao Liu (刘鲍), Tingjing Hu (胡廷静), Yue Wang (王月), Xiaoyan Cui (崔晓岩), Wanbin Ren (任万彬), Hongwu Liu (刘洪武), and Guangtian Zou (邹广田)

Rev. Sci. Instrum. 81, 036108 (2010); http://dx.doi.org/10.1063/1.3356983 (3 pages) | Cited 1 time

Online Publication Date: 18 March 2010

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By use of electrical field analysis method, the accuracy of electrical resistivity measurement with the van der Pauw method in a diamond anvil cell (DAC) was investigated for the situation that sample and gasket were electrically shorted. It is revealed that metal gasket could not be used in electrical measurement in DAC if the inside wall of the sample chamber was not insulated. When the shorted area was less than 20% of the inside wall of the sample chamber, the relative error was smaller than 10%. Once the shorted area exceeded 25%, the relative error increased rapidly.
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84.37.+q Measurements in electric variables (including voltage, current, resistance, capacitance, inductance, impedance, and admittance, etc.)
41.20.Cv Electrostatics; Poisson and Laplace equations, boundary-value problems

Note: The full function test explosive generator

D. B. Reisman, J. B. Javedani, L. V. Griffith, G. F. Ellsworth, R. M. Kuklo, D. A. Goerz, A. D. White, L. J. Tallerico, D. A. Gidding, M. J. Murphy, and J. B. Chase

Rev. Sci. Instrum. 81, 036109 (2010); http://dx.doi.org/10.1063/1.3359998 (3 pages)

Online Publication Date: 26 March 2010

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We have conducted three tests of a new pulsed power device called the full function test. These tests represented the culmination of an effort to establish a high energy pulsed power capability based on high explosive pulsed power (HEPP) technology. This involved an extensive computational modeling, engineering, fabrication, and fielding effort. The experiments were highly successful and a new U.S. record for magnetic energy was obtained.
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84.70.+p High-current and high-voltage technology: power systems; power transmission lines and cables

Note: Single-shot continuously time-resolved MeV ultrafast electron diffraction

Renkai Li, Wenhui Huang, Yingchao Du, Lixin Yan, Qiang Du, Jiaru Shi, Jianfei Hua, Huaibi Chen, Taibin Du, Haisheng Xu, and Chuanxiang Tang

Rev. Sci. Instrum. 81, 036110 (2010); http://dx.doi.org/10.1063/1.3361196 (3 pages) | Cited 7 times

Online Publication Date: 30 March 2010

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We have demonstrated single-shot continuously time-resolved MeV ultrafast electron diffraction using a static single crystal gold sample. An MeV high density electron pulse was used to probe the sample and then streaked by an rf deflecting cavity. The single-shot, high quality, streaked diffraction pattern allowed structural information within several picoseconds to be continuously temporally resolved with an ∼ 200 fs resolution. The temporal resolution can be straightforwardly improved to 100 fs by increasing the streaking strength. We foresee that this system would become a powerful tool for ultrafast structural dynamics studies.
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61.05.J- Electron diffraction and scattering
61.66.Bi Elemental solids

Note: Thermal analog to atomic force microscopy force-displacement measurements for nanoscale interfacial contact resistance

Brian D. Iverson, John E. Blendell, and Suresh V. Garimella

Rev. Sci. Instrum. 81, 036111 (2010); http://dx.doi.org/10.1063/1.3361157 (3 pages)

Online Publication Date: 31 March 2010

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Thermal diffusion measurements on polymethylmethacrylate-coated Si substrates using heated atomic force microscopy tips were performed to determine the contact resistance between an organic thin film and Si. The measurement methodology presented demonstrates how the thermal contrast signal obtained during a force-displacement ramp is used to quantify the resistance to heat transfer through an internal interface. The results also delineate the interrogation thickness beyond which thermal diffusion in the organic thin film is not affected appreciably by the underlying substrate.
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73.40.Cg Contact resistance, contact potential
66.30.Xj Thermal diffusivity
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