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Aug 2009

Volume 80, Issue 8, Articles (08xxxx)

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Systematic error of diode thermometer

Predrag S. Iskrenovic

Rev. Sci. Instrum. 80, 084901 (2009); http://dx.doi.org/10.1063/1.3202102 (5 pages)

Online Publication Date: 24 August 2009

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Semiconductor diodes are often used for measuring temperatures. The forward voltage across a diode decreases, approximately linearly, with the increase in temperature. The applied method is mainly the simplest one. A constant direct current flows through the diode, and voltage is measured at diode terminals. The direct current that flows through the diode, putting it into operating mode, heats up the diode. The increase in temperature of the diode-sensor, i.e., the systematic error due to self-heating, depends on the intensity of current predominantly and also on other factors. The results of systematic error measurements due to heating up by the forward-bias current have been presented in this paper. The measurements were made at several diodes over a wide range of bias current intensity.
Show PACS
07.20.Dt Thermometers
47.80.Fg Pressure and temperature measurements
85.30.Kk Junction diodes
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