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Aug 2009

Volume 80, Issue 8, Articles (08xxxx)

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Demonstration of microcantilever array with simultaneous readout using an in-plane photonic transduction method

Weisheng Hu, Ryan Anderson, Yusheng Qian, Jigou Song, Jong Wook Noh, Seunghyun Kim, and Gregory P. Nordin

Rev. Sci. Instrum. 80, 085101 (2009); http://dx.doi.org/10.1063/1.3186735 (7 pages) | Cited 9 times

Online Publication Date: 6 August 2009

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We demonstrate a microcantilever array with an in-plane photonic transduction method for simultaneous readout of each microcantilever. The array is fabricated on a silicon-on-insulator substrate. Rib waveguides in conjunction with a compact waveguide splitter network comprised of trench-based splitters and trench-based bends route light from a single optical input to each microcantilever on the chip. Light propagates down a rib waveguide integrated into the microcantilever and, at the free end of the microcantilever, crosses a small gap. Light is captured in static asymmetric multimode waveguides that terminate in Y-branches, the outputs of which are imaged onto an InGaAs line scan camera. A differential signal for each microcantilever is simultaneously formed from the two outputs of the corresponding Y-branch. We demonstrate that reasonable signal uniformity is obtained with a scaled differential signal for seven out of nine surviving microcantilevers in an array.
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42.82.Et Waveguides, couplers, and arrays
42.79.Gn Optical waveguides and couplers

Method for reducing response time in sensor measurement

Oscar Casas and Francesc I. Rillo

Rev. Sci. Instrum. 80, 085102 (2009); http://dx.doi.org/10.1063/1.3193717 (5 pages)

Online Publication Date: 11 August 2009

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Transients are present in sensor and instrumentation systems. They are caused by energy transference and are typically modeled as first-order systems. If too long, transients may suppose a critical factor for these systems unless they are analyzed (e.g., in terms of consumption). This work presents a new method for estimating the final value of a first-order system transient. Since this problem may be harmful, mainly to autonomous systems, the method equations are composed of simple operations that can be implemented on microcontrollers or similar interfaces with low computational capacity. The experimental results validate the theoretical models of the method and prove that, when the system coexists with disturbances, it is possible to estimate the final value in around 60% of the time we would have to wait until reaching it, in the worst case scenario.
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07.07.Df Sensors (chemical, optical, electrical, movement, gas, etc.); remote sensing
84.30.Bv Circuit theory

Fine calibration of the residual dissipation in a surface forces apparatus using a capacitive sensor

Samuel Leroy, Frédéric Restagno, and Élisabeth Charlaix

Rev. Sci. Instrum. 80, 085103 (2009); http://dx.doi.org/10.1063/1.3187223 (6 pages)

Online Publication Date: 12 August 2009

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The design of a dynamic surface force apparatus using a capacitive sensor has been useful in the past to study the nanorheological behavior of thin liquid films confined between a sphere and a plane. This allows a precise measurement of the hydrodynamical boundary condition of liquids down to some molecular sizes. However for thick liquid films, the viscous force is decreased and the dissipation due to the flow of air in the capacitive sensor becomes of the same order of magnitude than the force due to the liquid flow. In the present paper we present an original technique to characterize this residual force due to the capacitive sensor and we show that a precise subtraction of this force extends the precision of the device to the case of thick liquid films of low viscosity. This correction should be of major importance to extend the capability of surface forces apparatus to measure very large boundary slippage of simple liquids.
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68.15.+e Liquid thin films
07.07.Df Sensors (chemical, optical, electrical, movement, gas, etc.); remote sensing
66.20.-d Viscosity of liquids; diffusive momentum transport
83.50.Lh Slip boundary effects (interfacial and free surface flows)
47.85.Dh Hydrodynamics, hydraulics, hydrostatics

A simple, compact, and rigid piezoelectric step motor with large step size

Qi Wang and Qingyou Lu

Rev. Sci. Instrum. 80, 085104 (2009); http://dx.doi.org/10.1063/1.3197381 (4 pages) | Cited 3 times

Online Publication Date: 14 August 2009

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We present a novel piezoelectric stepper motor featuring high compactness, rigidity, simplicity, and any direction operability. Although tested in room temperature, it is believed to work in low temperatures, owing to its loose operation conditions and large step size. The motor is implemented with a piezoelectric scanner tube that is axially cut into almost two halves and clamp holds a hollow shaft inside at both ends via the spring parts of the shaft. Two driving voltages that singly deform the two halves of the piezotube in one direction and recover simultaneously will move the shaft in the opposite direction, and vice versa.
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07.79.-v Scanning probe microscopes and components
85.50.-n Dielectric, ferroelectric, and piezoelectric devices
84.50.+d Electric motors
06.60.Sx Positioning and alignment; manipulating, remote handling

High-resolution laser lithography system based on two-dimensional acousto-optic deflection

Manuel Koechlin, Gorazd Poberaj, and Peter Günter

Rev. Sci. Instrum. 80, 085105 (2009); http://dx.doi.org/10.1063/1.3202274 (6 pages) | Cited 4 times

Online Publication Date: 19 August 2009

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We present an advanced high-resolution, compact laser lithography system for fast prototyping of complex integrated optics devices comprising microring resonators and photonic crystal structures. Precise and flexible structuring of photoresist patterns is achieved by combing three linear stages (xyz) for sample positioning and a two-dimensional acousto-optical deflector for laser beam steering and intensity control. A continuous wave diode laser operating at a wavelength of 375 nm is used to illuminate all types of photoresists including SU-8. Using a microscope objective with a numerical aperture of 1.40, structure widths of ∼ 200 nm can be obtained. The write-field covered by acousto-optic deflection can be as large as 200×200 μm2 when using an objective with a focal length of 4.5 mm. With a two-step lithography process, gaps as small as 150 nm between adjacent structures have been achieved, yielding superior photoresist masks for microring resonators with coupling ports.
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42.82.Cr Fabrication techniques; lithography, pattern transfer
78.20.hb Piezo-optical, elasto-optical, acousto-optical, and photoelastic effects
85.85.+j Micro- and nano-electromechanical systems (MEMS/NEMS) and devices

Determination of three-dimensional orientations of ferroelectric single crystals by an improved rotating orientation x-ray diffraction method

Fei Li (李飞), Li Jin (靳立), Zhuo Xu (徐卓), and Zhenqi Guo (郭振琪)

Rev. Sci. Instrum. 80, 085106 (2009); http://dx.doi.org/10.1063/1.3204781 (5 pages) | Cited 3 times

Online Publication Date: 19 August 2009

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X-ray diffraction (XRD) techniques are widely used in determining crystallographic orientations. In this paper we describe a two-step method to determine the three-dimensional orientations of ferroelectric single crystals based on an improved rotating orientations XRD method. This method could be readily carried out on standard x-ray laboratory equipment. Taking into account the geometric relationship in crystallography, we obtain an equation to find the expected crystallographic plane and simplify the determining process. The application of this method to LiNbO3 and xPb(Mg1/3Nb2/3)O3–(1−x)PbTiO3 ferroelectric single crystals demonstrates that it is a fast, flexible, and waste-free method for crystallographic orientation. Explanations of the scanning diffraction patterns and evaluation of the determining accuracy are presented. This method is also applicable to other nonferroelectric single crystal systems and would benefit the orientation-related issues.
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77.80.-e Ferroelectricity and antiferroelectricity
61.50.-f Structure of bulk crystals

A uniaxial tension system and its applications in testing of thin films and small components

Wenwang Wu, Xide Li, and Liang Liu

Rev. Sci. Instrum. 80, 085107 (2009); http://dx.doi.org/10.1063/1.3205427 (6 pages)

Online Publication Date: 20 August 2009

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The aim of this investigation is to develop a uniaxial tension system for testing very small samples that allows observation of the gauge section by optical or atomic force microscopy. Major parts of the system consist of a pair of identical piezoelectric actuators, two symmetrical double-cantilevered force sensors, and two symmetrical universal coupling joints. It can accomplish both-end loaded uniaxial tension to produce centrosymmetric deformations of the tested objects in the field of view and can apply tensile loads in the range from 7.8 μN to 15 N to the samples. Sample extensions from submicrometers to 100 μm can be measured with displacement resolution of several tens of nanometers. The system’s performance is demonstrated by tests of a polycrystalline aluminum alloy thin sheet, a mica thin sheet, and a fibril of bamboo.
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81.70.-q Methods of materials testing and analysis
82.45.Mp Thin layers, films, monolayers, membranes
07.79.Lh Atomic force microscopes

Knot undulator to generate linearly polarized photons with low on-axis power density

S. Qiao, Dewei Ma, Donglai Feng, S. Marks, R. Schlueter, S. Prestemon, and Z. Hussain

Rev. Sci. Instrum. 80, 085108 (2009); http://dx.doi.org/10.1063/1.3204452 (4 pages) | Cited 2 times

Online Publication Date: 21 August 2009

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Heat load on beamline optics is a serious obstacle for devices designed to generate pure linearly polarized photons in third generation synchrotron radiation facilities. For permanent magnet undulators, this problem can be overcome by implementing a figure-eight design configuration. As yet there has been no good method to tackle this problem for electromagnetic elliptical undulators. Here, a novel design and operational mode is suggested, which can generate pure linearly polarized photons with very low on-axis heat load. Additionally, the minimum photon energy capability of linearly polarized photons can be significantly extended by this method.
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29.27.Eg Beam handling; beam transport
29.20.dk Synchrotrons
41.60.Ap Synchrotron radiation

Development and performance test of a soft x-ray polarimeter and ellipsometer for complete polarization analysis

Takashi Imazono, Kazuo Sano, Yoji Suzuki, Tetsuya Kawachi, and Masato Koike

Rev. Sci. Instrum. 80, 085109 (2009); http://dx.doi.org/10.1063/1.3204458 (8 pages) | Cited 5 times

Online Publication Date: 21 August 2009

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A new apparatus for polarimetric and ellipsometric measurements based on the rotating-analyzer method in the soft x-ray region has been designed, constructed, and installed in the soft x-ray beamline (BL-11) at the SR Center of Ritsumeikan University, Shiga, Japan. It can realize the optical configurations for the complete polarization analysis by using six independently movable drive shafts. A demonstration of the capabilities of the apparatus has been performed using Mo/Si multilayer polarizers deposited by an ion beam sputtering method. It is for the first time shown that the degree of linear polarization of monochromatized light from the BL-11 is approximately 87% at 92 eV since the beamline has been constructed.
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07.85.-m X- and γ-ray instruments
07.60.Fs Polarimeters and ellipsometers
42.15.Eq Optical system design
42.82.Cr Fabrication techniques; lithography, pattern transfer
81.15.Cd Deposition by sputtering

Friction on the microscale

K. B. Paul and L. Malkinski

Rev. Sci. Instrum. 80, 085110 (2009); http://dx.doi.org/10.1063/1.3212672 (4 pages) | Cited 1 time

Online Publication Date: 31 August 2009

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A new method is presented for measurements of friction of microsized particles on surfaces. Specifically in this work, the particles are alumina with diameters between ≈ 1 and 50 μm and the surfaces are InP, Si, and Cr. Friction is analyzed, its components are determined, and the friction coefficients are estimated from the experimental results. The technique and the specific instrument allow measurements of coefficients of friction for spherical particles with radii as small as 1 μm. For smaller sizes, the instrument needs to be modified by using a more powerful power supply, actuator with extended frequency and amplitude ranges, cooling of the actuator and the power supply, and the related mechanical modifications of the sample holder.
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07.10.-h Mechanical instruments and equipment
46.55.+d Tribology and mechanical contacts
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