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Rev. Sci. Instrum. 80, 073107 (2009); http://dx.doi.org/10.1063/1.3183496 (4 pages)

Submicrometer resolution far field high sensitivity Kerr microscopy for in-plane magnetization detection

C. H. Wang and Z. Yang

Department of Physics, Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong SAR, People's Republic of China

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(Received 6 May 2009; accepted 30 June 2009; published online 22 July 2009)

We report that a far field magneto-optical system designed for detecting the off-plane magnetization in polar configuration can also detect the in-plane magnetization, while preserving the high sensitivity by using symmetric illumination and photoelastic modulation, even though the optical axis of the system is vertical to the sample surface. The spatial resolution can reach 500 nm at 514 nm in wavelength. The in-plane sensitivity can be eliminated by using an aperture to remove the off-axis obliquely incident light generated by the high numerical aperture objective lens that focuses the laser beam onto the sample surface.

© 2009 American Institute of Physics

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KEYWORDS and PACS

PACS

  • 78.20.Ls

    Magneto-optical effects

  • 75.60.Ej

    Magnetization curves, hysteresis, Barkhausen and related effects

  • 78.20.hb

    Piezo-optical, elasto-optical, acousto-optical, and photoelastic effects

  • 42.60.Jf

    Beam characteristics: profile, intensity, and power; spatial pattern formation

  • 75.60.Ch

    Domain walls and domain structure

  • 72.25.-b

    Spin polarized transport

ARTICLE DATA

PUBLICATION DATA

ISSN

0034-6748 (print)  
1089-7623 (online)

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