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Review of Scientific Instruments / Volume 80 / Issue 3 / CHEMISTRY

Rev. Sci. Instrum. 80, 034101 (2009); http://dx.doi.org/10.1063/1.3082016 (7 pages)

Imaging photoelectron photoion coincidence spectroscopy with velocity focusing electron optics

Andras Bodi1, Melanie Johnson1, Thomas Gerber1, Zsolt Gengeliczki2, Bálint Sztáray3, and Tomas Baer4

1Paul Scherrer Institut, Villigen 5232, Switzerland
2Institute of Chemistry, Eötvös Loránd University, Budapest 1117, Hungary
3Department of Chemistry, University of the Pacific, Stockton, California 95211, USA
4Department of Chemistry, University of North Carolina, Chapel Hill, North Carolina 27599, USA

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(Received 9 November 2008; accepted 23 January 2009; published online 3 March 2009)

An imaging photoelectron photoion coincidence spectrometer at the vacuum ultraviolet (VUV) beamline of the Swiss Light Source is presented and a few initial measurements are reported. Monochromatic synchrotron VUV radiation ionizes the cooled or thermal gas-phase sample. Photoelectrons are velocity focused, with better than 1 meV resolution for threshold electrons, and also act as start signal for the ion time-of-flight analysis. The ions are accelerated in a relatively low, 40–80 V cm−1 field, which enables the direct measurement of rate constants in the 103–107 s−1 range. All electron and ion events are recorded in a triggerless multiple-start/multiple-stop setup, which makes it possible to carry out coincidence experiments at >100 kHz event frequencies. As examples, the threshold photoelectron spectrum of the argon dimer and the breakdown diagrams for hydrogen atom loss in room temperature methane and the chlorine atom loss in cold chlorobenzene are shown and discussed.

© 2009 American Institute of Physics

Article Outline

  1. INTRODUCTION
  2. EXPERIMENTAL
    1. Light source
    2. Continuous skimmed molecular beam source
    3. Slim “clockwork” valve
    4. Electron and ion optics
    5. Data acquisition scheme
  3. RESULTS
    1. Threshold photoelectron spectrum of Ar2
    2. H-atom loss from CH4+
    3. Cl-atom loss from C6H5Cl+
  4. CONCLUSIONS

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KEYWORDS and PACS

Keywords

argon, chlorine, electron optics, hydrogen, photoelectron spectroscopy, photoionisation, time of flight spectra, ultraviolet photoelectron spectra

PACS

  • 07.81.+a

    Electron and ion spectrometers

  • 32.80.Fb

    Photoionization of atoms and ions

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.3082016

PUBLICATION DATA

ISSN

0034-6748 (print)  
1089-7623 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

For access to fully linked references, you need to log in.
    R. Stockbauer, J. Chem. Phys. 58, 3800 (1973)JCPSA6000058000009003800000001.

    A. S. Werner and T. Baer, J. Chem. Phys. 62, 2900 (1975)JCPSA6000062000007002900000001.

    B. Sztáray and T. Baer, Rev. Sci. Instrum. 74, 3763 (2003)RSINAK000074000008003763000001.

    K. Norwood and C. Y. Ng, J. Chem. Phys. 93, 6440 (1990)JCPSA6000093000009006440000001.

    D. M. Smith, R. P. Tuckett, K. R. Yoxall, K. Codling, P. A. Hatherly, J. F. M. Aarts, and M. Stankiewicz, J. Chem. Phys. 101, 10559 (1994)JCPSA6000101000012010559000001.

    G. K. Jarvis, K. M. Weitzel, M. Malow, T. Baer, Y. Song, and C. Y. Ng, Rev. Sci. Instrum. 70, 3892 (1999)RSINAK000070000010003892000001.

    X. M. Qian, K. C. Lau, G. Z. He, C. Y. Ng, and M. Hochlaf, J. Chem. Phys. 120, 8476 (2004)JCPSA6000120000018008476000001.

    G. K. Jarvis, R. C. Shiell, J. W. Hepburn, Y. Song, and C. Y. Ng, Rev. Sci. Instrum. 71, 1325 (2000)RSINAK000071000003001325000001.

    A. Bodi, B. Sztáray, T. Baer, M. Johnson, and T. Gerber, Rev. Sci. Instrum. 78, 084102 (2007)RSINAK000078000008084102000001.

    E. E. Chaban and J. E. Reutt-Robey, Rev. Sci. Instrum. 64, 2391 (1993)RSINAK000064000008002391000001.

    J. Küpper, H. Haak, K. Wohlfart, and G. Meijer, Rev. Sci. Instrum. 77, 016106 (2006)RSINAK000077000001016106000001.

    A. T. J. B. Eppink and D. H. Parker, Rev. Sci. Instrum. 68, 3477 (1997)RSINAK000068000009003477000001.

    J. A. Davies, J. E. LeClaire, R. E. Continetti, and C. C. Hayden, J. Chem. Phys. 111, 1 (1999)JCPSA6000111000001000001000001.

    H. F. Offerhaus, C. Nicole, F. Lepine, C. Bordas, F. Rosca-Pruna, and M. J. J. Vrakking, Rev. Sci. Instrum. 72, 3245 (2001)RSINAK000072000008003245000001.

    W. A. Chupka, J. Chem. Phys. 98, 4520 (1993)JCPSA6000098000006004520000001.

    A. Vredenborg, W. G. Roeterdink, and M. H. M. Janssen, Rev. Sci. Instrum. 79, 063108 (2008)RSINAK000079000006063108000001.

    C. Bordas, F. Paulig, H. Helm, and D. L. Huestis, Rev. Sci. Instrum. 67, 2257 (1996)RSINAK000067000006002257000001.

    A. Osterwalder, M. J. Nee, J. Zhou, and D. M. Neumark, J. Chem. Phys. 121, 6317 (2004)JCPSA6000121000013006317000001.

    E. B. Saloman and C. J. Sansonetti, J. Phys. Chem. Ref. Data 33, 1113 (2004)JPCRBU000033000004001113000001.

    E. B. Saloman, J. Phys. Chem. Ref. Data 33, 765 (2004)JPCRBU000033000003000765000001.

    R. Signorell and F. Merkt, J. Chem. Phys. 109, 9762 (1998)JCPSA6000109000022009762000001.

    Y. Y. Youn, C. H. Kwon, J. C. Choe, and M. S. Kim, J. Chem. Phys. 117, 2538 (2002)JCPSA6000117000006002538000001.


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