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Jan 2009

Volume 80, Issue 1, Articles (01xxxx)

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Fourier-transform resonance shear measurement for studying confined liquids

Hiroshi Sakuma and Kazue Kurihara

Rev. Sci. Instrum. 80, 013701 (2009); http://dx.doi.org/10.1063/1.3062862 (4 pages)

Online Publication Date: 8 January 2009

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The resonance shear measurement we recently developed is an efficient tool for investigating the rheological and tribological properties of liquid nanofilms confined between solid surfaces with varying film thicknesses. However, the previously employed resonance shear measurement measured shear responses at various oscillation frequencies for one film thickness (the frequency scanning method), so it required at least several minutes to obtain a reliable resonance curve. The fast Fourier-transform resonance shear method was developed to rapidly acquire the resonance curves. The obtained curves were very similar to those obtained by the frequency scanning method. The time necessary for the FFT method was 2–10 s, much shorter than the time required for the scanning method. This technique is easy to use and extends the applicability of the method to volatile liquids and unstable samples.
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47.57.Qk Rheological aspects
62.10.+s Mechanical properties of liquids
68.15.+e Liquid thin films

Model-free iterative control of repetitive dynamics for high-speed scanning in atomic force microscopy

Yang Li and John Bechhoefer

Rev. Sci. Instrum. 80, 013702 (2009); http://dx.doi.org/10.1063/1.3065093 (5 pages) | Cited 2 times

Online Publication Date: 8 January 2009

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We introduce an algorithm for calculating, offline or in real time and with no explicit system characterization, the feedforward input required for repetitive motions of a system. The algorithm is based on the secant method of numerical analysis and gives accurate motion at frequencies limited only by the signal-to-noise ratio and the actuator power and range. We illustrate the secant-solver algorithm on a stage used for atomic force microscopy.
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07.79.Lh Atomic force microscopes

Design considerations for refractive solid immersion lens: Application to subsurface integrated circuit fault localization using laser induced techniques

S. H. Goh, C. J. R. Sheppard, A. C. T. Quah, C. M. Chua, L. S. Koh, and J. C. H. Phang

Rev. Sci. Instrum. 80, 013703 (2009); http://dx.doi.org/10.1063/1.3070612 (10 pages) | Cited 3 times

Online Publication Date: 21 January 2009

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With fast scaling and advancement of integrated circuit (IC) technology, circuitries have become smaller and denser. New materials and more sophisticated designs have evolved. These changes reduced the effectiveness of conventional laser induced fault localization techniques. Since IC fault localization is the most critical step in failure analysis, there are strong motivations to improve both spatial resolution and sensitivity of such systems to meet the new challenges from advanced technology. Refractive solid immersion lens (RSIL) is well known to enhance the laser spot size which directly affects resolution and sensitivity in back side fault localizations. In practice, it is difficult to operate RSIL at the ideal configurations to obtain the smallest spot resolution. It is necessary to understand the resolution performance at the other design focal planes. Besides resolution, there are also other factors that affect sensitivity in a RSIL enhanced system. This paper identifies and characterizes key RSIL design parameters to optimize RSIL performance on laser induced techniques. We report that the most efficient conditions are achieved close to aplanatic RSIL design to within 20–25 μm (for a 1 mm diameter lens), and the backing objective should be the minimum numerical aperture required for optimum resolution performance. The size of the mechanical clear aperture opening should be large enough (>80%) to exploit the advantage of aplanatic RSIL. RSIL is developed on a laser scanning optical microscope in this work, and a resolution of 0.3 μm (for a wavelength of 1340 nm) was achieved over a range of operating conditions. A quantitative resolution of 0.25 μm is achieved and a pitch structure of 0.4 μm is easily resolvable. Close to 15 times enhancement in laser induced signal is obtained.
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42.82.-m Integrated optics
42.62.-b Laser applications
85.40.Qx Microcircuit quality, noise, performance, and failure analysis
42.15.Eq Optical system design
07.60.Pb Conventional optical microscopes

Low-temperature and high magnetic field dynamic scanning capacitance microscope

A. Baumgartner, M. E. Suddards, and C. J. Mellor

Rev. Sci. Instrum. 80, 013704 (2009); http://dx.doi.org/10.1063/1.3069289 (8 pages) | Cited 1 time

Online Publication Date: 22 January 2009

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We demonstrate a dynamic scanning capacitance microscope (DSCM) that operates at large bandwidths, cryogenic temperatures, and high magnetic fields. The setup is based on a noncontact atomic force microscope (AFM) with a quartz tuning fork sensor for the nonoptical excitation and readout in topography, force, and dissipation measurements. The metallic AFM tip forms part of a rf resonator with a transmission characteristics modulated by the sample properties and the tip-sample capacitance. The tip motion gives rise to a modulation of the capacitance at the frequency of the AFM sensor and its harmonics, which can be recorded simultaneously with the AFM data. We use an intuitive model to describe and analyze the resonator transmission and show that for most experimental conditions it is proportional to the complex tip-sample conductance, which depends on both the tip-sample capacitance and the sample resistivity. We demonstrate the performance of the DSCM on metal disks buried under a polymer layer and we discuss images recorded on a two-dimensional electron gas in the quantum Hall effect regime, i.e. at cryogenic temperatures and in high magnetic fields, where we directly image the formation of compressible stripes at the physical edge of the sample.
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07.79.-v Scanning probe microscopes and components
07.79.Lh Atomic force microscopes

Laser scanning confocal microscope with programmable amplitude, phase, and polarization of the illumination beam

B. R. Boruah and M. A. A. Neil

Rev. Sci. Instrum. 80, 013705 (2009); http://dx.doi.org/10.1063/1.3072663 (8 pages) | Cited 10 times

Online Publication Date: 26 January 2009

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We describe the design and construction of a laser scanning confocal microscope with programmable beam forming optics. The amplitude, phase, and polarization of the laser beam used in the microscope can be controlled in real time with the help of a liquid crystal spatial light modulator, acting as a computer generated hologram, in conjunction with a polarizing beam splitter and two right angled prisms assembly. Two scan mirrors, comprising an on-axis fast moving scan mirror for line scanning and an off-axis slow moving scan mirror for frame scanning, configured in a way to minimize the movement of the scanned beam over the pupil plane of the microscope objective, form the XY scan unit. The confocal system, that incorporates the programmable beam forming unit and the scan unit, has been implemented to image in both reflected and fluorescence light from the specimen. Efficiency of the system to programmably generate custom defined vector beams has been demonstrated by generating a bottle structured focal volume, which in fact is the overlap of two cross polarized beams, that can simultaneously improve both the lateral and axial resolutions if used as the de-excitation beam in a stimulated emission depletion confocal microscope.
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07.60.Pb Conventional optical microscopes
42.79.Kr Display devices, liquid-crystal devices
42.40.My Applications

Multihit two-dimensional charged-particle imaging system with real-time image processing at 1000 frames/s

Takuya Horio and Toshinori Suzuki

Rev. Sci. Instrum. 80, 013706 (2009); http://dx.doi.org/10.1063/1.3062945 (8 pages) | Cited 8 times

Online Publication Date: 30 January 2009

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A high-speed imaging system developed for two-dimensional counting of charged particles is presented. Microchannel plates coupled with a phosphor screen of a short emission lifetime (<1 μs) are used to visualize the two-dimensional positions of charged-particle impacts, and the image on the phosphor screen is captured with a 1 kHz complementary metal oxide semiconductor (CMOS) image sensor (512×512 pixels). A multistage image intensifier consisting of the first and second generation devices was used to compensate for the low sensitivity of CMOS. The centers of gravity (COG) of individual light spots in each image frame are calculated in real time by a field programmable gate array circuit. The performance of this system is tested by time-resolved photoelectron imaging (TR-PEI) of NO using (1+1′) resonance enhanced multiphoton ionization via the A 2Σ+ state with a femtosecond laser operated at 1 kHz. The new system enabled COG detection for more than ten particles in each frame at 1 kHz and achieved an extremely high degree of accuracy in the measurement of photoelectron angular distributions in TR-PEI.
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42.79.Pw Imaging detectors and sensors
42.79.Ls Scanners, image intensifiers, and image converters
42.65.Re Ultrafast processes; optical pulse generation and pulse compression
84.30.Sk Pulse and digital circuits
42.62.Eh Metrological applications; optical frequency synthesizers for precision spectroscopy
42.30.Va Image forming and processing
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