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Rev. Sci. Instrum. 80, 113102 (2009); http://dx.doi.org/10.1063/1.3257676 (6 pages)

Internal frequency conversion extreme ultraviolet interferometer using mutual coherence properties of two high-order-harmonic sources

S. Dobosz1, H. Stabile1, A. Tortora1, P. Monot1, F. Réau1, M. Bougeard1, H. Merdji1, B. Carré1, Ph. Martin1, D. Joyeux2, D. Phalippou2, F. Delmotte2, J. Gautier2, and R. Mercier2

1CEA, IRAMIS, Service des Photons Atomes et Molécules, F-91191 Gif- sur-Yvette, France
2Laboratoire Charles Fabry de l’Institut d’Optique, CNRS et Université Paris Sud, Campus Polytechnique, RD 128, F-91127 Palaiseau cedex, France

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(Received 30 April 2009; accepted 11 October 2009; published online 3 November 2009)

We report on an innovative two-dimensional imaging extreme ultraviolet (XUV) interferometer operating at 32 nm based on the mutual coherence of two laser high order harmonics (HOH) sources, separately generated in gas. We give the first evidence that the two mutually coherent HOH sources can be produced in two independent spatially separated gas jets, allowing for probing centimeter-sized objects. A magnification factor of 10 leads to a micron resolution associated with a subpicosecond temporal resolution. Single shot interferograms with a fringe visibility better than 30% are routinely produced. As a test of the XUV interferometer, we measure a maximum electronic density of 3×1020 cm−3 1.1 ns after the creation of a plasma on aluminum target.

© 2009 American Institute of Physics

Article Outline

  1. INTRODUCTION
  2. EXPERIMENTAL SETUP
  3. TEMPORAL COHERENCE MEASUREMENT
  4. XUV INTERFEROGRAM IN PRESENCE OF PLASMA
  5. CONCLUSION

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KEYWORDS and PACS

PACS

  • 52.70.Kz

    Optical (ultraviolet, visible, infrared) measurements

  • 52.50.Jm

    Plasma production and heating by laser beams (laser-foil, laser-cluster, etc.)

  • 42.65.Ky

    Frequency conversion; harmonic generation, including higher-order harmonic generation

  • 07.60.Ly

    Interferometers

  • 51.70.+f

    Optical and dielectric properties

ARTICLE DATA

PUBLICATION DATA

ISSN

0034-6748 (print)  
1089-7623 (online)

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