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Review of Scientific Instruments / Volume 80 / Issue 11 / OPTICS; ATOMS AND MOLECULES; SPECTROSCOPY; PHOTON DETECTORS

Rev. Sci. Instrum. 80, 113101 (2009); doi:10.1063/1.3250872 (10 pages)

A threshold photoelectron-photoion coincidence spectrometer with double velocity imaging using synchrotron radiation

Xiaofeng Tang1, Xiaoguo Zhou1, Mingli Niu1, Shilin Liu1, Jinda Sun2, Xiaobin Shan2, Fuyi Liu2, and Liusi Sheng2

1Hefei National Laboratory for Physical Sciences at the Microscale, Department of Chemical Physics, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China
2National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei, Anhui 230029, People's Republic of China

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(Received 9 August 2009; accepted 28 September 2009; published online 2 November 2009)

A novel threshold photoelectron-photoion coincidence (TPEPICO) imaging spectrometer at the U14-A beamline of the Hefei National Synchrotron Radiation Laboratory is presented. A set of open electron and ion lenses are utilized to map velocity imaging of photoelectrons and photoions simultaneously, in which a repelling electric field using an extra lens is applied to magnify images of photoelectrons instead of traditional accelerating electric field in order to suppress the contribution of energetic electrons in the threshold photoelectron spectroscopy (TPES) and the mass-selected TPEPICO spectroscopy. The typical energy resolution of TPES is measured to be 9 meV (full width at half maximum), as shown on the 2P1/2 ionization of argon. The measured mass resolving power for the present TPEPICO imaging spectrometer is above 900 of M/ΔM. Subsequently as a benchmark, oxygen molecule is photoionized by monochromatic synchrotron radiation at 20.298 eV and dissociates to an oxygen atomic ion and a neutral oxygen atom, and the translation energy distribution of oxygen atomic ion is measured by the time-sliced imaging based on mass-selected TPEPICO experiment. The kinetic energy resolution of the present ion velocity imaging is better than 3% of ΔE/E.

© 2009 American Institute of Physics

Article Outline

  1. INTRODUCTION
  2. EXPERIMENTAL DESIGN
    1. Light source
    2. Apparatus and molecular beam
    3. VMI for electrons and ions
    4. Single-start/multiple-stop data acquisition mode
  3. EXPERIMENTAL RESULTS AND DISCUSSION
    1. Threshold photoelectron spectra of xenon and argon
    2. Mass spectrum of xenon in TPEPICO experiment
    3. Imaging of argon ions in TPEPICO experiment
    4. TPEPICO imaging investigation on DPI of O2
  4. CONCLUSIONS

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KEYWORDS and PACS

Keywords

electron lenses, mass spectrometers, photoelectron spectroscopy, X-ray spectrometers

PACS

ARTICLE DATA

Permalink
http://link.aip.org/link/doi/10.1063/1.3250872

PUBLICATION DATA

ISSN:

0034-6748 (print)  
1089-7623 (online)

Publisher:

$abstract.society.value is a Member of CrossRef American Institute of Physics

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    T. A. Cool, A. Mcllroy, F. Qi, P. R. Westmoreland, L. Poisson, D. S. Peterka, and M. Ahmed, Rev. Sci. Instrum. 76, 094102 (2005)RSINAK000076000009094102000001.

    J. N. Shu, K. R. Wilson, M. Ahmed, and S. R. Leone, Rev. Sci. Instrum. 77, 043106 (2006)RSINAK000077000004043106000001.

    C. Q. Huang, B. Yang, R. Yang, J. Wang, L. X. Wei, X. B. Shan, L. S. Sheng, Y. W. Zhang, and F. Qi, Rev. Sci. Instrum. 76, 126108 (2005)RSINAK000076000012126108000001.

    A. S. Werner and T. Baer, J. Chem. Phys. 62, 2900 (1975)JCPSA6000062000007002900000001.

    R. Stockbauer, J. Chem. Phys. 58, 3800 (1973)JCPSA6000058000009003800000001.

    M. Richard-Viard, O. Atabek, O. Dutuit, and P. M. Guyon, J. Chem. Phys. 93, 8881 (1990)JCPSA6000093000012008881000001.

    G. K. Jarvis, K. M. Weitzel, M. Malow, T. Baer, Y. Song, and C. Y. Ng, Rev. Sci. Instrum. 70, 3892 (1999)RSINAK000070000010003892000001.

    B. Sztáray and T. Baer, Rev. Sci. Instrum. 74, 3763 (2003)RSINAK000074000008003763000001.

    R. Spohr, P. M. Guyon, W. A. Chupka, and J. Berkowitz, Rev. Sci. Instrum. 42, 1872 (1971)RSINAK000042000012001872000001.

    D. M. Smith, R. P. Tuckett, K. R. Yoxall, K. Codling, P. A. Hatherly, J. F. M. Aarts, and M. Stankiewicz, J. Chem. Phys. 101, 10559 (1994)JCPSA6000101000012010559000001.

    T. Baer, P. M. Guyon, I. Nenner, A. Tabché-Fouhaillé, R. Botter, L. F. A. Ferreira, and T. R. Govers, J. Chem. Phys. 70, 1585 (1979)JCPSA6000070000004001585000001.

    F. Merkt and P. M. Guyon, J. Chem. Phys. 99, 3400 (1993)JCPSA6000099000005003400000001.

    G. K. Jarvis, R. C. Shiell, J. W. Hepburn, Y. Song, and C. Y. Ng, Rev. Sci. Instrum. 71, 1325 (2000)RSINAK000071000003001325000001.

    X. M. Qian, K. C. Lau, G. Z. He, C. Y. Ng, and M. Hochlaf, J. Chem. Phys. 120, 8476 (2004)JCPSA6000120000018008476000001.

    A. T. J. B. Eppink and D. H. Parker, Rev. Sci. Instrum. 68, 3477 (1997)RSINAK000068000009003477000001.

    J. A. Davies, J. E. LeClaire, R. E. Continetti, and C. C. Hayden, J. Chem. Phys. 111, 1 (1999)JCPSA6000111000001000001000001.

    G. A. Garcia, H. Soldi-Lose, and L. Nahon, Rev. Sci. Instrum. 80, 023102 (2009)RSINAK000080000002023102000001.

    A. Bödi, M. Johnson, T. Gerber, Z. Gengeliczki, B. Sztáray, and T. Baer, Rev. Sci. Instrum. 80, 034101 (2009)RSINAK000080000003034101000001.

    R. Vasudev, R. N. Zare, and R. N. Dixon, J. Chem. Phys. 80, 4863 (1984)JCPSA6000080000010004863000001.

    H. Xu, Y. Guo, Q. Li, Y. Shi, S. Liu, and X. Ma, J. Chem. Phys. 121, 3069 (2004)JCPSA6000121000007003069000001.

    H. L. Offerhaus, C. Nicole, F. Lépine, C. Bordas, F. Rosca-Pruna, and M. J. J. Vrakking, Rev. Sci. Instrum. 72, 3245 (2001)RSINAK000072000008003245000001.

    A. Osterwalder, M. J. Nee, J. Zhou, and D. M. Neumark, J. Chem. Phys. 121, 6317 (2004)JCPSA6000121000013006317000001.

    A. Bödi, B. Sztáray, T. Baer, M. Johnson, and T. Gerber, Rev. Sci. Instrum. 78, 084102 (2007)RSINAK000078000008084102000001.

    D. H. Parker and A. T. J. B. Eppink, J. Chem. Phys. 107, 2357 (1997)JCPSA6000107000007002357000001.

    B. Buijsse, W. J. van der Zande, A. T. J. B. Eppink, D. H. Parker, B. R. Lewis, and S. T. Gibson, J. Chem. Phys. 108, 7229 (1998)JCPSA6000108000017007229000001.

    M. Richard-Viard, O. Dutuit, M. Lavollée, T. Govers, P. M. Guyon, and J. Durup, J. Chem. Phys. 82, 4054 (1985)JCPSA6000082000009004054000001.

    M. Evans, S. Stimson, C. Y. Ng, C. -W. Hsu, and G. K. Jarvis, J. Chem. Phys. 110, 315 (1999)JCPSA6000110000001000315000001.

    C. R. Gebhardt, T. P. Rakitzis, P. C. Samartzis, V. Ladopoulos, and T. N. Kitsopoulos, Rev. Sci. Instrum. 72, 3848 (2001)RSINAK000072000010003848000001.

    L. Dinu, A. T. J. B. Eppink, F. Rosca-Pruna, H. L. Offerhaus, W. J. van der Zande, and M. J. J. Vrakking, Rev. Sci. Instrum. 73, 4206 (2002)RSINAK000073000012004206000001.

    V. Dribinski, A. Ossadtchi, V. A. Mandelshtam, and H. Reisler, Rev. Sci. Instrum. 73, 2634 (2002)RSINAK000073000007002634000001.

    D. Townsend, M. P. Minitti, and A. G. Suits, Rev. Sci. Instrum. 74, 2530 (2003)RSINAK000074000004002530000001.

    J. J. Lin, J. Zhou, W. Shiu, and K. Liu, Rev. Sci. Instrum. 74, 2495 (2003)RSINAK000074000004002495000001.

    H. Xu, Y. Guo, Q. Li, S. Liu, X. Ma, J. Liang, and H. Li, J. Chem. Phys. 119, 11609 (2003)JCPSA6000119000022011609000001.

    L. Zhang, Z. Wang, J. Li, F. Wang, S. Liu, S. Yu, and X. Ma, J. Chem. Phys. 118, 9185 (2003)JCPSA6000118000020009185000001.


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