RSI Nameplate
  • Volume/Page
  • Keyword
  • DOI
  • Citation
  • Advanced
   
 
 
 

Flickr Twitter UniPHY Group iResearch App Facebook

Review of Scientific Instruments / Volume 80 / Issue 1 / MICROSCOPY AND IMAGING

Rev. Sci. Instrum. 80, 013702 (2009); http://dx.doi.org/10.1063/1.3065093 (5 pages)

Model-free iterative control of repetitive dynamics for high-speed scanning in atomic force microscopy

Yang Li and John Bechhoefer

Department of Physics, Simon Fraser University, Burnaby, British Columbia V5A 1S6, Canada

View MapView Map

(Received 4 November 2008; accepted 14 December 2008; published online 8 January 2009)

We introduce an algorithm for calculating, offline or in real time and with no explicit system characterization, the feedforward input required for repetitive motions of a system. The algorithm is based on the secant method of numerical analysis and gives accurate motion at frequencies limited only by the signal-to-noise ratio and the actuator power and range. We illustrate the secant-solver algorithm on a stage used for atomic force microscopy.

© 2009 American Institute of Physics

Article Outline

  1. INTRODUCTION
  2. DESCRIPTION OF THE ALGORITHM
    1. Linear solver
    2. Secant solver
  3. APPLICATION TO AFM SCANNERS
  4. CONCLUSION

RELATED DATABASES

To view database links for this article, you need to log in.

KEYWORDS and PACS

Keywords

atomic force microscopy, iterative methods

PACS

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.3065093

PUBLICATION DATA

ISSN

0034-6748 (print)  
1089-7623 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

For access to fully linked references, you need to log in.
    D. Croft and S. Devasia, Rev. Sci. Instrum. 70, 4600 (1999)RSINAK000070000012004600000001.

    Y. Li and J. Bechhoefer, Rev. Sci. Instrum. 78, 013702 (2007)RSINAK000078000001013702000001.

    A. C. Shegaonkar and S. M. Salapaka, Appl. Phys. Lett. 91, 203513 (2007)APPLAB000091000020203513000001.

    D. A. Bristow, J. Dong, A. G. Alleyne, P. Ferriera, and S. Salapaka, Rev. Sci. Instrum. 79, 103704 (2008)RSINAK000079000010103704000001.

    T. Fukuma, Y. Okazaki, N. Kodera, T. Uchihashi, and T. Ando, Appl. Phys. Lett. 92, 243119 (2008)APPLAB000092000024243119000001.


Figures (4)

Access to article objects (figures, tables, multimedia) requires a subscription; log in to view available files.
(Access to supplementary files, where available, is free for this journal.)



Close

Google Calendar

ADVERTISEMENT

Your Recent History Recent History Help

Recently Viewed

  1. Model-free iterative control of repetitive dynamics for high-speed scanning in atomic force microscopy
Go to AIP Home
Copyright © American Institute of Physics
close