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Rev. Sci. Instrum. 79, 093101 (2008); http://dx.doi.org/10.1063/1.2970942 (4 pages)

High resolution flat crystal spectrometer for the Shanghai EBIT

J. Xiao, Y. Gao, X. Zhang, D. Lu, W. Hu, M. Gao, W. Chen, and Y. Zou

EBIT Laboratory, Institute of Modern Physics, Fudan University, Shanghai 200433, People’s Republic of China and The Key Laboratory of Applied Ion Beam Physics (Ministry of Education), Fudan University, Shanghai 200433, People’s Republic of China

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(Received 13 June 2008; accepted 24 July 2008; published online 2 September 2008)

We report on a high resolution flat crystal spectrometer designed for the Shanghai EBIT. Its energy range is from 0.5 to 10 keV. Three crystals can be installed in the vacuum chamber simultaneously, and its effective Bragg angle can be covered from 15° to 75°. A vacuum version charge-coupled device detector is used for detection of photons. An energy resolution under 1 eV was reached in measurements of the 4.5 keV Kα1 line by using an x-ray generator with a titanium anode. The spectrometer was also tested to operate well on the Shanghai EBIT by observing the lines of tungsten at around 3.2 keV.

© 2008 American Institute of Physics

Article Outline

  1. INTRODUCTION
  2. DESCRIPTION OF THE SPECTROMETER
  3. TEST AND PERFORMANCE OF THE SPECTROMETER
    1. Offline test
    2. Online test
  4. CONCLUSION

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KEYWORDS and PACS

PACS

  • 07.81.+a

    Electron and ion spectrometers

ARTICLE DATA

PUBLICATION DATA

ISSN

0034-6748 (print)  
1089-7623 (online)

For access to fully linked references, you need to log in.
    R. E. Marrs, M. A. Levine, D. A. Knapp, and J. R. Henderson, Phys. Rev. Lett. 60, 1715 (1988).

    G. V. Brown, P. Beiersdorfer, H. Chen, J. H. Scofield, K. R. Boyce, R. L. Kelley, C. A. Kilbourne, F. S. Porter, M. F. Gu, S. M. Kahn et al., Phys. Rev. Lett. 96, 253201 (2006).

    P. Beiersdorfer, H. Chen, D. B. Thorn, and E. Trabert, Phys. Rev. Lett. 95, 233003 (2005).

    K. L. Wong, M. J. May, P. Beiersdorfer, K. B. Fournier, B. Wilson, G. V. Brown, P. Springer, P. A. Neill, and C. L. Harris, Phys. Rev. Lett. 90, 235001 (2003).

    P. Beiersdorfer, A. L. Osterheld, J. Scofield, J. R. C. López-Urrutia, and K. Widmann, Phys. Rev. Lett. 80, 3022 (1998).

    P. Beiersdorfer, A. L. Osterheld, V. Decaux, and K. Widmann, Phys. Rev. Lett. 77, 5353 (1996).

    S. W. Epp, J. R. C. López-Urrutia, G. Brenner, V. Maeckel, P. H. Mokler, R. Treusch, M. Kuhlmann, M. V. Yurkov, J. Feldhaus, J. R. Schneider et al., Phys. Rev. Lett. 98, 183001 (2007).

    R. S. Orts, Z. Harman, J. R. C. López-Urrutia, A. N. Artemyev, H. Bruhns, A. J. G. Martínez, U. D. Jentschura, C. H. Keitel, A. Lapierre, V. Mironov et al., Phys. Rev. Lett. 97, 103002 (2006).

    A. Lapierre, U. D. Jentschura, J. R. C. López-Urrutia, J. Braun, G. Brenner, H. Bruhns, D. Fischer, A. J. G. Martínez, Z. Harman, W. R. Johnson et al., Phys. Rev. Lett. 95, 183001 (2005).

    A. J. G. González-Martínez, J. R. C. López-Urrutia, J. Braun, G. Brenner, H. Bruhns, A. Lapierre, V. Mironov, R. S. Orts, H. Tawara, M. Trinczek et al., Phys. Rev. Lett. 94, 203201 (2005).

    I. Draganic, J. R. C. López-Urrutia, R. DuBois, S. Fritzsche, V. M. Shabaev, R. S. Orts, I. I. Tupitsyn, Y. Zou, and J. Ullrich, Phys. Rev. Lett. 91, 183001 (2003).

    P. Beiersdorfer, T. W. Phillips, K. L. Wong, R. E. Marrs, and D. A. Vogel, Phys. Rev. A 46, 3812 (1992).

    V. Decaux, P. Beiersdorfer, S. Elliott, A. Osterheld, and E. Clothiaux, Rev. Sci. Instrum. 66, 758 (1995)RSINAK000066000001000758000001.

    P. Beiersdorfer and B. J. Wargelin, Rev. Sci. Instrum. 65, 13 (1994)RSINAK000065000001000013000001.

    P. Beiersdorfer, J. R. C. López-Urrutia, E. Förster, J. Mahiri, and K. Widmann, Rev. Sci. Instrum. 68, 1077 (1997)RSINAK000068000001001077000001.

    G. V. Brown, P. Beiersdorfer, and K. Widmann, Rev. Sci. Instrum. 70, 280 (1999)RSINAK000070000001000280000001.

    P. Beiersdorfer, G. V. Brown, R. Goddard, and B. J. Wargelin, Rev. Sci. Instrum. 75, 3720 (2004)RSINAK000075000010003720000001.

    D. L. Robbins, H. Chen, P. Beiersdorfer, A. Y. Faenov, T. A. Pikuz, M. J. May, J. Dunn, and A. J. Smith, Rev. Sci. Instrum. 75, 3717 (2004)RSINAK000075000010003717000001.

    N. Nakamura, Rev. Sci. Instrum. 71, 4065 (2000)RSINAK000071000011004065000001.

    J. Braun, H. Bruhns, M. Trinczek, J. R. C. López-Urrutia, and J. Ullrich, Rev. Sci. Instrum. 76, 073105 (2005)RSINAK000076000007073105000001.

    R. D. Deslattes, E. G. Kessler, P. Indelicato, L. de Billy, E. Lindroth, and J. Anton, Rev. Mod. Phys. 75, 35 (2003).

    M. O. Krause and J. H. Oliver, J. Phys. Chem. Ref. Data 8, 329 (1979)JPCRBU000008000002000329000001.


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