• Volume/Page
  • Keyword
  • DOI
  • Citation
  • Advanced
   
 
 
 

Flickr Twitter iResearch App Facebook

Year Range: 
Search Issue | RSS Feeds RSS
Previous Issue Next Issue

Jul 2008

Volume 79, Issue 7, Articles (07xxxx)

Issue Cover Spotlight Figure

Rev. Sci. Instrum. 79, 071101 (2008); http://dx.doi.org/10.1063/1.2957649 (11 pages)

S. O. Reza Moheimani

Two-sensor-based feedback control structure for fast and accurate operation of a piezoelectric tube scanner.

back to top
RSS Feeds

Label-free, all-electrical, in situ human epidermal growth receptor 2 detection

Joseph A. Capobianco, Wan Y. Shih, Qing-An Yuan, Gregory P. Adams, and Wei-Heng Shih

Rev. Sci. Instrum. 79, 076101 (2008); http://dx.doi.org/10.1063/1.2949831 (3 pages) | Cited 6 times

Online Publication Date: 1 July 2008

Full Text: Read Online (HTML) | Download PDF

Show Abstract
Using 3-mercaptopropyltrimethoxysilane (MPS)-coated (PbMg1/3Nb2/3O3)0.63–(PbTiO3)0.37 (PMN-PT)/tin and lead zirconate titanate/glass piezoelectric microcantilever sensors (PEMSs) with single-chain variable fragment (scFv) immobilized on the MPS surface, we have demonstrated real-time, label-free detection of human epidermal growth factor receptor 2 (Her2) in a background of 1 mg/ml bovine serum albumin. Coupled with a scFv with a KD of 3.4×10−8M, the MPS-insulated PMN-PT/tin PEMS 560 μm long and 720 μm wide exhibited a Her2 concentration sensitivity of 5 ng/ml in a background of 1 mg/ml BSA.
Show PACS
07.07.Df Sensors (chemical, optical, electrical, movement, gas, etc.); remote sensing
07.10.Cm Micromechanical devices and systems
85.85.+j Micro- and nano-electromechanical systems (MEMS/NEMS) and devices
85.50.-n Dielectric, ferroelectric, and piezoelectric devices
87.17.Ee Growth and division

Microfluidic on chip viscometers

J. Chevalier and F. Ayela

Rev. Sci. Instrum. 79, 076102 (2008); http://dx.doi.org/10.1063/1.2940219 (3 pages) | Cited 10 times

Online Publication Date: 2 July 2008

Full Text: Read Online (HTML) | Download PDF

Show Abstract
We present the design and the process of fabrication of micromachined capillary on chip rheometers which have performed wall shear stress and shear rate measurements on silicon oil and ethanol-based nanofluids. The originality of these devices comes from the fact that local pressure drop measurements are performed inside the microchannels. Thus, the advantage over existing microviscometers is that they can be used with the fluid under test alone; no reference fluid nor posttreatment of the data are needed. Each on chip viscometer consists of anodically bonded silicon-Pyrex derivative microchannels equipped with local probes. The anodic bonding allows to reach relatively high pressure levels (up to ≈ 10 bars) in the channels, and a broad range of shear stress and shear rate values is attainable. Dielectrophoretic and electrorheological effects can be highlighted by employing alternate microstripe electrodes patterned onto the inner side of the Pyrex wall.
Show PACS
07.10.Cm Micromechanical devices and systems
47.85.Np Fluidics
47.80.-v Instrumentation and measurement methods in fluid dynamics
47.60.Dx Flows in ducts and channels
47.55.nb Capillary and thermocapillary flows
47.65.Gx Electrorheological fluids

Cryogenic gas loading in a Mao–Bell-type diamond anvil cell for high pressure-high temperature investigations

M. Sekar, N. R. Sanjay Kumar, P. Ch. Sahu, N. V. Chandra Shekar, and N. Subramanian

Rev. Sci. Instrum. 79, 076103 (2008); http://dx.doi.org/10.1063/1.2953098 (3 pages) | Cited 2 times

Online Publication Date: 3 July 2008

Full Text: Read Online (HTML) | Download PDF

Show Abstract
A simple system for loading argon fluid at cryogenic temperatures in a Mao–Bell-type diamond anvil cell (DAC) has been developed. It is done in a two step process in which the piston-cylinder assembly alone is submerged in the cryogenic chamber for trapping the liquefied inert gas. Liquid nitrogen is used for condensing the argon gas. This system is now being efficiently used for loading liquid argon in the DAC for high pressure–high temperature experiments. The success rate of trapping liquefied argon in the sample chamber is about 75%. The performance of the gas loading system is successfully tested by carrying out direct conversion of pyrolitic graphite to diamond under high pressure-high temperature using laser heated DAC facility.
Show PACS
07.20.Mc Cryogenics; refrigerators, low-temperature detectors, and other low-temperature equipment
07.35.+k High-pressure apparatus; shock tubes; diamond anvil cells
42.62.-b Laser applications
07.20.Ka High-temperature instrumentation; pyrometers

Prediction of the resonant frequency of piezoelectric tube scanners through three-dimensional finite element modeling of a tube assembly

S. Abdolali Zareian Jahromi, Mark Salomons, Qiao Sun, and Robert A. Wolkow

Rev. Sci. Instrum. 79, 076104 (2008); http://dx.doi.org/10.1063/1.2927191 (3 pages) | Cited 6 times

Online Publication Date: 15 July 2008

Full Text: Read Online (HTML) | Download PDF

Show Abstract
In this paper, we study the resonant behavior of a piezoelectric tube scanner used in scanning probe microscopes. In particular, we use a finite element model to allow the inclusion of boundary effects, i.e., nonrigid bonding layers and elastic tip holder, on the dynamic response of the scanner. We show that although existing analytical models provide a good estimation of the axial resonant frequency, their predictions of the first bending resonance may have up to a 100% error. In addition, a simple procedure is proposed that combines some precalculated factors to predict the lowest resonant frequency for a wide range of typical scanner dimensions. An experiment is carried out to illustrate the procedure and validate the prediction.
Show PACS
07.79.-v Scanning probe microscopes and components
02.70.Dh Finite-element and Galerkin methods
85.50.-n Dielectric, ferroelectric, and piezoelectric devices

A system for supplying constant electrical power for postprocessing tin-doped indium oxide films

J. Bertinshaw, L. Kirkup, M. Phillips, and F. Placido

Rev. Sci. Instrum. 79, 076105 (2008); http://dx.doi.org/10.1063/1.2956976 (3 pages)

Online Publication Date: 17 July 2008

Full Text: Read Online (HTML) | Download PDF

Show Abstract
Annealing tin doped indium oxide (ITO) thin films by self-heating shows potential for reducing the crystallization temperature required to optimize the optical and electrical properties of the films. It also shows promise as a cost effective method of studying the heat treatment process in situ. A computer based solution was developed to allow for a precise control over the annealing process. To anneal at a fixed temperature, a feedback loop senses changes in the resistance of the sample and adjusts the current across the load accordingly to ensure constant delivery of power to an ITO film.
Show PACS
81.40.Gh Other heat and thermomechanical treatments

A hyperthermal energy ion beamline for probing hot electron chemistry at surfaces

M. P. Ray, R. E. Lake, S. A. Moody, V. Magadala, and C. E. Sosolik

Rev. Sci. Instrum. 79, 076106 (2008); http://dx.doi.org/10.1063/1.2960559 (3 pages) | Cited 4 times

Online Publication Date: 25 July 2008

Full Text: Read Online (HTML) | Download PDF

Show Abstract
An ultrahigh vacuum ion beamline and chamber have been assembled to produce hyperthermal (<400 eV) energy ions for studying hot electron chemistry at surfaces. The specific design requirements for this modified instrument were chosen to enable the exposure of a metal-oxide-semiconductor (MOS) device to monoenergtic, well-collimated beams of alkali ions while monitoring both the scattered beam flux and the device characteristics. Our goal is to explore the role that hot electrons injected toward the MOS device surface play in the neutralization of scattered ions. To illustrate the functionality of our system, we present energy-resolved spectra for Na+, K+, and Cs+ ions scattered from the surface of a Ag(001) single crystal for a range of incident energies. In addition, we show MOS device current-voltage characteristics measured in situ in a new rapid-turnaround load lock and sample translation stage.
Show PACS
85.30.De Semiconductor-device characterization, design, and modeling
85.30.Tv Field effect devices
84.37.+q Measurements in electric variables (including voltage, current, resistance, capacitance, inductance, impedance, and admittance, etc.)
79.20.Rf Atomic, molecular, and ion beam impact and interactions with surfaces

A miniature effusion cell for the vacuum deposition of organic solids with low vapor pressures in surface science studies

Jun Yoshinobu, Kozo Mukai, and Tetsuo Katayama

Rev. Sci. Instrum. 79, 076107 (2008); http://dx.doi.org/10.1063/1.2960562 (2 pages) | Cited 2 times

Online Publication Date: 25 July 2008

Full Text: Read Online (HTML) | Download PDF

Show Abstract
A miniature effusion cell for the vacuum deposition of volatile organic solids with low vapor pressures has been fabricated and used in surface science studies. The effusion cell is designed to operate at up to 200 °C under ultrahigh vacuum (UHV) conditions. The size of this cell is so small that it is attached to the top of a transfer rod and can be introduced from a subchamber into a main UHV chamber (retrievable). In addition, the small heat capacity of this cell means rapid heating and cooling rates. The advantages of this evaporator are its simplicity of design and ease of fabrication, assembly, and operation.
Show PACS
81.15.-z Methods of deposition of films and coatings; film growth and epitaxy
68.55.am Polymers and organics
Close
Google Calendar
ADVERTISEMENT

close