Invited Article: VEDA: A web-based virtual environment for dynamic atomic force microscopy

Melcher, John; Hu, Shuiqing; Raman, Arvind

doi:doi:10.1063/1.2938864

Volume/Page
Keyword
DOI
Citation
Advanced

Volume: Page/Article:

Search Content Type

article doi:

Citation:

Direct measurement of beam size in a spectroscopic ellipsometry setup

Spectroscopic ellipsometry signals used in thin film analysis are dependent on the beam probe size. In this work, we report a technique to determine the beam size that uses the existing detection facilities in a spectroscopic ellipsometry setup without the need to rearrange the optical components. The intensity signal recorded with the technique comprises a coupled boundary diffraction and knife edge wave that can be isolated using nonlinear fitting. This then permitted an accurate measurement ...

We describe here the theory and applications of virtual environment dynamic atomic force microscopy (VEDA), a suite of state-of-the-art simulation tools deployed on nanoHUB (www.nanohub.org) for the accurate simulation of tip motion in dynamic atomic force microscopy (dAFM) over organic and inorganic samples. VEDA takes advantage of nanoHUB’s cyberinfrastructure to run high-fidelity dAFM tip dynamics computations on local clusters and the teragrid. Consequently, these tools are freely accessible and the dAFM simulations are run using standard web-based browsers without requiring additional software. A wide range of issues in dAFM ranging from optimal probe choice, probe stability, and tip-sample interaction forces, power dissipation, to material property extraction and scanning dynamics over hetereogeneous samples can be addressed.

Article Outline

INTRODUCTION
MODELING
1. Tip-sample interaction forces
2. Cantilever dynamics
3. Lock-in amplifier and controller models
4. Tip-sample convolution
5. Numerical integration
OVERVIEW
1. Graphical user interface
2. Dynamic approach curves tool
3. Amplitude modulated scanning tool
EXAMPLE SIMULATIONS
1. Attractive and repulsive regimes of oscillation
2. Viscoelastic dissipation identification
3. Q -control simulations
4. Material properties in heterogeneous samples
5. Strong and weak controller parameters
SUPPORTING MATERIALS
UPCOMING FEATURES AND CONCLUSIONS

RELATED DATABASES

To view database links for this article, you need to log in.

KEYWORDS and PACS

Keywords

atomic force microscopy, digital simulation, groupware, Internet, physics computing, probes

PACS

07.79.Lh

Atomic force microscopes
07.05.-t

Computers in experimental physics

ARTICLE DATA

Digital Object Identifier

http://dx.doi.org/10.1063/1.2938864

PUBLICATION DATA

ISSN

0034-6748 (print)

1089-7623 (online)

Publisher

$abstract.society.value is a Member of CrossRef

American Institute of Physics

For access to citing articles, you need to log in.

Figures (10) Tables (5)

Access to article objects (figures, tables, multimedia) requires a subscription; log in to view available files.
(Access to supplementary files, where available, is free for this journal.)