• Volume/Page
  • Keyword
  • DOI
  • Citation
  • Advanced
   
 
 
 

Flickr Twitter UniPHY Group iResearch App Facebook

Rev. Sci. Instrum. 79, 041101 (2008); doi:10.1063/1.2908445 (29 pages)

Invited Review Article: Microwave spectroscopy based on scanning thermal microscopy: Resolution in the nanometer range

Ralf Meckenstock

AG Farle, Fachbereich Physik and Center for Nanointegration (CeNIDE), Universität Duisburg-Essen, Duisburg 47048, Germany

View MapView Map

(Received 18 June 2007; accepted 17 December 2007; published online 24 April 2008)

Scanning thermal microscope-detected ferromagnetic resonance (SThM-FMR) combines a thermal near-field microscope with a FMR spectrometer and detects the thermal response due to resonant microwave absorption by measuring the resistivity change in the thermal nanoprobe. The advantage of this technique is to provide imaging capabilities at fixed resonance conditions as well as local microwave spectroscopy at the nanoscale. A technique that uses the same setup but detects the thermoelastic response of the sample is the scanning thermoelastic microscope-detected FMR (SThEM-FMR). This latter technique is advantageous when FMR spectra of single nanostructures have to be recorded at a fixed position. The experimental setups and the signal generation processes of SThM/SThEM-FMR are described in detail. With the SThM-FMR setups a temperature resolution of 1 mK and a local resolution of 30 nm are actually achieved. With SThEM-FMR the obtained local resolution is 10 nm. The detection limits of both techniques can be as low as 106 spins. To demonstrate the potential of these new techniques SThM/SThEM-FMR investigations of local magnetic anisotropies, magnetization dynamics of single nanodots and inhomogeneous FMR excitations due to finite size effects are presented. Simultaneously, information on the magnetic parameters, the topography, and the thermal properties is provided. To describe the further potential of this recently developed SThM-FMR technique, combined magnetoresistance and FMR investigations are presented and an outlook on possible future applications is given.

© 2008 American Institute of Physics

Article Outline

  1. INTRODUCTION
    1. Motivation for dynamic magnetic characterization at nanoscale
    2. Outline
  2. SCANNING NEAR-FIELD THERMAL MICROSCOPY AND INVESTIGATED THERMAL PARAMETERS
    1. Theory for thermal wave microscopy
    2. Experimental techniques of thermal wave microscopy
  3. BASICS OF FERROMAGNETIC RESONANCE
  4. DETECTION OF MICROWAVE ABSORPTION BY SCANNING THERMAL MICROSCOPY (METHODOLOGY)
    1. Basic setup joining SThM and FMR
    2. Setup based on conventional AFM for high imaging quality
    3. Setup based on self-built AFM/STM for local FMR spectroscopy
    4. SThEM-FMR realized by STM detection
  5. INVESTIGATION OF FERROMAGNETIC RESONANCE EXCITATIONS IN SINGLE NANOSTRUCTURES
    1. Local detection of FMR spectra in single Fe nanostructures by the active thermal modulation technique TM-FMR
      1. Local magnetic anisotropy changes in an epitaxial Fe mesa structure correlated with the nanotailored substrate structure deduced by PM-FMR
      2. Lateral correlation of oxidation stages of an epitaxial Fe film deduced by AFM supported TM-FMR
    2. Magnetization dynamics of single Ni nanodots measured by SThEM-FMR
    3. Simultaneous local detection of magnetic anisotropies and magnetoresistance in Ni nanowires
    4. Local influences of orientation and stray fields of Py lattices on the FMR of a single Py stripe
    5. Nano scaled inhomogeneous FMR excitation in a Co stripe based on finite size effects
  6. OTHER TECHNIQUES FOR LOCALLY RESOLVED DYNAMIC MAGNETIC MEASUREMENTS
    1. Photothermally modulated (PM) FMR
    2. Brillouin light scattering (BLS)
    3. Time-resolved magneto-optical Kerr effect (TR-MOKE)
    4. X-ray magnetic circular dichroism (XMCD)
    5. Magnetic force resonance microscopy (MFRM)
    6. Near-field microwave spectroscopy
    7. Spin-polarized scanning tunnel microscopy (SP-STM)
  7. CONCLUSION AND OUTLOOK
    1. Conclusion
    2. Outlook

EDITORIALLY RELATED

  1. Perspective: Local ferromagnetic resonance measurement techniques: “Invited Review Article: Microwave spectroscopy based on scanning thermal microscopy: Resolution in the nanometer range” [Rev. Sci. Instrum. 79, 041101 (2008)]
    Nan Mo et al.
    Rev. Sci. Instrum. 79, 040901 (2008)RSINAK000079000004040901000001

RELATED DATABASES

To view database links for this article, you need to log in.

KEYWORDS and PACS

PACS

  • 07.57.Pt

    Submillimeter wave, microwave and radiowave spectrometers; magnetic resonance spectrometers, auxiliary equipment, and techniques

  • 07.57.Kp

    Bolometers; infrared, submillimeter wave, microwave, and radiowave receivers and detectors

  • 07.79.Fc

    Near-field scanning optical microscopes

  • 76.50.+g

    Ferromagnetic, antiferromagnetic, and ferrimagnetic resonances; spin-wave resonance

  • 75.30.Gw

    Magnetic anisotropy

  • 81.40.Jj

    Elasticity and anelasticity, stress-strain relations

PUBLICATION DATA

ISSN:

0034-6748 (print)  
1089-7623 (online)

For access to fully linked references, you need to log in.
    Overview about magnetic random access memory: http://www.mram-info.com

    G. Binnig, C. F. Quate, and C. Gerber, Phys. Rev. Lett. 56, 930 (1986).

    D. Dietzel, B. K. Bein, and J. Pelzl, J. Appl. Phys. 93, 9043 (2003)JAPIAU000093000011009043000001.

    A. Majumdar, J. P. Carrejo, and J. Lai, Appl. Phys. Lett. 62, 2501 (1993)APPLAB000062000020002501000001.

    R. Meckenstock, M. V. Rastei, and J. P. Bucher, J. Appl. Phys. 95, 6753 (2004)JAPIAU000095000011006753000001.

    J. Varesi and A. Majumdar, Appl. Phys. Lett. 72, 37 (1998)APPLAB000072000001000037000001.

    J. H. van Vleck, Phys. Rev. 52, 1178 (1937).

    R. I. Joseph and E. Schlömann, J. Appl. Phys. 36, 1579 (1965)JAPIAU000036000005001579000001.

    J. C. Slater, Rev. Mod. Phys. 18, 441 (1946).

    R. Meckenstock and J. Pelzl, J. Appl. Phys. 81, 5259 (1997)JAPIAU000081000008005259000001.

    L. Ruppel, G. Witte, Ch. Wöll, T. Last, S. F. Fischer, and U. Kunze, Phys. Rev. B 66, 245307 (2002).

    Z. Frait and B. Heinrich, J. Appl. Phys. 35, 904 (1964)JAPIAU000035000003000904000001.

    J. Lindner, K. Lenz, E. Kosubek, K. Baberschke, D. Spoddig, R. Meckenstock, J. Pelzl, Z. Frait, and D. L. Mills, Phys. Rev. B 68, 060102 (2003).

    M. H. Seavey Jr., J. Appl. Phys. 31, S216 (1960)JAPIAU00003100000500S216000001.

    A. O. Adeyeye, R. P. Cowburn, and M. E. Welland, J. Appl. Phys. 87, 299 (2000)JAPIAU000087000001000299000001.

    A. Nait Abit and J. P. Bucher, Appl. Phys. Lett. 82, 430 (2003)APPLAB000082000003000430000001.

    C. Kittel, Phys. Rev. 73, 155 (1948).

    P. M. Levy and S. Zhang, Phys. Rev. Lett. 79, 5110 (1997).

    R. Meckenstock, A. Butko, I. Barsukov, D. Spoddig, O. Posth, and J. Lindner, Appl. Phys. Lett. 91, 142507 (2007)APPLAB000091000014142507000001.

    B. T. Rosner and D. W. van der Weide, Rev. Sci. Instrum. 73, 2505 (2002)RSINAK000073000007002505000001.

    R. Meckenstock, M. Möller, and D. Spoddig, Appl. Phys. Lett. 86, 112506 (2005)APPLAB000086000011112506000001.

    M. Möller, D. Spoddig, and R. Meckenstock, J. Appl. Phys. 99, 08J310 (2006)JAPIAU00009900000808J310000001.

    D. A. Arena, E. Vescovo, C.-C. Kao, Y. Guan, and W. E. Bailey, J. Appl. Phys. 101, 09C109 (2007)JAPIAU00010100000909C109000001.

    J. A. Sidles, J. L. Bruland, D. Rugar, O. Züger, S. Hoen, and C. S. Yanmoni, Rev. Mod. Phys. 67, 249 (1995).

    Z. Zang, P. C. Hammel, M. Midzor, M. L. Roukes, and J. R. Childress, Appl. Phys. Lett. 73, 2036 (1998)APPLAB000073000014002036000001.

    S.-H. Chao, W. M. Dougherty, J. L. Garbini, and J. A. Sidles, Rev. Sci. Instrum. 75, 1175 (2004)RSINAK000075000005001175000001.

    A. Volodin, D. Buntinx, S. Brems, and C. Van Haesendonck, Appl. Phys. Lett. 85, 5935 (2004)APPLAB000085000024005935000001.


For access to citing articles, you need to log in.


Figures (41) Tables (1)

Access to article objects (figures, tables, multimedia) requires a subscription; log in to view available files.
(Access to supplementary files, where available, is free for this journal.)

Access to article objects (figures, tables, multimedia) requires a subscription; log in to view available files.
(Access to supplementary files, where available, is free for this journal.)



Close
Google Calendar
ADVERTISEMENT

close