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Review of Scientific Instruments / Volume 79 / Issue 4 / PERSPECTIVE

Rev. Sci. Instrum. 79, 040901 (2008); http://dx.doi.org/10.1063/1.2911921 (2 pages)

Perspective: Local ferromagnetic resonance measurement techniques: “Invited Review Article: Microwave spectroscopy based on scanning thermal microscopy: Resolution in the nanometer range” [Rev. Sci. Instrum. 79, 041101 (2008)]

Nan Mo and Carl E. Patton

Department of Physics, Colorado State University, Fort Collins, Colorado 80523, USA

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(Received 17 March 2008; accepted 31 March 2008; published online 24 April 2008)

© 2008 American Institute of Physics

EDITORIALLY RELATED

  1. Invited Review Article: Microwave spectroscopy based on scanning thermal microscopy: Resolution in the nanometer range
    Ralf Meckenstock
    Rev. Sci. Instrum. 79, 041101 (2008)RSINAK000079000004041101000001

RELATED DATABASES

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KEYWORDS and PACS

Keywords

atomic force microscopy, ferromagnetic materials, ferromagnetic resonance, magnetic thin films, microcavities, microwave spectra, nanostructured materials, paramagnetic resonance

PACS

  • 76.50.+g

    Ferromagnetic, antiferromagnetic, and ferrimagnetic resonances; spin-wave resonance

  • 78.70.Gq

    Microwave and radio-frequency interactions

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.2911921

PUBLICATION DATA

ISSN

0034-6748 (print)  
1089-7623 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

For access to fully linked references, you need to log in.
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    R. Meckenstock, D. Spodding, D. Dietzel, and J. Pelzl, Rev. Sci. Instrum. 74, 789 (2003)RSINAK000074000001000789000001;, R. Meckenstock, I. Barsukov, C. Bircan, A. Remhoff, D. Dietzel, and D. Spoddig, J. Appl. Phys. 99, 08C706 (2006)JAPIAU00009900000808C706000001;, R. Meckenstock, I. Barsokuv, O. Posth, J. Lindner, A. Butko, and D. Spoddig, Appl. Phys. Lett. 91, 142507 (2007)APPLAB000091000014142507000001.

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