• Volume/Page
  • Keyword
  • DOI
  • Citation
  • Advanced
   
 
 
 

Flickr Twitter iResearch App

You are not logged in Access to this article requires a subscription or AIP Article Pack, or rent it for . Log In

Review of Scientific Instruments / Browse Journal / Volume 79 / Issue 10 / CONDENSED MATTER; MATERIALS

Rev. Sci. Instrum. 79, 103901 (2008); doi:10.1063/1.2981693 (6 pages)

Integrated setup for the fabrication and measurement of magnetoresistive nanoconstrictions in ultrahigh vacuum

Daniel Stickler, Robert Frömter, Wei Li, André Kobs, and Hans Peter Oepen

Institut für Angewandte Physik, Universität Hamburg, Jungiusstr. 11, 20355 Hamburg, Germany Map This map

(Received 5 June 2008; accepted 24 August 2008; published online 3 October 2008)

A UHV instrument is presented for in situ fabrication of nanostructures and in situ investigation of their magnetoresistance. Nanostructures of diverse shape and size are created from thin films utilizing a focused ion beam. The magnetic nanostructures are contacted via a micromanipulator, which makes it possible to address the individual structures. The system is additionally equipped with a scanning electron microscope column, which is used for damage-free navigation and control of the structuring and contacting. First magnetoresistance measurements of structures carved into a Permalloy film demonstrate the high sensitivity and the flexibility of the new setup.

© 2008 American Institute of Physics

RELATED DATABASES

To view database links for this article, you need to log in.

KEYWORDS and PACS

Keywords

focused ion beam technology, magnetic thin films, magnetoresistance, micromanipulators, nanostructured materials, nanotechnology, Permalloy, scanning electron microscopes, vacuum apparatus

PACS

  • 81.16.Ta

    Atom manipulation

  • 75.50.Tt

    Fine-particle systems; nanocrystalline materials

  • 07.78.+s

    Electron, positron, and ion microscopes; electron diffractometers

  • 85.85.+j

    Micro- and nano-electromechanical systems (MEMS/NEMS) and devices

  • 07.30.-t

    Vacuum apparatus

  • 73.50.Jt

    Galvanomagnetic and other magnetotransport effects (including thermomagnetic effects)

ARTICLE DATA

Permalink
http://link.aip.org/link/RSINAK/v79/i10/p103901/s1

PUBLICATION DATA

ISSN:

0034-6748 (print)  
1089-7623 (online)

Publisher:

$abstract.society.value is a Member of CrossRef American Institute of Physics

For access to fully linked references, you need to log in.
  1. C. Chappert, A. Fert, and F. N. Van Dau, Nat. Mater. 6, 813 (2007).
  2. H. Coufal, L. Dhar, and C. D. Mee, MRS Bull. 31, 294 (2006).
  3. C. H. Marrows, Adv. Phys. 54, 585 (2005).
  4. S. A. Wolf, D. D. Awschalom, R. A. Buhrman, J. M. Daughton, S. von Molnar, M. L. Roukes, A. Y. Chtchelkanova, and D. M. Treger, Science 294, 1488 (2001).
  5. G. A. Prinz, Science 282, 1660 (1998).
  6. A. D. Kent, J. Yu, U. R. Rüdiger, and S. S. P. Parkin, J. Phys.: Condens. Matter 13, R461 (2001).
  7. C. Hassel, M. Brands, F. Y. Lo, A. D. Wieck, and G. Dumpich, Phys. Rev. Lett. 97, 226805 (2006).
  8. K. I. Bolotin, F. Kuemmeth, A. N. Pasupathy, and D. C. Ralph, Nano Lett. 6, 123 (2006).
  9. U. Ebels, A. Radulescu, Y. Henry, L. Piraux, and K. Ounadjela, Phys. Rev. Lett. 84, 983 (2000).
  10. C. A. Volkert and A. M. Minor, MRS Bull. 32, 389 (2007).
  11. J. Orloff and M. Utlaut, High Resolution Focused Ion Beams: FIB and its Applications (Kluwer, Dordrecht, 2002).
  12. J. Orloff, Rev. Sci. Instrum. 64, 1105 (1993)RSINAK000064000005001105000001.
  13. L. A. Giannuzzi and F. A. Stevie, Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques, and Practice (Springer, Berlin, 2005).
  14. S. Khizroev and D. Litvinov, Nanotechnology 15, R7 (2004).
  15. D. Morecroft, J. L. Prieto, C. W. Leung, G. Burnell, M. G. Blamire, and D. B. Jardine, J. Appl. Phys. 91, 8575 (2002)JAPIAU000091000010008575000001.
  16. Y. Ohsawa, J. Magn. Magn. Mater. 287, 491 (2005).
  17. T. Ono, H. Miyajima, K. Shigeto, K. Mibu, N. Hosoito, and T. Shinjo, Science 284, 468 (1999).
  18. M. Brands and G. Dumpich, J. Appl. Phys. 98, 014309 (2005)JAPIAU000098000001014309000001.
  19. M. Kläui, C. A. F. Vaz, J. A. C. Bland, W. Wernsdorfer, G. Faini, E. Cambril, L. J. Heyderman, F. Nolting, and U. Rüdiger, Phys. Rev. Lett. 94, 106601 (2005).
  20. U. Ruediger, J. Yu, S. Zhang, A. D. Kent, and S. S. P. Parkin, Phys. Rev. Lett. 80, 5639 (1998).
  21. U. Rüdiger, J. Yu, L. Thomas, S. S. P. Parkin, and A. D. Kent, Phys. Rev. B 59, 11914 (1999).
  22. C. Hassel, F. M. Römer, R. Meckenstock, G. Dumpich, and J. Linder, Phys. Rev. B 77, 224439 (2008).
  23. CANION 31 Plus, Orsay Physics, www.orsayphysics.com
  24. Stripped column from a JAMP-30 Auger-Microprobe, JEOL Ltd., www.jeol.com
  25. AP-81030, JEOL Ltd.
  26. ELPHY Quantum, Raith GmbH, www.raith.com.
  27. MM3A-EM UHV, kleindiek nanotechnik, www.nanotechnik.com.
  28. L. M. Peng, Q. Chen, X. L. Liang, S. Gao, J. Y. Wang, S. Kleindiek, and S. W. Tai, Micron 35, 495 (2004).
  29. S. Hasegawa, N. Sato, I. Shiraki, C. L. Petersen, P. Bøggild, T. M. Hansen, T. Nagao, and F. Grey, Jpn. J. Appl. Phys., Part 1 39, 3815 (2000).
  30. Models 6221/2182A Delta Mode system, Keithley Instruments Inc., www.keithley.com.
  31. K. Shigeto, T. Shinjo, and T. Ono, Appl. Phys. Lett. 75, 2815 (1999)APPLAB000075000018002815000001.
  32. R. P. Cowburn, D. A. Allwood, G. Xiong, and M. D. Cooke, J. Appl. Phys. 91, 6949 (2002)JAPIAU000091000010006949000001.
  33. M. Brands and G. Dumpich, J. Phys.: Condens. Matter 38, 822 (2005).
  34. T. R. McGuire and R. I. Potter, IEEE Trans. Magn. 11, 1018 (1975).
  35. W. Y. Lee, M. F. Toney, P. Tameerug, E. Allen, and D. Mauri, J. Appl. Phys. 87, 6992 (2000)JAPIAU000087000009006992000001.
  36. A. Yamaguchi, T. Ono, S. Nasu, K. Miyake, K. Mibu, and T. Shinjo, Phys. Rev. Lett. 92, 077205 (2004).

For access to citing articles, you need to log in.


Figures (13)

Access to article objects (figures, tables, multimedia) requires a subscription; log in to view available files.
(Access to supplementary material, where available, is free for this journal.)



Close

Google Calendar

ADVERTISEMENT

Your Recent History Recent History Help

Recently Viewed Articles

  1. Integrated setup for the fabrication and measurement of magnetoresistive nanoconstrictions in ultrahigh vacuum
Go to AIP Home
Copyright © American Institute of Physics
close