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Review of Scientific Instruments / Volume 79 / Issue 10 / MICROSCOPY AND IMAGING

Rev. Sci. Instrum. 79, 103703 (2008); http://dx.doi.org/10.1063/1.2999579 (3 pages)

Real-time atomic force microscopy using mechanical resonator type scanner

Yongho Seo1, C. S. Choi2, S. H. Han2, and Seung-Jin Han2

1Faculty of Nanotechnology and Advanced Material Engineering and Institute of Fundamental Physics, Sejong University, Seoul 143-747, Republic of Korea
2ITS Business Division, R&D Center, Doosan Mecatec Co., LTD, Ansan 425-100, Republic of Korea

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(Received 12 August 2008; accepted 19 September 2008; published online 15 October 2008)

The real-time atomic force microscope for biological sample is a challenging research field. We have demonstrated a real-time atomic force microscope by implementing a mechanical resonator type scanner called by “microscanner” The microscanner was designed to have a resonance frequency in the range of 5–10 kHz and an amplitude of 1–3 μm. The resonant vibration of the microscanner was served as a fast-scan directional motion, and an image acquisition rate of 30 frames/s with 256×256 pixels per frame was achieved. Time-varying sequential images of a poly(ethylene-oxide) sample were taken as a demonstration of potential for excellence in real-time imaging a moving nano-object.

© 2008 American Institute of Physics

Article Outline

  1. INTRODUCTION
  2. EXPERIMENTALS
  3. RESULTS AND DISCUSSION
  4. CONCLUSIONS

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KEYWORDS and PACS

Keywords

atomic force microscopy, micromechanical resonators, polymers

PACS

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.2999579

PUBLICATION DATA

ISSN

0034-6748 (print)  
1089-7623 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

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    D. A. Walters, J. P. Cleveland, N. H. Thomson, P. K. Hansma, M. A. Wendman, G. Gurley, and V. Elings, Rev. Sci. Instrum. 67, 3583 (1996)RSINAK000067000010003583000001.


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