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Review of Scientific Instruments / Volume 79 / Issue 10 / MICROSCOPY AND IMAGING

Rev. Sci. Instrum. 79, 103702 (2008); http://dx.doi.org/10.1063/1.2987696 (4 pages)

Robust Ohmic contact junctions between metallic tips and multiwalled carbon nanotubes for scanned probe microscopy

Suenne Kim1, Jeehoon Kim2, Morgann Berg2, and Alex de Lozanne1,2

1Texas Materials Institute, University of Texas at Austin, Austin, Texas 78712, USA
2Department of Physics, University of Texas at Austin, Austin, Texas 78712, USA

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(Received 23 April 2008; accepted 1 September 2008; published online 7 October 2008)

We demonstrate a simple method that uses a scanning electron microscope for making a reliable low resistance contact between a single multiwalled carbon nanotube and a metallic tungsten probe tip or a Si cantilever. This method consists of using electron beam induced decomposition of background gases and voltage pulses to remove contaminants. The electrical quality of the contact is monitored in situ by measuring the current flow at constant bias or by observing the decay of current fluctuations. The quality of the contacts is confirmed via current-voltage spectroscopy. This method produces very stable, low resistance, mechanically robust contacts with high success rates approaching 100%.

© 2008 American Institute of Physics

Article Outline

  1. EXPERIMENTAL METHODS
  2. ALTERNATIVE METHOD FOR IN SITU MONITORING
  3. MECHANICAL PROPERTIES
  4. ELECTRICAL PROPERTIES
  5. LENGTH CONTROL
  6. SUMMARY AND CONCLUSIONS

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KEYWORDS and PACS

Keywords

cantilevers, carbon nanotubes, ohmic contacts, scanning probe microscopy

PACS

  • 73.40.Ns

    Metal-nonmetal contacts

  • 07.79.-v

    Scanning probe microscopes and components

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.2987696

PUBLICATION DATA

ISSN

0034-6748 (print)  
1089-7623 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

For access to fully linked references, you need to log in.
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    S. Lu, Z. Guo, W. Ding, D. A. Dikin, J. Lee, and R. S. Ruoff, Rev. Sci. Instrum. 77, 125101 (2006)RSINAK000077000012125101000001.

    K. Kim, S. Lim, I. Lee, K. An, D. Bae, S. Choi, J. Yoo, and Y. Lee, Rev. Sci. Instrum. 74, 4021 (2003)RSINAK000074000009004021000001.

    H. Konishi, Y. Murata, W. Wongwiriypan, M. Kishida, K. Tomita, K. Motoyoshi, S. Honda, M. Katayama, S. Yoshimoto, K. Kubo, R. Hobara, I. Matsuda, S. Hasegawa, M. Yoshimura, J. Lee, and H. Mori, Rev. Sci. Instrum. 78, 013703 (2007)RSINAK000078000001013703000001.


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