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Review of Scientific Instruments / Volume 79 / Issue 10 / MICROSCOPY AND IMAGING

Rev. Sci. Instrum. 79, 103701 (2008); http://dx.doi.org/10.1063/1.2992480 (7 pages)

A flexible, highly stable electrochemical scanning probe microscope for nanoscale studies at the solid-liquid interface

A. Z. Stieg1, H. I. Rasool2, and J. K. Gimzewski1,2,3

1California NanoSystems Institute, 570 Westwood Plaza, Los Angeles, California 90095, USA
2Department of Chemistry and Biochemistry, University of California-Los Angeles, 607 Charles E. Young Drive East, Los Angeles, California 90095, USA
3International Center for Materials Nanoarchitectonics (MANA), 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan

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(Received 12 August 2008; accepted 10 September 2008; published online 3 October 2008)

This work describes the design, fabrication, and application of an ultrastable scanning probe microscope for nanoscale studies at the solid-liquid interface, specifically in electrolyte environments. Quantification of system noise limits in the tunneling mode, mechanical drift rates, and lowest mechanical resonance provided values of ≤ 10 pA/Hz1/2, 2 nm/min (XY) and 0.15 nm/min (Z), and 7.9 kHz, respectively. Measurement of the closed-loop transfer function in the tunneling condition demonstrated linear feedback responses up to 4.2 and 2.5 kHz in ambient and electrochemical conditions. Atomic and molecular resolution imagings have been achieved in ambient, in situ, and electrochemical imaging environments at scan rates up to 80 lines/s. A modular design approach has produced a highly flexible microscope capable of imaging and spectroscopy in tunneling, tapping force [amplitude modulation atomic force microscopy (AFM)], and noncontact force (frequency modulation-AFM) modes.

© 2008 American Institute of Physics

Article Outline

  1. INTRODUCTION
  2. DESIGN CONSIDERATIONS
  3. APPROACH MECHANISM
  4. SCANNER
  5. NOISE ISOLATION
  6. ELECTROCHEMICAL CELL
  7. CONTROL ELECTRONICS
  8. MECHANICAL DRIFT
  9. IMAGING PERFORMANCE
  10. CONCLUSIONS

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KEYWORDS and PACS

Keywords

atomic force microscopy, electrochemical analysis, electrolytes, interface phenomena, nanotechnology, scanning tunnelling microscopy

PACS

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.2992480

PUBLICATION DATA

ISSN

0034-6748 (print)  
1089-7623 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

For access to fully linked references, you need to log in.
    A. Z. Stieg, P. Wilkinson, and J. K. Gimzewski, Rev. Sci. Instrum. 78, 036110 (2007)RSINAK000078000003036110000001.

    G. Binnig and D. P. E. Smith, Rev. Sci. Instrum. 57, 1688 (1986)RSINAK000057000008001688000001.

    T. Michely, M. Kaiser, and M. J. Rost, Rev. Sci. Instrum. 71, 4461 (2000)RSINAK000071000012004461000001.


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