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Review of Scientific Instruments / Volume 79 / Issue 10 / PARTICLE SOURCES, OPTICS AND ACCELERATION; PARTICLE DETECTORS

Rev. Sci. Instrum. 79, 103302 (2008); http://dx.doi.org/10.1063/1.3000003 (8 pages)

The use and characterization of a backilluminated charge-coupled device in investigations of pulsed x-ray and radiation sources

Wilfred Fullagar1,2, Jens Uhlig1, Monika Walczak1, Sophie Canton1, and Villy Sundström1

1Division of Chemical Physics, Kemicentrum Lund University, P.O. Box 124, SE-22100 Lund, Sweden
2Monash Centre for Synchrotron Science, Monash University, Clayton, VIC 3800, Australia

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(Received 7 April 2008; accepted 23 September 2008; published online 29 October 2008)

Examinations of bremsstrahlung and energetic electron beams from a novel laser plasma source motivate and assist characterization of a backthinned, backilluminated direct detection x-ray charge-coupled device (CCD), a topology that is uncommon in hard x-ray work. Behavior toward pseudomonochromatic (55Fe) and multichromatic (241Am) sources is briefly reviewed under optimized noise conditions. Results collectively establish the previously unknown functional depth structure. Several modes of usage are illustrated in ∼ 4–20 keV x-ray laser plasma source investigations, where the significance of the characterization is briefly discussed. The spectral redistribution associated with this CCD topology is unfavorable, yet appropriate analysis ensures that sufficient spectral information remains for quantitative determination of broadband x-ray flux and spectra in essentially single laser shot measurements. The energy dependence of nascent electron cloud radii in silicon is determined using broadband x-rays from the laser plasma source, turning the narrow depletion depth to advantage. Finally, the characterization is used to quantify recent x-ray spectral explorations of the water jet laser plasma source operating under aspirator vacuum. These results will have key value for establishment of laboratory based ultrafast extended x-ray absorption fine structure experiments using microbolometric detectors.

© 2008 American Institute of Physics

Article Outline

  1. INTRODUCTION
  2. APPARATUS
  3. RADIOACTIVE SOURCE WORK
  4. PLASMA SOURCE WORK
  5. CONCLUSION

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KEYWORDS and PACS

Keywords

bremsstrahlung, charge-coupled devices, electron beams, plasma X-ray sources, X-ray detection, X-ray spectra

PACS

  • 52.59.Px

    Hard X-ray sources

  • 52.25.Os

    Emission, absorption, and scattering of electromagnetic radiation

  • 42.55.Vc

    X- and γ-ray lasers

  • 41.75.Fr

    Electron and positron beams

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.3000003

PUBLICATION DATA

ISSN

0034-6748 (print)  
1089-7623 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

For access to fully linked references, you need to log in.
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