RSI Nameplate
  • Volume/Page
  • Keyword
  • DOI
  • Citation
  • Advanced
   
 
 
 

Flickr Twitter UniPHY Group iResearch App Facebook

Review of Scientific Instruments / Volume 79 / Issue 10 / OPTICS; ATOMS AND MOLECULES; SPECTROSCOPY; PHOTON DETECTORS

Rev. Sci. Instrum. 79, 103107 (2008); http://dx.doi.org/10.1063/1.3002424 (7 pages)

Probing thermal waves on the free surface of various media: Surface fluctuation specular reflection spectroscopy

A. Tay1, C. Thibierge1, D. Fournier2, C. Fretigny1, F. Lequeux1, C. Monteux1, J. P. Roger2, and L. Talini1

1Laboratoire PPMD, UMR 7615 CNRS/UPMC and ESPCI, 10 Rue Vauquelin, 75005 Paris, France
2Laboratoire PEM, UPR A0005 CNRS/UPMC and ESPCI, 10 Rue Vauquelin, 75005 Paris, France

View MapView Map

(Received 9 June 2008; accepted 26 September 2008; published online 23 October 2008)

Thermal motion gives rise to fluctuations in free surfaces; measurement of the thermally excited waves on such surfaces provides information on the mechanical properties of the medium. We have developed an optical tool to probe the thermally excited waves on free surfaces: surface fluctuation specular reflection (SFSR) spectroscopy. It consists in measuring the fluctuations in the position of a laser beam that is specularly reflected onto the free surface of a medium. The position of the reflected beam is sensitive to the roughness of the probed surface; the thermal waves are detected by subtracting the light intensities collected on the two quadrants of a photodiode, on which the beam is centered. We show how the measured signal is related to the medium properties. We also present measurements performed on Newtonian liquids as well as on a viscoelastic solid; we show that in all cases, there is a very good agreement between experimental and computed spectra. SFSR thus applies to a broad range of materials. It moreover offers a very good temporal resolution and should provide a useful tool for dynamical measurements on complex fluids.

© 2008 American Institute of Physics

Article Outline

  1. INTRODUCTION
  2. EXPERIMENTAL SETUP
  3. DETECTED SIGNAL
  4. SIMPLE LIQUIDS
  5. VISCOELASTIC MEDIUM
  6. CONCLUSION

RELATED DATABASES

To view database links for this article, you need to log in.

KEYWORDS and PACS

Keywords

fluctuations, photothermal effects, viscoelasticity

PACS

  • 68.35.Gy

    Mechanical properties; surface strains

  • 66.20.-d

    Viscosity of liquids; diffusive momentum transport

  • 78.20.N-

    Thermo-optic effects

  • 78.20.nb

    Photothermal effects

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.3002424

PUBLICATION DATA

ISSN

0034-6748 (print)  
1089-7623 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

For access to fully linked references, you need to log in.
    F. Gittes, B. Schnurr, P. D. Olmsted, F. C. MacKintosh, and C. F. Schmidt, Phys. Rev. Lett. 79, 3286 (1997).

    J. C. Crocker, M. T. Valentine, E. R. Weeks, T. Gisler, P. D. Kaplan, A. G. Yodh, and D. A. Weitz, Phys. Rev. Lett. 85, 888 (2000).

    R. E. Mahaffy, C. K. Shih, F. C. MacKintosh, and J. Käs, Phys. Rev. Lett. 85, 880 (2000).

    M. Hernandez-Contreras, M. W. Kim, and P. Pincus, Phys. Rev. E 60, 4319 (1999).

    K. Sakai, H. Honda, and Y. Hiraoka, Rev. Sci. Instrum. 76, 063908 (2005)RSINAK000076000006063908000001.

    Q. R. Huang and C. H. Wang, J. Chem. Phys. 109, 6103 (1998)JCPSA6000109000014006103000001.

    S. Streit-Nierobisch, C. Gutt, M. Paulus, and M. Tolan, Phys. Rev. B 77, 041410 (2008).

    C. H. Sohl, K. Miyano, and J. B. Ketterson, Rev. Sci. Instrum. 49, 1464 (1978)RSINAK000049000010001464000001.

    H. Kikuchi, K. Sakai, and K. Takagi, Phys. Rev. B 49, 3061 (1994).


For access to citing articles, you need to log in.


Figures (6)

Access to article objects (figures, tables, multimedia) requires a subscription; log in to view available files.
(Access to supplementary files, where available, is free for this journal.)



Close

Google Calendar

ADVERTISEMENT

Your Recent History Recent History Help

Recently Viewed

  1. Probing thermal waves on the free surface of various media: Surface fluctuation specular reflection spectroscopy
  2. Rapid photoreflectance spectroscopy for strained silicon metrology
  3. Portable light-emitting diode-based photometer with one-shot optochemical sensors for measurement in the field
  4. A widely tunable laser frequency offset lock with digital counting
  5. 300 mm reference wafer fabrication by using direct laser lithography
Go to AIP Home
Copyright © American Institute of Physics
close