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Rev. Sci. Instrum. 78, 081101 (2007); http://dx.doi.org/10.1063/1.2754076 (8 pages)

Invited Review Article: A review of techniques for attaching micro- and nanoparticles to a probe’s tip for surface force and near-field optical measurements

Yang Gan

Chemical Engineering, School of Engineering, University of Newcastle, Callaghan, New South Wales 2308, Australia and Department of Chemical and Biomolecular Engineering, University of Melbourne, Victoria 3010, Australia

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(Received 29 January 2007; accepted 7 June 2007; published online 6 August 2007)

Cantilevers with single micro- or nanoparticle probes have been widely used for atomic force microscopy surface force measurements and apertureless scanning near-field optical microscopy applications. In this article, I critically review the particle attachment and modification techniques currently available, to help researchers choose the appropriate techniques for specific applications.

© 2007 American Institute of Physics

Article Outline

  1. INTRODUCTION
  2. TECHNIQUES FOR ATTACHING A MICROPARTICLE
    1. Dual-wire technique
    2. Cantilever-moving technique
    3. High temperature sintering technique
  3. TECHNIQUES FOR ATTACHING A NANOPARTICLE
    1. Inversed self-assembly grafting technique
    2. Wet-chemistry surface assembly
    3. Water-flow suction technique
    4. In situ picking-up technique
    5. Optical tweezers technique
    6. Direct deposition techniques
      1. Nanopipette chemical reaction deposition
      2. Photocatalysis deposition
      3. Focused electron beam (FEB) induced deposition
    7. A comparison of various particle-attachment techniques
  4. PERSPECTIVE

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KEYWORDS and PACS

PACS

  • 07.79.Fc

    Near-field scanning optical microscopes

  • 07.79.Lh

    Atomic force microscopes

  • 07.10.Cm

    Micromechanical devices and systems

  • 01.30.Rr

    Surveys and tutorial papers; resource letters

ARTICLE DATA

PUBLICATION DATA

ISSN

0034-6748 (print)  
1089-7623 (online)

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