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Review of Scientific Instruments / Volume 78 / Issue 5 / OPTICS; ATOMS AND MOLECULES; SPECTROSCOPY; PHOTON DETECTORS

Rev. Sci. Instrum. 78, 053101 (2007); http://dx.doi.org/10.1063/1.2735933 (5 pages)

Design and performance of a curved-crystal x-ray emission spectrometer

A. C. Hudson1, W. C. Stolte1, D. W. Lindle1, and R. Guillemin2

1University of Nevada, Las Vegas, Nevada 89154
2Laboratoire de Chimie Physique-Matière et Rayonnement, Université Pierre et Marie Curie-CNRS, 11 rue Pierre et Marie Curie, 75231 Paris Cedex 05, France

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(Received 20 December 2006; accepted 2 April 2007; published online 8 May 2007)

A curved-crystal x-ray emission spectrometer has been designed and built to measure 2–5 keV x-ray fluorescence resulting from a core-level excitation of gas phase species. The spectrometer can rotate 180°, allowing detection of emitted x rays with variable polarization angles, and is capable of collecting spectra over a wide energy range (20 eV wide with 0.5 eV resolution at the Cl K edge) simultaneously. In addition, the entire experimental chamber can be rotated about the incident-radiation axis by nearly 360° while maintaining vacuum, permitting measurements of angular distributions of emitted x rays.

© 2007 American Institute of Physics

Article Outline

  1. INTRODUCTION
  2. BEAMLINE 9.3.1
  3. SPECTROMETER DESIGN
  4. SAMPLE GAS CELL
  5. CRYSTAL BENDER
  6. POSITION SENSITIVE DETECTOR
  7. CALIBRATION
  8. APPLICATIONS
  9. DISCUSSION

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KEYWORDS and PACS

Keywords

X-ray spectrometers, X-ray optics, optical design techniques, fluorescence, X-ray emission spectra

PACS

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.2735933

PUBLICATION DATA

ISSN

0034-6748 (print)  
1089-7623 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

For access to fully linked references, you need to log in.
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    D. W. Lindle et al., Phys. Rev. Lett. 60, 1010 (1988).

    S. Brennan, P. L. Cowan, R. D. Henins, D. W. Lindle, and B. A. Karlin, Rev. Sci. Instrum. 60, 2243 (1989)RSINAK000060000007002243000001.

    B. d'Etat, J. P. Briand, G. Ban, L. de Billy, J. P. Desclaux, and P. Briand, Phys. Rev. A 48, 1098 (1993).

    R. C. C. Perera, G. Jones, and D. W. Lindle, Rev. Sci. Instrum. 66, 1745 (1995)RSINAK000066000002001745000001.

    G. Jones, S. Ryce, D. W. Lindle, B. A. Karlin, J. C. Woicik, and R. C. C. Perera, Rev. Sci. Instrum. 66, 1748 (1995)RSINAK000066000002001748000001.

    R. C. C. Perera, P. L. Cowan, D. W. Lindle, R. E. LaVilla, T. Jach, and R. D. Deslattes, Phys. Rev. A 43, 3609 (1991).

    K. Codling and R. P. Madden, J. Appl. Phys. 36, 380 (1965)JAPIAU000036000002000380000001.

    D. W. Lindle, P. L. Cowan, T. Jach, R. E. LaVilla, R. D. Deslattes, and R. C. C. Perera, Phys. Rev. A 43, 2353 (1991).

    J. D. Mills, J. A. Sheehy, T. A. Ferrett, S. H. Southworth, R. Mayer, D. W. Lindle, and P. W. Langhoff, Phys. Rev. Lett. 79, 383 (1997).

    M. Simon et al., Phys. Rev. A 73, 020706(R) (2006).


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