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Review of Scientific Instruments / Volume 78 / Issue 3 / OPTICS; ATOMS AND MOLECULES; SPECTROSCOPY; PHOTON DETECTORS

Rev. Sci. Instrum. 78, 033101 (2007); http://dx.doi.org/10.1063/1.2709742 (6 pages)

Artificial submicron or nanometer speckle fabricating technique and electron microscope speckle photography

Zhanwei Liu1, Huimin Xie2, Daining Fang2, Fulong Dai2, Weining Wang3, and Yan Fang3

1Department of Mechanics, School of Science, Beijing Institute of Technology, Beijing 100081, China and FML, Department of Engineering Mechanics, Tsinghua University, Beijing 100084, China
2FML, Department of Engineering Mechanics, Tsinghua University, Beijing 100084, China
3Beijing key Laboratory for Nano-photonics and Nano-structure, Beijing 100037, China

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(Received 18 June 2006; accepted 18 January 2007; published online 9 March 2007)

In this article, a novel artificial submicro- or nanometer speckle fabricating technique is proposed by taking advantage of submicro or nanometer particles. In the technique, submicron or nanometer particles were adhered to an object surface by using ultrasonic dispersing technique. The particles on the object surface can be regarded as submicro or nanometer speckle by using a scanning electronic microscope at a special magnification. In addition, an electron microscope speckle photography (EMSP) method is developed to measure in-plane submicron or nanometer deformation of the object coated with the artificial submicro or nanometer speckles. The principle of artificial submicro or nanometer speckle fabricating technique and the EMSP method are discussed in detail in this article. Some typical applications of this method are offered. The experimental results verified that the artificial submicro or nanometer speckle fabricating technique and EMSP method is feasible.

© 2007 American Institute of Physics

Article Outline

  1. INTRODUCTION
  2. THE PRINCIPLE OF THE ARTIFICIAL SUBMICRON OR NANOMETER SPECKLE FABRICATING TECHNIQUE
  3. THE PRINCIPLE OF THE EMSP METHOD
  4. APPLICATION
    1. The pointwise method
    2. The full-field approach
  5. DISCUSSION

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KEYWORDS and PACS

Keywords

nanoparticles, adhesion, deformation, ultrasonic measurement, scanning electron microscopy, speckle

PACS

  • 07.60.Ly

    Interferometers

  • 07.78.+s

    Electron, positron, and ion microscopes; electron diffractometers

  • 43.35.Yb

    Ultrasonic instrumentation and measurement techniques

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.2709742

PUBLICATION DATA

ISSN

0034-6748 (print)  
1089-7623 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

For access to fully linked references, you need to log in.
    J. Sudijono, M. D. Johnson, C. W. Snyder, M. B. Elowitz, and B. G. Orr, Phys. Rev. Lett. 69, 2811 (1992).


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