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Rev. Sci. Instrum. 78, 030901 (2007); http://dx.doi.org/10.1063/1.2716503 (3 pages)

Perspective: From field-ion microscopy of single atoms to atom-probe tomography: A journey: “Atom-probe tomography” [ Rev. Sci. Instrum. 78, 031101 (2007) ]

David N. Seidman

Northwestern University Center for Atom-Probe Tomography, Department of Materials Science and Engineering, Northwestern University, Evanston, Illinois 60208-3108

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(Received 12 February 2007; accepted 12 February 2007; published online 30 March 2007)

Abstract unavailable.

EDITORIALLY RELATED

  1. Invited Review Article: Atom probe tomography
    Thomas F. Kelly et al.
    Rev. Sci. Instrum. 78, 031101 (2007)RSINAK000078000003031101000001

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KEYWORDS and PACS

PACS

  • 07.78.+s

    Electron, positron, and ion microscopes; electron diffractometers

  • 01.65.+g

    History of science

ARTICLE DATA

PUBLICATION DATA

ISSN

0034-6748 (print)  
1089-7623 (online)

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