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Review of Scientific Instruments / Volume 78 / Issue 1 / MICROSCOPY AND IMAGING
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Rev. Sci. Instrum. 78, 013705 (2007); http://dx.doi.org/10.1063/1.2432410 (8 pages)

WSXM: A software for scanning probe microscopy and a tool for nanotechnology

I. Horcas1, R. Fernández1, J. M. Gómez-Rodríguez2, J. Colchero3, J. Gómez-Herrero2, and A. M. Baro4

1Nanotec Electrónica S.L., Centro Empresarial Euronova 3, Ronda de Poniente 2, Edificio 2-1a Planta Oficina A, 28760 Tres Cantos, E-28049 Madrid, Spain
2Laboratorio de Nuevas Microscopías, Departamento de Física de la Materia Condensada, Universidad Autonoma de Madrid, E-28049 Madrid, Spain
3Departamento de Física, Facultad de Quimica. Universidad de Murcia, E-30100 Murcia, Spain
4Instituto de Ciencia de Materiales de Madrid-CSIC, Campus de Cantoblanco, 28049 Madrid, Spain

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(Received 14 October 2006; accepted 18 December 2006; published online 31 January 2007)

In this work we briefly describe the most relevant features of WSXM, a freeware scanning probe microscopy software based on MS-Windows. The article is structured in three different sections: The introduction is a perspective on the importance of software on scanning probe microscopy. The second section is devoted to describe the general structure of the application; in this section the capabilities of WSXM to read third party files are stressed. Finally, a detailed discussion of some relevant procedures of the software is carried out.

© 2007 American Institute of Physics

Article Outline

  1. INTRODUCTION
  2. OVERVIEW OF WSXM
    1. Data acquisition
    2. Image processing
  3. DETAILED DISCUSSION OF RELEVANT ISSUES
    1. Multiple feedbacks
    2. Scanning
    3. Jumping mode
    4. Nanolithography
    5. Perspectives

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KEYWORDS and PACS

Keywords

scanning probe microscopy, public domain software, nanotechnology, computerised instrumentation

PACS

  • 07.79.Cz

    Scanning tunneling microscopes

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.2432410

PUBLICATION DATA

ISSN

0034-6748 (print)  
1089-7623 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

  1. G. Binnig, H. Rohrer, Ch. Gerber, and E. Weibel, Phys. Rev. Lett. 49, 57 (1982).
  2. G. Binnig, H. Rohrer, Ch. Gerber, and E. Weibel, Phys. Rev. Lett. 50, 120 (1983).
  3. D. M. Eigler and E. K. Schweizer, Nature (London) 344, 524 (1990).
  4. R. Piner and R. Reifenberger, Rev. Sci. Instrum. 60, 3123 (1989)RSINAK000060000010003123000001. [ISI]
  5. P. Zahl, M. Bierkandt, S. Schröder, and A. Klust, Rev. Sci. Instrum. 74, 1222 (2003)RSINAK000074000003001222000001.
  6. WSXM free software at www.nanotec.es
  7. The current hardware implementation incorporates a M67 board with a Servo16 module from Innovative Integration. See www.innovative-dsp.com for details.
  8. J. Hammers, R. M. Tromp, and J. E. Demuth, Phys. Rev. Lett. 56, 1972 (1986). [MEDLINE]
  9. C. Gómez-Navarro et al., Nanotechnology 13, 314 (2002). [Inspec] [ISI]
  10. P. J. de Pablo, J. Colchero, J. Gómez-Herrero, and A. M. Baró, Appl. Phys. Lett. 73, 3300 (1998)APPLAB000073000022003300000001. [ISI]
  11. E. Ganz, S. K. Thies, I. S. Hwang, and J. Golovchenko, Phys. Rev. Lett. 68, 1567 (1992). [MEDLINE]
  12. J. M. Gómez-Rodríguez, J. J. Sáenz, A. M. Baró, J.-Y. Veuillen, and R. C. Cinti, Phys. Rev. Lett. 76, 799 (1996). [MEDLINE]
  13. I. Brihuega, O. Custance, R. Pérez, and J. M. Gómez-Rodríguez, Phys. Rev. Lett. 94, 046101 (2005). [MEDLINE]
  14. W. H. Press and W. Thomas, Numerical Recipes in C. The Art of Scientific Computing (Cambridge University Press, Cambridge, 1998).
  15. J. M. Gómez-Rodríguez, A. M. Baró, L. Vázquez, R. C. Salvarezza, J. M. Vara, and A. J. Arvia, J. Phys. Chem. 96, 347 (1992). [Inspec] [ISI]
  16. R. Wiesendanger, Scanning Probe Microscopy and Spectroscopy: Methods and Apllications (Cambridge University Press, Cambridge, 1994).
  17. At present the timing constant is set to Deltat=70  µs with the hardware implementation shown in Fig. 2.
  18. See, e. g., D. R. Baselt, S. M. Clark, M. G. Youngquist, C. F. Spence, and J. D. Baldeschwieler, Rev. Sci. Instrum. 64, 1874 (1993)RSINAK000064000007001874000001. [ISI]
  19. A. Rosa, E. Weilandt, S. Hild, and O. Marti, Meas. Sci. Technol. 8, 1 (1997). [Inspec] [ISI]
  20. F. Moreno-Herrero, P. J. de Pablo, M. Álvarez, J. Colchero, J. Gómez-Herrero, and A. M. Baró, Appl. Surf. Sci. 210, 22 (2003). [Inspec]
  21. A. Gil, J. Colchero, M. Luna, J. Gómez-Herrero, and A. M. Baró, Langmuir 6, 5086 (2000).
  22. R. García, M. Calleja, and F. Pérez-Murano, Appl. Phys. Lett. 72, 2295 (1998)APPLAB000072000018002295000001.
  23. O. Paz, I. Brihuega, J. M. Gómez-Rodríguez, and J. M. Soler, Phys. Rev. Lett. 94, 056103 (2005). [ISI] [MEDLINE]
  24. J. M. Soler, E. Artacho, J. D. Gale, A. García, J. Junquera, P. Ordejón, and D. Sánchez-Portal, J. Phys.: Condens. Matter 14, 2745 (2002). [Inspec]
  25. Y. Sugimoto, M. Abe, S. Hirayama, N. Oyabu, O. Custance, and S. Morita, Nat. Mater. 4, 156 (2005). [MEDLINE]

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Figures (7) Tables (1)

Figures (click on thumbnails to view enlargements)

FIG.1
General scheme of WSXM showing the most representative process.

FIG.1 Download High Resolution Image (.zip file) | Export Figure to PowerPoint

FIG.2
(Color online) Block diagram of the hardware system controlled by WSXM.

FIG.2 Download High Resolution Image (.zip file) | Export Figure to PowerPoint

FIG.3
(Color online) (a) Screenshot of the WSXM main process window. Only one of the many available process windows. (b) Silicon (111) 7×7 reconstruction rendered using the three-dimensional package integrated in WSXM. (c) Single walled carbon nanotubes imaged with a scanning force microscope. (d) 3D rendering of a tumor cell.

FIG.3 Download High Resolution Image (.zip file) | Export Figure to PowerPoint

FIG.4
(Upper) One directional line scan. The most representative point has been labeled. (Lower) The corresponding V(t) signal applied to the piezoelectric has been drawn for the sake of clarity.

FIG.4 Download High Resolution Image (.zip file) | Export Figure to PowerPoint

FIG.5
Force vs distance curve. The zero force level has been initially set to V0 (usually V0 = 0). This level fluctuates with time and at t = t1 the new voltage value is V1.

FIG.5 Download High Resolution Image (.zip file) | Export Figure to PowerPoint

FIG.6
Schematic of the lithography section of WSXM.

FIG.6 Download High Resolution Image (.zip file) | Export Figure to PowerPoint

FIG.7
(Color online) Nanolithography on silicon oxide showing Don Quixote and Sancho Panza.

FIG.7 Download High Resolution Image (.zip file) | Export Figure to PowerPoint

Tables

Table I. Third party files read by WSXM.

View Table


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