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Review of Scientific Instruments / Volume 77 / Issue 7 / OPTICS; ATOMS AND MOLECULES; SPECTROSCOPY; PHOTON DETECTORS

Rev. Sci. Instrum. 77, 073101 (2006); http://dx.doi.org/10.1063/1.2214931 (5 pages)

Apparatus for the imaging of infrared photoluminescence, transmittance, and phototransmittance with high spatial and spectral resolutions

Robert Furstenberg1, Julio A. Soares2, and Jeffrey O. White3

1Department of Physics, University of Illinois at Urbana-Champaign, 1110 W. Green Street, Urbana, Illinois 61801
2Frederick Seitz Materials Research Laboratory, University of Illinois at Urbana-Champaign, 104 S. Goodwin Avenue, Urbana, Illinois 61801
3Army Research Laboratory, 2800 Powder Mill Road, Adelphi, Maryland 20783

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(Received 1 March 2006; accepted 22 May 2006; published online 5 July 2006)

Photoluminescence is a widely used tool for the characterization of wide-gap semiconductor materials. However, most narrow-gap, infrared materials exhibit very weak, hard to detect photoluminescence. We report on the development of a sensitive, Fourier transform infrared (FTIR)-based apparatus capable of measuring and spatial imaging of weak infrared photoluminescence with diffraction limited resolution. The apparatus is also capable of measuring transmittance and phototransmittance. This is, to our knowledge, the first report of measuring infrared phototransmittance using an FTIR spectrometer.

© 2006 American Institute of Physics

Article Outline

  1. INTRODUCTION
  2. EXPERIMENTAL APPARATUS
    1. Phase correction of interferograms from phototransmittance experiments
  3. EXAMPLES OF APPLICATIONS

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KEYWORDS and PACS

Keywords

infrared imaging, photoluminescence, infrared spectra, light diffraction, Fourier transform spectrometers, infrared spectrometers, II-VI semiconductors

PACS

  • 07.57.Ty

    Infrared spectrometers, auxiliary equipment, and techniques

  • 78.55.Et

    II-VI semiconductors

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.2214931

PUBLICATION DATA

ISSN

0034-6748 (print)  
1089-7623 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

For access to fully linked references, you need to log in.
    T. Arakawa, H. Watabe, Y. Nagamune, and Y. Arakawa, Appl. Phys. Lett. 69, 1294 (1996)APPLAB000069000009001294000001.

    H. C. Alt, M. Neef, and H. von Philipsborn, Appl. Phys. Lett. 55, 1972 (1989)APPLAB000055000019001972000001.

    M. Munoz, F. H. Pollak, M. B. Zakia, N. B. Patel, and J. L. Herrera-Perez, Phys. Rev. B 62, 16600 (2000).


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