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Review of Scientific Instruments / Volume 77 / Issue 4 / MICROSCOPY AND IMAGING

Rev. Sci. Instrum. 77, 043714 (2006); http://dx.doi.org/10.1063/1.2195120 (4 pages)

Cryogenic low energy electron point source microscope

Hiroshi Okamoto and Hans-Werner Fink

Institute of Physics, University of Zurich, Winterthurerstrasse 190, Zurich CH-8057, Switzerland

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(Received 20 December 2005; accepted 20 March 2006; published online 26 April 2006)

The design and performance of a cryogenic low energy electron point source microscope are described. The microscope can be immersed in liquid helium, thus allowing for investigations at cryogenic temperatures. The cryogenic environment is associated with a low fluctuation in the field emission electron beam current and, combined with a compact and rigid mechanical design, low mechanical drift characteristics.

© 2006 American Institute of Physics

Article Outline

  1. INTRODUCTION
  2. THE DESIGN
    1. General environment
    2. Cryostat
    3. Vacuum system
    4. The LEEPS microscope unit
  3. PERFORMANCE

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KEYWORDS and PACS

Keywords

cryogenics, field emission electron microscopes

PACS

  • 07.78.+s

    Electron, positron, and ion microscopes; electron diffractometers

  • 07.20.Mc

    Cryogenics; refrigerators, low-temperature detectors, and other low-temperature equipment

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.2195120

PUBLICATION DATA

ISSN

0034-6748 (print)  
1089-7623 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

For access to fully linked references, you need to log in.
    H.-W. Fink, W. Stocker, and H. Schmid, Phys. Rev. Lett. 65, 1204 (1990).

    H. Schmid and H.-W. Fink, Appl. Phys. Lett. 70, 2679 (1997)APPLAB000070000020002679000001.

    B. Cho, T. Ogawa, T. Ichimura, T. Ichinokawa, T. Amakusa, and C. Oshima, Rev. Sci. Instrum. 75, 3091 (2004)RSINAK000075000010003091000001.

    B. Cho, T. Ichimura, R. Shimizu, and C. Oshima, Phys. Rev. Lett. 92, 246103 (2004).


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