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Dec 2006

Volume 77, Issue 12, Articles (12xxxx)

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High-reflectivity Cr/Sc multilayer condenser for compact soft x-ray microscopy

H. Stollberg, S. Yulin, P. A. C. Takman, and H. M. Hertz

Rev. Sci. Instrum. 77, 123101 (2006); http://dx.doi.org/10.1063/1.2400665 (6 pages) | Cited 8 times

Online Publication Date: 6 December 2006

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The condenser is a critical component in compact water-window x-ray microscopes as it influences the exposure time via its efficiency and the resolution via its numerical aperture. Normal-incidence multilayer mirrors can reach large geometrical collection efficiencies and match the numerical aperture of the zone plate but require advanced processing for high total reflectivity. In the present article we demonstrate large-diameter normal-incidence spherical Cr/Sc multilayer condensers with high and uniform reflectivity. Dc-magnetron sputtering was used to deposit 300 bilayers of Cr/Sc with a predetermined d-spacing matching the λ = 3.374 nm operating wavelength on spherical substrates. The mirrors show a uniform reflectivity of ∼ 3% over the full 58 mm diameter condenser area. With these mirrors an improvement in exposure time by a factor of 10 was achieved, thereby improving the performance of the compact x-ray microscope significantly.
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07.85.Tt X-ray microscopes
42.79.Wc Optical coatings
42.79.Bh Lenses, prisms and mirrors

Spectral matching consideration in the design of a novel x-ray image intensifier

Chunyu Yu, Benkang Chang, and Dianxiu Wei

Rev. Sci. Instrum. 77, 123102 (2006); http://dx.doi.org/10.1063/1.2400022 (3 pages)

Online Publication Date: 13 December 2006

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In this article, a novel x-ray image intensifier is introduced. It is mainly composed of an x-ray intensifying screen and a low-light-level (L3) image intensifier. In order to obtain a bright enough image, the spectral compatibility among three different combinations of the x-ray intensifying screen and the photocathode is analyzed. The comparison indicates that a (Zn,Cd)S:Ag screen is superior to either a CaWO4 screen or a Gd2O2S:Tb screen when combined with the Super S25 photocathode and spectral compatibility analysis is a useful guide when designing an optoelectronic imaging device.
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42.79.Ls Scanners, image intensifiers, and image converters
07.85.-m X- and γ-ray instruments
42.15.Eq Optical system design
85.60.Ha Photomultipliers; phototubes and photocathodes

Simultaneous measurement of electric birefringence, light scattering, and electric current for liquid systems

M. Alessi, E. Zothner, E. Acosta, and M. Bisceglia

Rev. Sci. Instrum. 77, 123103 (2006); http://dx.doi.org/10.1063/1.2403838 (3 pages)

Online Publication Date: 21 December 2006

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In this work we present an experimental setup that allows measuring, simultaneously, the electric birefringence, the electric light scattering, and the cell electrical current under the action of an external electric field. The basic design corresponds to a standard birefringence setup. The Kerr cell was built to permit the observation of 90° light scattering. The high voltage pulse generator is used to measure the electrical current across the Kerr cell. We present experimental data, taken in colloidal systems with different electrical conductivities.
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78.20.Jq Electro-optical effects
78.20.Fm Birefringence
82.70.Dd Colloids

kHz stimulated Brillouin spectroscopy

S. Ohno, T. Sonehara, E. Tatsu, A. Koreeda, and S. Saikan

Rev. Sci. Instrum. 77, 123104 (2006); http://dx.doi.org/10.1063/1.2403936 (5 pages) | Cited 5 times

Online Publication Date: 21 December 2006

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We have developed a high precision stimulated Brillouin spectrometer. Since this spectrometer is based on the stimulated light scattering, Brillouin measurements are possible without any signal reduction even at extremely low temperatures. The use of stable lasers for the pump and probe waves and a real-time frequency-monitor gives a high frequency resolution reaching 20 kHz, which is, to the best of authors knowledge, the highest resolution so far reported for Brillouin spectrometers. The frequency-monitor has been achieved through the measurement of the beat frequency between the two lasers by using a microwave frequency counter. With this spectrometer, we have succeeded to measure Brillouin spectra in single crystals of TeO2 from room temperature to liquid helium temperature. Furthermore, in a sample with [110] surfaces, we have observed a spectral splitting due to the multireflection of phonons at crystal surfaces.
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07.60.Rd Visible and ultraviolet spectrometers
42.65.Es Stimulated Brillouin and Rayleigh scattering
78.35.+c Brillouin and Rayleigh scattering; other light scattering
42.62.Eh Metrological applications; optical frequency synthesizers for precision spectroscopy

Synchrotron radiation x-ray beam profile monitor using chemical vapor deposition diamond film

Togo Kudo, Sunao Takahashi, Nobuteru Nariyama, Toko Hirono, Takeshi Tachibana, and Hideo Kitamura

Rev. Sci. Instrum. 77, 123105 (2006); http://dx.doi.org/10.1063/1.2403843 (4 pages)

Online Publication Date: 26 December 2006

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Photoluminescence (PL) of a Si-doped polycrystalline diamond film fabricated using the chemical vapor deposition technique was employed to measure the profile of a synchrotron radiation pink x-ray beam emitted from an in-vacuum hybrid undulator at the SPring-8 facility. The spectrum of the section of the diamond film penetrated by the emitted visible red light exhibited a peak at 739 nm and a wideband structure extending from 550 to 700 nm. The PL intensity increased with the absorbed dose of the incident beam in the diamond within a dynamic range of 103. A two-dimensional distribution of the PL intensity revealed the undulator beam profile.
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07.85.Fv X- and γ-ray sources, mirrors, gratings, and detectors
78.66.-w Optical properties of specific thin films
78.55.Hx Other solid inorganic materials

Amplitude and frequency noise sensitivities of optical frequency discriminators based on Fabry–Pérot interferometers and the frequency modulation technique

Elio Bava, Gianluca Galzerano, and Cesare Svelto

Rev. Sci. Instrum. 77, 123106 (2006); http://dx.doi.org/10.1063/1.2405397 (9 pages) | Cited 2 times

Online Publication Date: 26 December 2006

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We report on the sensitivities to frequency and amplitude noise of optical frequency discriminators based on Fabry–Pérot interferometers and the frequency modulation (Pound–Drever–Hall) technique. The response to frequency and amplitude noise is obtained by analyzing the demodulated transients to phase or amplitude steps impressed on the incident frequency modulated light. The responses in the Fourier frequency domain are then obtained by performing the Laplace transform of the demodulated transients. As expected, when the laser frequency is coincident with the Fabry–Pérot resonance, this discriminator is completely immune to amplitude noise. To simulate real operations, the amplitude noise immunity is evaluated in the presence of small detunings between the laser frequency and the Fabry–Pérot resonance. Diagrams of the responses to both types of noise are reported for symmetric and asymmetric resonators. The Pound–Drever–Hall discriminator turns out to be insensitive to the asymmetry of the Fabry–Pérot resonator. The performed evaluations lead to a simple estimation of the minimum detectable frequency noise in terms of a given laser intensity noise.
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07.60.Ly Interferometers
42.79.Hp Optical processors, correlators, and modulators
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