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Review of Scientific Instruments / Volume 76 / Issue 6 / SPECIAL TOPIC: COMBINATORIAL INSTRUMENTS AND TECHNIQUES

Rev. Sci. Instrum. 76, 062222 (2005); http://dx.doi.org/10.1063/1.1926987 (8 pages)

Spectroscopic and imaging approaches for evaluation of properties of one-dimensional arrays of formulated polymeric materials fabricated in a combinatorial microextruder system

Radislav A. Potyrailo and Ronald J. Wroczynski

Materials Analysis and Chemical Sciences, General Electric Company, Global Research Center, Niskayuna, New York 12309

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(Received 22 November 2004; accepted 11 April 2005; published online 1 June 2005)

We report optical spectroscopic and imaging approaches for the high-throughput nondestructive characterization of formulated polymeric materials fabricated as one-dimensional (1D) polymeric arrays. These materials are fabricated as 1–2 mm diameter fibers or 5–12-mm-wide by 0.3–1-mm-thick films using a combinatorial system that includes a microextruder (total barrel volume of 4.5 cm3) and microfeeders. Because our microextruder approach for fabrication of formulated polymeric materials requires ∼ 200 times less material compared to traditional scale extruders, it provides previously unavailable opportunities for characterization of extruded materials without their pelletization. Property changes in polymeric formulations are induced along the length of the 1D arrays by several approaches that include (1) variation in composition of 1D array during polymer microextrusion, (2) variation in processing conditions during polymer microextrusion, and (3) variation in exposure conditions of a performance test for different spatial regions along the length of the array. Polymeric 1D arrays are analyzed either in-line or off-line. In-line analysis is performed using spectroscopic luminescence emission and reflected light modes. For off-line analysis, 1D fiber and film arrays are coiled as helices and flat coils, respectively. Automated measurements of coiled 1D arrays are performed using modular scanning and imaging systems. The scanning system is based on a portable spectrograph and is coupled to an X‐Y translation stage to produce scans of 100 μm step size. The imaging system is operated in luminescence emission and reflected light modes. Our fabrication and analysis approaches significantly reduce the amount of material and energy needed and increase the speed of development of formulated polymeric materials by using approaches for characterization of coiled 1D polymeric arrays.

© 2005 American Institute of Physics

Article Outline

  1. INTRODUCTION
  2. HIGH-THROUGHPUT MEASUREMENT CONCEPTS OF 1D POLYMERIC ARRAYS
  3. EXPERIMENT
    1. Combinatorial microextruder system
    2. Fluorescence spectroscopic system
    3. Fluorescence imaging system
  4. RESULTS AND DISCUSSION
    1. In-line monitoring of chemical composition
    2. Analysis of coiled fiber 1D polymer arrays
    3. Analysis of coiled film 1D polymer arrays

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KEYWORDS and PACS

Keywords

photoluminescence, light reflection, optical images, optical scanners, spectrometers, polymer films, polymer fibres, extrusion, nondestructive testing, automatic testing

PACS

  • 81.70.Fy

    Nondestructive testing: optical methods

  • 42.30.-d

    Imaging and optical processing

  • 42.79.Ls

    Scanners, image intensifiers, and image converters

  • 07.60.-j

    Optical instruments and equipment

  • 78.55.Kz

    Solid organic materials

  • 68.60.-p

    Physical properties of thin films, nonelectronic

  • 81.10.Fq

    Growth from melts; zone melting and refining

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.1926987

PUBLICATION DATA

ISSN

0034-6748 (print)  
1089-7623 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

For access to fully linked references, you need to log in.
    A. J. Bur, S. C. Roth, and M. McBrearty, Rev. Sci. Instrum. 73, 2097 (2002)RSINAK000073000005002097000001.

    A. J. Bur, S. C. Roth, Y.-H. Lee, and M. McBrearty, Rev. Sci. Instrum. 75, 1103 (2004)RSINAK000075000004001103000001.

    A. J. Bur, S. C. Roth, and C. L. Thomas, Rev. Sci. Instrum. 71, 1516 (2000)RSINAK000071000003001516000001.

    K. B. Migler, H. Hervet, and L. Leger, Phys. Rev. Lett. 70, 287 (1993).


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