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Jan 2005

Volume 76, Issue 1, Articles (01xxxx)

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Publisher’s Note: “Effect of electron temperature fluctuations on slowly swept Langmuir probe measurements” [Rev. Sci. Instrum. 75, 4334 (2004)]

D. L. Rudakov, J. A. Boedo, R. A. Moyer, P. C. Stangeby, A. McLean, and J. G. Watkins

Rev. Sci. Instrum. 76, 019901 (2005); http://dx.doi.org/10.1063/1.1849512 (1 page)

Online Publication Date: 23 December 2004

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Abstract Unavailable
Show PACS
99.10.Fg Publisher's note
52.70.Ds Electric and magnetic measurements
52.25.Gj Fluctuation and chaos phenomena
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