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Review of Scientific Instruments / Volume 75 / Issue 2 / ARTICLES / PARTICLE SOURCES, OPTICS and ACCELERATION; PARTICLE DETECTORS

Rev. Sci. Instrum. 75, 360 (2004); http://dx.doi.org/10.1063/1.1642746 (7 pages)

Data analysis process of a toroidal analyzer for electron–ion collision experiments

Jun Matsumoto1, Nobuo Kobayashi1, Atsunori Danjo2, and Masuhiro Yoshino3

1Department of Physics, Tokyo Metropolitan University, Minami-Ohsawa 1-1, Hachiouji-shi, Tokyo 192-0397, Japan
2Department of Environmental Science, Niigata University, Igarashi-ninomachi 8050, Niigata-shi 950-2181, Japan
3Shibaura Institute of Technology, Fukasaku 307, Saitama-shi 330-8570, Japan

(Received 10 April 2003; accepted 24 November 2003)

A toroidal analyzer has been developed to measure angular differential cross sections for electron scattering in electron–ion collisions. Energy and angular dispersed electron images are recorded by using a two-dimensional position sensitive detector. Operation and calibration of the analyzer are described with particular emphasis on a procedure to deduce the differential cross sections from the acquired two-dimensional data. Angular differential cross sections for elastic scattering of electrons from Ar7+ and Ar8+ ions are presented in the angular range from 34° to 85° at a collision energy of 100 eV in the center of mass frame. © 2004 American Institute of Physics.

© 2004 American Institute of Physics

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KEYWORDS and PACS

Keywords

argon, positive ions, atom-electron collisions, electron impact ionisation

PACS

  • 34.80.Bm

    Elastic scattering

  • 34.80.Dp

    Atomic excitation and ionization

  • 07.77.Ka

    Charged-particle beam sources and detectors

  • 37.20.+j

    Atomic and molecular beam sources and techniques

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.1642746

PUBLICATION DATA

ISSN

0034-6748 (print)  
1089-7623 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

For access to fully linked references, you need to log in.
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